{"id":"https://openalex.org/W2295679071","doi":"https://doi.org/10.1109/aspdac.2016.7428099","title":"Extending trace history through tapered summaries in post-silicon validation","display_name":"Extending trace history through tapered summaries in post-silicon validation","publication_year":2016,"publication_date":"2016-01-01","ids":{"openalex":"https://openalex.org/W2295679071","doi":"https://doi.org/10.1109/aspdac.2016.7428099","mag":"2295679071"},"language":"en","primary_location":{"id":"doi:10.1109/aspdac.2016.7428099","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2016.7428099","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029123373","display_name":"Sandeep Chandran","orcid":"https://orcid.org/0000-0001-7110-5668"},"institutions":[{"id":"https://openalex.org/I68891433","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06","country_code":"IN","type":"education","lineage":["https://openalex.org/I68891433"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Sandeep Chandran","raw_affiliation_strings":["Indian Institute of Technology Delhi, New Delhi, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology Delhi, New Delhi, India","institution_ids":["https://openalex.org/I68891433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027215692","display_name":"Preeti Ranjan Panda","orcid":"https://orcid.org/0000-0002-2508-7531"},"institutions":[{"id":"https://openalex.org/I68891433","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06","country_code":"IN","type":"education","lineage":["https://openalex.org/I68891433"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Preeti Ranjan Panda","raw_affiliation_strings":["Indian Institute of Technology Delhi, New Delhi, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology Delhi, New Delhi, India","institution_ids":["https://openalex.org/I68891433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087828471","display_name":"Deepak Chauhan","orcid":null},"institutions":[{"id":"https://openalex.org/I68891433","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06","country_code":"IN","type":"education","lineage":["https://openalex.org/I68891433"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Deepak Chauhan","raw_affiliation_strings":["Indian Institute of Technology Delhi, New Delhi, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology Delhi, New Delhi, India","institution_ids":["https://openalex.org/I68891433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059709921","display_name":"Sharad Kumar","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sharad Kumar","raw_affiliation_strings":["Freescale Semiconductors India Pvt Ltd, Noida, India"],"affiliations":[{"raw_affiliation_string":"Freescale Semiconductors India Pvt Ltd, Noida, India","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007225479","display_name":"Smruti R. Sarangi","orcid":"https://orcid.org/0000-0002-1657-8523"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Smruti R. Sarangi","raw_affiliation_strings":["Freescale Semiconductors India Pvt Ltd, Noida, India"],"affiliations":[{"raw_affiliation_string":"Freescale Semiconductors India Pvt Ltd, Noida, India","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5029123373"],"corresponding_institution_ids":["https://openalex.org/I68891433"],"apc_list":null,"apc_paid":null,"fwci":0.3153,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.53714501,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"32","issue":null,"first_page":"737","last_page":"742"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/trace","display_name":"TRACE (psycholinguistics)","score":0.9505268335342407},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.9333207607269287},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8007292747497559},{"id":"https://openalex.org/keywords/software-bug","display_name":"Software bug","score":0.5031537413597107},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.4760420322418213},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.43137693405151367},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.2134951651096344},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.1754274070262909},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.061350464820861816},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.05248090624809265}],"concepts":[{"id":"https://openalex.org/C75291252","wikidata":"https://www.wikidata.org/wiki/Q1315756","display_name":"TRACE (psycholinguistics)","level":2,"score":0.9505268335342407},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.9333207607269287},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8007292747497559},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.5031537413597107},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4760420322418213},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.43137693405151367},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.2134951651096344},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.1754274070262909},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.061350464820861816},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.05248090624809265},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aspdac.2016.7428099","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2016.7428099","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5400000214576721,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1976401811","https://openalex.org/W1993519726","https://openalex.org/W1993822809","https://openalex.org/W2010574338","https://openalex.org/W2014071060","https://openalex.org/W2024441281","https://openalex.org/W2026484340","https://openalex.org/W2042428442","https://openalex.org/W2097665157","https://openalex.org/W2113995939","https://openalex.org/W2123582310","https://openalex.org/W2130393241","https://openalex.org/W2137769520","https://openalex.org/W2142295179","https://openalex.org/W2145018435","https://openalex.org/W2145913625","https://openalex.org/W2165139922","https://openalex.org/W2166862343","https://openalex.org/W3150400496","https://openalex.org/W6656324237"],"related_works":["https://openalex.org/W2543101158","https://openalex.org/W1569638199","https://openalex.org/W2068239131","https://openalex.org/W2740264376","https://openalex.org/W2978026406","https://openalex.org/W2388687068","https://openalex.org/W4256495946","https://openalex.org/W2399091034","https://openalex.org/W2351581202","https://openalex.org/W2366922255"],"abstract_inverted_index":{"On-chip":[0],"trace":[1,37,48,55,61],"buffers":[2,20],"are":[3,83],"increasingly":[4],"being":[5],"used":[6],"for":[7,94],"at-speed":[8],"debug":[9],"during":[10,101],"post-silicon":[11,102],"validation.":[12,103],"However,":[13],"the":[14,35,47,88,91],"activity":[15],"history":[16,38],"captured":[17,36],"by":[18,42],"these":[19],"is":[21],"small":[22],"due":[23],"to":[24,50,71],"their":[25],"limited":[26],"size.":[27],"We":[28,57,86],"propose":[29],"a":[30,44,66],"novel":[31],"scheme":[32],"that":[33,64],"extends":[34],"(by":[39],"upto":[40],"162%)":[41],"using":[43],"portion":[45],"of":[46,54,69,81,90,98],"buffer":[49,62],"also":[51],"store":[52],"summaries":[53,74],"messages.":[56],"describe":[58],"an":[59],"Overlapped":[60],"architecture":[63],"uses":[65],"reduced":[67],"number":[68],"ports":[70],"capture":[72],"tapered":[73],"where":[75],"both":[76],"detailed":[77],"and":[78],"summary":[79],"versions":[80],"traces":[82],"stored":[84],"simultaneously.":[85],"demonstrate":[87],"usefulness":[89],"proposed":[92],"methodology":[93],"debugging":[95],"various":[96],"classes":[97],"bugs":[99],"encountered":[100]},"counts_by_year":[{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}