{"id":"https://openalex.org/W2032793297","doi":"https://doi.org/10.1109/aspdac.2014.6742869","title":"CNPUF: A Carbon Nanotube-based Physically Unclonable Function for secure low-energy hardware design","display_name":"CNPUF: A Carbon Nanotube-based Physically Unclonable Function for secure low-energy hardware design","publication_year":2014,"publication_date":"2014-01-01","ids":{"openalex":"https://openalex.org/W2032793297","doi":"https://doi.org/10.1109/aspdac.2014.6742869","mag":"2032793297"},"language":"en","primary_location":{"id":"doi:10.1109/aspdac.2014.6742869","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2014.6742869","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5071635269","display_name":"S. T. Choden Konigsmark","orcid":null},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"S. T. Choden Konigsmark","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign","Dept of Electr. & Comput. Engg, Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"Dept of Electr. & Comput. Engg, Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039019608","display_name":"Leslie K. Hwang","orcid":"https://orcid.org/0000-0002-0125-4438"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Leslie K. Hwang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign","Dept of Electr. & Comput. Engg, Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"Dept of Electr. & Comput. Engg, Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056321228","display_name":"Deming Chen","orcid":"https://orcid.org/0000-0002-3016-0270"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Deming Chen","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign","Dept of Electr. & Comput. Engg, Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"Dept of Electr. & Comput. Engg, Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053378706","display_name":"Martin D. F. Wong","orcid":"https://orcid.org/0000-0001-8274-9688"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Martin D. F. Wong","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign","Dept of Electr. & Comput. Engg, Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"Dept of Electr. & Comput. Engg, Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5071635269"],"corresponding_institution_ids":["https://openalex.org/I157725225"],"apc_list":null,"apc_paid":null,"fwci":6.1295,"has_fulltext":false,"cited_by_count":56,"citation_normalized_percentile":{"value":0.96620543,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"73","last_page":"78"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.867548942565918},{"id":"https://openalex.org/keywords/hardware-security-module","display_name":"Hardware security module","score":0.6181140542030334},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5711997747421265},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5518888235092163},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.5469222664833069},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5355337262153625},{"id":"https://openalex.org/keywords/carbon-nanotube","display_name":"Carbon nanotube","score":0.5211036801338196},{"id":"https://openalex.org/keywords/carbon-nanotube-field-effect-transistor","display_name":"Carbon nanotube field-effect transistor","score":0.451693058013916},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.4490545094013214},{"id":"https://openalex.org/keywords/authentication","display_name":"Authentication (law)","score":0.4460684061050415},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.42616698145866394},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3850124180316925},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.382136732339859},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36539918184280396},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.34377965331077576},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.30733996629714966},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24374067783355713},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.20629644393920898},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16852712631225586},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.0681753158569336}],"concepts":[{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.867548942565918},{"id":"https://openalex.org/C39217717","wikidata":"https://www.wikidata.org/wiki/Q1432354","display_name":"Hardware security module","level":3,"score":0.6181140542030334},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5711997747421265},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5518888235092163},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.5469222664833069},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5355337262153625},{"id":"https://openalex.org/C513720949","wikidata":"https://www.wikidata.org/wiki/Q1778729","display_name":"Carbon nanotube","level":2,"score":0.5211036801338196},{"id":"https://openalex.org/C58916441","wikidata":"https://www.wikidata.org/wiki/Q1778563","display_name":"Carbon nanotube field-effect transistor","level":5,"score":0.451693058013916},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.4490545094013214},{"id":"https://openalex.org/C148417208","wikidata":"https://www.wikidata.org/wiki/Q4825882","display_name":"Authentication (law)","level":2,"score":0.4460684061050415},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.42616698145866394},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3850124180316925},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.382136732339859},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36539918184280396},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.34377965331077576},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.30733996629714966},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24374067783355713},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.20629644393920898},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16852712631225586},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0681753158569336},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aspdac.2014.6742869","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2014.6742869","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6200000047683716}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1646294624","https://openalex.org/W1990678219","https://openalex.org/W1995871244","https://openalex.org/W2000171858","https://openalex.org/W2006056114","https://openalex.org/W2037616057","https://openalex.org/W2047942632","https://openalex.org/W2051336571","https://openalex.org/W2056087990","https://openalex.org/W2097795101","https://openalex.org/W2099889158","https://openalex.org/W2105107804","https://openalex.org/W2116374153","https://openalex.org/W2123482651","https://openalex.org/W2128753706","https://openalex.org/W2135407913","https://openalex.org/W2154150207","https://openalex.org/W2160467205","https://openalex.org/W2164258371","https://openalex.org/W2165303371","https://openalex.org/W2168402089","https://openalex.org/W2168452204","https://openalex.org/W2172161464","https://openalex.org/W2297397638","https://openalex.org/W2916916283","https://openalex.org/W4241974198","https://openalex.org/W6636906425","https://openalex.org/W6662214237"],"related_works":["https://openalex.org/W1976780206","https://openalex.org/W2040623373","https://openalex.org/W2013602293","https://openalex.org/W2048432227","https://openalex.org/W2324143163","https://openalex.org/W858765514","https://openalex.org/W2064856154","https://openalex.org/W1571458441","https://openalex.org/W2122490741","https://openalex.org/W2781034093"],"abstract_inverted_index":{"Physically":[0],"Unclonable":[1],"Functions":[2],"(PUFs)":[3],"are":[4,38],"used":[5],"to":[6,29,41,94],"provide":[7],"identification,":[8],"authentication":[9],"and":[10,17,33,37,77,89,102],"secret":[11],"key":[12],"generation":[13],"based":[14],"on":[15],"unique":[16,34,67],"unpredictable":[18],"physical":[19,35],"characteristics.":[20,69],"Carbon":[21,55],"Nanotube":[22,56],"Field":[23],"Effect":[24],"Transistors":[25],"(CNFETs)":[26],"were":[27],"shown":[28],"have":[30],"excellent":[31],"electrical":[32],"characteristics":[36],"promising":[39],"candidates":[40],"replace":[42],"silicon":[43],"transistors":[44],"in":[45,92],"future":[46],"Very":[47],"Large":[48],"Scale":[49],"Integration":[50],"(VLSI)":[51],"designs.":[52],"We":[53],"present":[54],"PUF":[57,61,98],"(CNPUF),":[58],"the":[59],"first":[60],"design":[62],"that":[63],"takes":[64],"advantage":[65],"of":[66,100],"CNFET":[68],"CNPUF":[70,84,106],"achieves":[71],"higher":[72],"reliability":[73],"against":[74,80],"environmental":[75],"variations":[76],"increased":[78],"resistance":[79],"modeling":[81],"attacks.":[82],"Furthermore,":[83],"has":[85],"a":[86],"considerable":[87],"power":[88,97],"energy":[90],"reduction":[91],"comparison":[93],"previous":[95],"ultra-low":[96],"designs":[99],"89.6%":[101],"98%,":[103],"respectively.":[104],"Additionally,":[105],"allows":[107],"power-security":[108],"tradeoff.":[109]},"counts_by_year":[{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":10},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":10},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":9},{"year":2015,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}