{"id":"https://openalex.org/W2040654750","doi":"https://doi.org/10.1109/aspdac.2012.6165046","title":"On error modeling of electrical bugs for post-silicon timing validation","display_name":"On error modeling of electrical bugs for post-silicon timing validation","publication_year":2012,"publication_date":"2012-01-01","ids":{"openalex":"https://openalex.org/W2040654750","doi":"https://doi.org/10.1109/aspdac.2012.6165046","mag":"2040654750"},"language":"en","primary_location":{"id":"doi:10.1109/aspdac.2012.6165046","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2012.6165046","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"17th Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011799739","display_name":"Ming Gao","orcid":"https://orcid.org/0000-0002-2569-5430"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ming Gao","raw_affiliation_strings":["Electrical and Computer Engineering Department, University of California, Santa Barbara, CA, USA","Electrical and Computer Engineering Department, University of California, Santa Barbara, 93106, U. S. A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, University of California, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"Electrical and Computer Engineering Department, University of California, Santa Barbara, 93106, U. S. A","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014225576","display_name":"Peter Lisherness","orcid":null},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Peter Lisherness","raw_affiliation_strings":["Electrical and Computer Engineering Department, University of California, Santa Barbara, CA, USA","Electrical and Computer Engineering Department, University of California, Santa Barbara, 93106, U. S. A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, University of California, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"Electrical and Computer Engineering Department, University of California, Santa Barbara, 93106, U. S. A","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077687075","display_name":"Kwang\u2010Ting Cheng","orcid":"https://orcid.org/0000-0002-3885-4912"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kwang-Ting Cheng","raw_affiliation_strings":["Electrical and Computer Engineering Department, University of California, Santa Barbara, CA, USA","Electrical and Computer Engineering Department, University of California, Santa Barbara, 93106, U. S. A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, University of California, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"Electrical and Computer Engineering Department, University of California, Santa Barbara, 93106, U. S. A","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110204273","display_name":"Jing-Jia Liou","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jing-Jia Liou","raw_affiliation_strings":["Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan","Department of Electrical Engineering, National Tsing Hua University Hsinchu, Taiwan#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]},{"raw_affiliation_string":"Department of Electrical Engineering, National Tsing Hua University Hsinchu, Taiwan#TAB#","institution_ids":["https://openalex.org/I25846049"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.869,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.73375902,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"701","last_page":"706"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.9067330360412598},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.8381249904632568},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7726837992668152},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.7285431027412415},{"id":"https://openalex.org/keywords/software-bug","display_name":"Software bug","score":0.7010135054588318},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6346693634986877},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5454292297363281},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.4932031035423279},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.44857677817344666},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.4246806502342224},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3311934769153595},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.3268008232116699},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.19366049766540527},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13539394736289978},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.08585354685783386}],"concepts":[{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.9067330360412598},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.8381249904632568},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7726837992668152},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.7285431027412415},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.7010135054588318},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6346693634986877},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5454292297363281},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.4932031035423279},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.44857677817344666},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.4246806502342224},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3311934769153595},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.3268008232116699},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.19366049766540527},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13539394736289978},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08585354685783386},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/aspdac.2012.6165046","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2012.6165046","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"17th Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.665.8227","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.665.8227","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://cadlab.ece.ucsb.edu/sites/default/files/ASPDAC2012_Glitch.pdf","raw_type":"text"},{"id":"pmh:oai:repository.hkust.edu.hk:1783.1-76930","is_oa":false,"landing_page_url":"http://repository.hkust.edu.hk/ir/Record/1783.1-76930","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Conference paper"},{"id":"pmh:oai:repository.ust.hk:1783.1-76930","is_oa":false,"landing_page_url":"http://repository.ust.hk/ir/Record/1783.1-76930","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference paper"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.44999998807907104,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1994241124","https://openalex.org/W2043318181","https://openalex.org/W2068622604","https://openalex.org/W2090692734","https://openalex.org/W2101278273","https://openalex.org/W2106257389","https://openalex.org/W2124692465","https://openalex.org/W2128164561","https://openalex.org/W2144573344","https://openalex.org/W2150106518","https://openalex.org/W2154665706","https://openalex.org/W2159004509","https://openalex.org/W2160010735","https://openalex.org/W2161329778","https://openalex.org/W4252212943","https://openalex.org/W6667909597","https://openalex.org/W6682355067"],"related_works":["https://openalex.org/W2740264376","https://openalex.org/W4206999239","https://openalex.org/W2161928627","https://openalex.org/W4388482952","https://openalex.org/W2786113878","https://openalex.org/W2727867943","https://openalex.org/W3015562293","https://openalex.org/W4400860681","https://openalex.org/W1978161581","https://openalex.org/W2787155073"],"abstract_inverted_index":{"There":[0],"is":[1],"great":[2],"demand":[3],"for":[4],"an":[5,47,71],"accurate":[6,77],"and":[7,17,45,59],"scalable":[8],"metric":[9],"to":[10,37,54],"evaluate":[11],"the":[12,31,67,79],"functional":[13],"stimuli,":[14],"testbench":[15],"checkers,":[16],"DfD":[18],"(Design-for-Debug)":[19],"structures":[20],"used":[21],"in":[22],"post-silicon":[23],"timing":[24,56],"validation.":[25],"In":[26],"this":[27],"paper,":[28],"we":[29],"show":[30],"inadequacy":[32],"of":[33,43],"existing":[34],"methods":[35],"(due":[36],"either":[38],"inaccuracy":[39],"or":[40],"a":[41,83],"lack":[42],"scalability)":[44],"propose":[46],"approach":[48,69],"that":[49,66],"leverages":[50],"debug":[51],"engineers'":[52],"experience":[53],"model":[55,73],"errors":[57],"efficiently":[58],"with":[60,82],"sufficient":[61],"precision.":[62],"Experimental":[63],"results":[64],"demonstrate":[65],"proposed":[68],"produced":[70],"error":[72],"six":[74],"times":[75],"more":[76],"than":[78],"prior":[80],"art":[81],"negligible":[84],"simulation":[85],"overhead.":[86]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}