{"id":"https://openalex.org/W2137358780","doi":"https://doi.org/10.1109/aspdac.2014.6742997","title":"LightSim: A leakage aware ultrafast temperature simulator","display_name":"LightSim: A leakage aware ultrafast temperature simulator","publication_year":2014,"publication_date":"2014-01-01","ids":{"openalex":"https://openalex.org/W2137358780","doi":"https://doi.org/10.1109/aspdac.2014.6742997","mag":"2137358780"},"language":"en","primary_location":{"id":"doi:10.1109/aspdac.2014.6742997","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2014.6742997","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007225479","display_name":"Smruti R. Sarangi","orcid":"https://orcid.org/0000-0002-1657-8523"},"institutions":[{"id":"https://openalex.org/I64295750","display_name":"Indian Institute of Technology Indore","ror":"https://ror.org/01hhf7w52","country_code":"IN","type":"education","lineage":["https://openalex.org/I64295750"]},{"id":"https://openalex.org/I68891433","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06","country_code":"IN","type":"education","lineage":["https://openalex.org/I68891433"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Smruti R. Sarangi","raw_affiliation_strings":["Computer Science and Engg., Indian Institute of Technology, Hauz Khas, New Delhi","Comput. Sci. & Eng., Indian Inst. of Technol., New Delhi, New Delhi, India"],"affiliations":[{"raw_affiliation_string":"Computer Science and Engg., Indian Institute of Technology, Hauz Khas, New Delhi","institution_ids":["https://openalex.org/I68891433"]},{"raw_affiliation_string":"Comput. Sci. & Eng., Indian Inst. of Technol., New Delhi, New Delhi, India","institution_ids":["https://openalex.org/I64295750"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065445058","display_name":"Gayathri Ananthanarayanan","orcid":"https://orcid.org/0000-0001-7429-7888"},"institutions":[{"id":"https://openalex.org/I64295750","display_name":"Indian Institute of Technology Indore","ror":"https://ror.org/01hhf7w52","country_code":"IN","type":"education","lineage":["https://openalex.org/I64295750"]},{"id":"https://openalex.org/I68891433","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06","country_code":"IN","type":"education","lineage":["https://openalex.org/I68891433"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Gayathri Ananthanarayanan","raw_affiliation_strings":["School of Information Technology, Indian Institute of Technology, Hauz Khas, New Delhi","Sch. of Inf. Technol., Indian Inst. of Technol., New Delhi, New Delhi, India"],"affiliations":[{"raw_affiliation_string":"School of Information Technology, Indian Institute of Technology, Hauz Khas, New Delhi","institution_ids":["https://openalex.org/I68891433"]},{"raw_affiliation_string":"Sch. of Inf. Technol., Indian Inst. of Technol., New Delhi, New Delhi, India","institution_ids":["https://openalex.org/I64295750"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108513360","display_name":"M. Balakrishnan","orcid":null},"institutions":[{"id":"https://openalex.org/I64295750","display_name":"Indian Institute of Technology Indore","ror":"https://ror.org/01hhf7w52","country_code":"IN","type":"education","lineage":["https://openalex.org/I64295750"]},{"id":"https://openalex.org/I68891433","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06","country_code":"IN","type":"education","lineage":["https://openalex.org/I68891433"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"M. Balakrishnan","raw_affiliation_strings":["Computer Science and Engg., Indian Institute of Technology, Hauz Khas, New Delhi","Comput. Sci. & Eng., Indian Inst. of Technol., New Delhi, New Delhi, India"],"affiliations":[{"raw_affiliation_string":"Computer Science and Engg., Indian Institute of Technology, Hauz Khas, New Delhi","institution_ids":["https://openalex.org/I68891433"]},{"raw_affiliation_string":"Comput. Sci. & Eng., Indian Inst. of Technol., New Delhi, New Delhi, India","institution_ids":["https://openalex.org/I64295750"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5007225479"],"corresponding_institution_ids":["https://openalex.org/I64295750","https://openalex.org/I68891433"],"apc_list":null,"apc_paid":null,"fwci":1.8839,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.87800864,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"11","issue":null,"first_page":"855","last_page":"860"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.6941089034080505},{"id":"https://openalex.org/keywords/hotspot","display_name":"Hotspot (geology)","score":0.6175788640975952},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6093641519546509},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.56414395570755},{"id":"https://openalex.org/keywords/leakage-power","display_name":"Leakage