{"id":"https://openalex.org/W2005473208","doi":"https://doi.org/10.1109/aspdac.2012.6164962","title":"Improving validation coverage metrics to account for limited observability","display_name":"Improving validation coverage metrics to account for limited observability","publication_year":2012,"publication_date":"2012-01-01","ids":{"openalex":"https://openalex.org/W2005473208","doi":"https://doi.org/10.1109/aspdac.2012.6164962","mag":"2005473208"},"language":"en","primary_location":{"id":"doi:10.1109/aspdac.2012.6164962","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2012.6164962","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"17th Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014225576","display_name":"Peter Lisherness","orcid":null},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Peter Lisherness","raw_affiliation_strings":["Electrical and Computer Engineering Department, University of California, Santa Barbara, USA","[Electrical and Computer Engineering Department, University of California Santa Barbara, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, University of California, Santa Barbara, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"[Electrical and Computer Engineering Department, University of California Santa Barbara, USA]","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077687075","display_name":"Kwang\u2010Ting Cheng","orcid":"https://orcid.org/0000-0002-3885-4912"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kwang-Ting Cheng","raw_affiliation_strings":["Electrical and Computer Engineering Department, University of California, Santa Barbara, USA","[Electrical and Computer Engineering Department, University of California Santa Barbara, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, University of California, Santa Barbara, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"[Electrical and Computer Engineering Department, University of California Santa Barbara, USA]","institution_ids":["https://openalex.org/I154570441"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I154570441"],"apc_list":null,"apc_paid":null,"fwci":0.2897,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.55071257,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"292","last_page":"297"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/observability","display_name":"Observability","score":0.9447287321090698},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7927367091178894},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.6299929022789001},{"id":"https://openalex.org/keywords/code","display_name":"Code (set theory)","score":0.5357367992401123},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4843781888484955},{"id":"https://openalex.org/keywords/source-code","display_name":"Source code","score":0.43007326126098633},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4277750849723816},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.35895413160324097},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3536263108253479},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3505479693412781},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.2881639897823334},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.24756917357444763},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.10549688339233398},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.10156559944152832},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09207037091255188},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08616757392883301}],"concepts":[{"id":"https://openalex.org/C36299963","wikidata":"https://www.wikidata.org/wiki/Q1369844","display_name":"Observability","level":2,"score":0.9447287321090698},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7927367091178894},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.6299929022789001},{"id":"https://openalex.org/C2776760102","wikidata":"https://www.wikidata.org/wiki/Q5139990","display_name":"Code (set theory)","level":3,"score":0.5357367992401123},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4843781888484955},{"id":"https://openalex.org/C43126263","wikidata":"https://www.wikidata.org/wiki/Q128751","display_name":"Source code","level":2,"score":0.43007326126098633},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4277750849723816},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.35895413160324097},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3536263108253479},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3505479693412781},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.2881639897823334},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.24756917357444763},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.10549688339233398},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.10156559944152832},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09207037091255188},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08616757392883301},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/aspdac.2012.6164962","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2012.6164962","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"17th Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:repository.hkust.edu.hk:1783.1-76931","is_oa":false,"landing_page_url":"http://repository.hkust.edu.hk/ir/Record/1783.1-76931","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Conference paper"},{"id":"pmh:oai:repository.ust.hk:1783.1-76931","is_oa":false,"landing_page_url":"http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=LinksAMR&SrcApp=PARTNER_APP&DestLinkType=FullRecord&DestApp=WOS&KeyUT=000309240000048","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference paper"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2000767141","https://openalex.org/W2009241533","https://openalex.org/W2059376007","https://openalex.org/W2110813667","https://openalex.org/W2124710683","https://openalex.org/W2131200995","https://openalex.org/W2148627094","https://openalex.org/W2154809971","https://openalex.org/W2165566357","https://openalex.org/W4230265552","https://openalex.org/W4236340438","https://openalex.org/W4253833434","https://openalex.org/W6676661898"],"related_works":["https://openalex.org/W2046459260","https://openalex.org/W2765830098","https://openalex.org/W2967463586","https://openalex.org/W2074679142","https://openalex.org/W1971989957","https://openalex.org/W2517338020","https://openalex.org/W3157641275","https://openalex.org/W3081644756","https://openalex.org/W3188635326","https://openalex.org/W2997072589"],"abstract_inverted_index":{"In":[0,47],"both":[1,12],"pre-silicon":[2],"and":[3,19,30,42,45,76],"post-silicon":[4],"validation,":[5],"the":[6,17,24,36,40],"detection":[7,64],"of":[8,15,22,39,65,79],"design":[9,66],"errors":[10,18],"requires":[11],"stimulus":[13],"capable":[14,21],"activating":[16],"checkers":[20],"detecting":[23],"behavior":[25],"as":[26,82,84],"erroneous.":[27],"Most":[28],"functional":[29,96],"code":[31,74],"coverage":[32,75,97],"metrics":[33,58],"evaluate":[34],"only":[35],"activation":[37],"component":[38],"testbench":[41],"ignore":[43],"propagation":[44,62],"detection.":[46],"this":[48],"paper,":[49],"we":[50],"summarize":[51],"our":[52],"recent":[53],"work":[54],"in":[55],"developing":[56],"improved":[57],"that":[59],"account":[60],"for":[61,72],"and/or":[63],"errors.":[67],"These":[68],"works":[69],"include":[70],"tools":[71],"observability-enhanced":[73],"mutation":[77],"analysis":[78],"high-level":[80],"designs":[81],"well":[83],"an":[85],"analytical":[86],"method,":[87],"Coverage":[88],"Discounting,":[89],"which":[90],"adds":[91],"checker":[92],"sensitivity":[93],"to":[94],"arbitrary":[95],"metrics.":[98]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}