power","score":0.5568439364433289},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5087850689888},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.4620356857776642},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.4315919280052185},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38185641169548035},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19951874017715454},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19590455293655396},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18417438864707947},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.14548060297966003},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11404407024383545}],"concepts":[{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.6941089034080505},{"id":"https://openalex.org/C146481406","wikidata":"https://www.wikidata.org/wiki/Q105131","display_name":"Hotspot (geology)","level":2,"score":0.6175788640975952},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6093641519546509},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.56414395570755},{"id":"https://openalex.org/C2987719587","wikidata":"https://www.wikidata.org/wiki/Q1811428","display_name":"Leakage power","level":4,"score":0.5568439364433289},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5087850689888},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.4620356857776642},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.4315919280052185},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38185641169548035},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19951874017715454},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19590455293655396},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18417438864707947},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.14548060297966003},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11404407024383545},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C8058405","wikidata":"https://www.wikidata.org/wiki/Q46255","display_name":"Geophysics","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aspdac.2014.6742997","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2014.6742997","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.4099999964237213,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W2059417292","https://openalex.org/W2085664793","https://openalex.org/W2096554329","https://openalex.org/W2097172629","https://openalex.org/W2097697289","https://openalex.org/W2103762121","https://openalex.org/W2114618864","https://openalex.org/W2123801699","https://openalex.org/W2128709524","https://openalex.org/W2132820637","https://openalex.org/W2133647014","https://openalex.org/W2146765961","https://openalex.org/W2153328462","https://openalex.org/W2154857344","https://openalex.org/W2157558963","https://openalex.org/W2168138998","https://openalex.org/W4237879912","https://openalex.org/W4238041806","https://openalex.org/W4239055271","https://openalex.org/W4243380698","https://openalex.org/W4243494208","https://openalex.org/W4246056887","https://openalex.org/W6674408470","https://openalex.org/W6676919186","https://openalex.org/W6682624730","https://openalex.org/W6684944495"],"related_works":["https://openalex.org/W2379637199","https://openalex.org/W2405057786","https://openalex.org/W2501832907","https://openalex.org/W2063054109","https://openalex.org/W2900067469","https://openalex.org/W2130342263","https://openalex.org/W2968511773","https://openalex.org/W2128559064","https://openalex.org/W2316140901","https://openalex.org/W1966025033"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3,65],"propose":[4],"the":[5,26,47,57,67,75,80],"design":[6],"of":[7,28,46,70],"an":[8],"ultra-fast":[9],"temperature":[10,61,68],"simulator":[11,84],"(LightSim)":[12],"that":[13],"can":[14],"perform":[15],"both":[16],"steady":[17],"state":[18],"and":[19,23,62,93],"transient":[20,44],"thermal":[21],"analysis,":[22],"also":[24],"take":[25],"effect":[27],"leakage":[29],"power":[30,81],"into":[31,55],"account.":[32],"We":[33],"use":[34],"a":[35,43,51,71],"novel":[36],"Hankel":[37],"transform":[38],"based":[39],"technique":[40],"to":[41,110],"derive":[42],"version":[45],"Green's":[48,77],"function":[49,78],"for":[50],"chip,":[52],"which":[53],"takes":[54],"account":[56],"feedback":[58],"loop":[59],"between":[60],"leakage.":[63],"Subsequently,":[64],"calculate":[66],"map":[69],"chip":[72],"by":[73],"convolving":[74],"derived":[76],"with":[79],"map.":[82],"Our":[83],"is":[85,108],"at":[86,94],"least":[87,95],"3500":[88],"times":[89,97],"faster":[90,98],"than":[91,99],"HotSpot,":[92],"2.3":[96],"competing":[100],"research":[101],"prototypes":[102],"[4,":[103],"12].":[104],"The":[105],"total":[106],"error":[107],"limited":[109],"0.18":[111],"\u00b0C.":[112]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":4},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}