{"id":"https://openalex.org/W3142548232","doi":"https://doi.org/10.1109/aspdac.2011.5722292","title":"An RTL-to-GDS2 design methodology for advanced system LSI","display_name":"An RTL-to-GDS2 design methodology for advanced system LSI","publication_year":2011,"publication_date":"2011-01-01","ids":{"openalex":"https://openalex.org/W3142548232","doi":"https://doi.org/10.1109/aspdac.2011.5722292","mag":"3142548232"},"language":"en","primary_location":{"id":"doi:10.1109/aspdac.2011.5722292","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2011.5722292","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057068098","display_name":"Nobuyuki Nishiguchi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Nobuyuki Nishiguchi","raw_affiliation_strings":["Semiconductor Technology Academic Research Center (STARC)","Semiconductor Technology Academic Research Center, Japan"],"affiliations":[{"raw_affiliation_string":"Semiconductor Technology Academic Research Center (STARC)","institution_ids":[]},{"raw_affiliation_string":"Semiconductor Technology Academic Research Center, Japan","institution_ids":["https://openalex.org/I4210125918"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5057068098"],"corresponding_institution_ids":["https://openalex.org/I4210125918"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.37059203,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"770","last_page":"774"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/design-for-manufacturability","display_name":"Design for manufacturability","score":0.7991005182266235},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6561403274536133},{"id":"https://openalex.org/keywords/design-methods","display_name":"Design methods","score":0.6438048481941223},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.6396129131317139},{"id":"https://openalex.org/keywords/integrated-circuit-design","display_name":"Integrated circuit design","score":0.59535151720047},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4875923991203308},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.46624961495399475},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.4392382800579071},{"id":"https://openalex.org/keywords/iterative-design","display_name":"Iterative design","score":0.4312831163406372},{"id":"https://openalex.org/keywords/electronic-system-level-design-and-verification","display_name":"Electronic system-level design and verification","score":0.427217960357666},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.339036226272583},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22328659892082214},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.07565727829933167}],"concepts":[{"id":"https://openalex.org/C62064638","wikidata":"https://www.wikidata.org/wiki/Q553878","display_name":"Design for manufacturability","level":2,"score":0.7991005182266235},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6561403274536133},{"id":"https://openalex.org/C138852830","wikidata":"https://www.wikidata.org/wiki/Q2292993","display_name":"Design methods","level":2,"score":0.6438048481941223},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.6396129131317139},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.59535151720047},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4875923991203308},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.46624961495399475},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.4392382800579071},{"id":"https://openalex.org/C106246047","wikidata":"https://www.wikidata.org/wiki/Q4928435","display_name":"Iterative design","level":3,"score":0.4312831163406372},{"id":"https://openalex.org/C77495112","wikidata":"https://www.wikidata.org/wiki/Q5358436","display_name":"Electronic system-level design and verification","level":2,"score":0.427217960357666},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.339036226272583},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22328659892082214},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07565727829933167},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C2778648169","wikidata":"https://www.wikidata.org/wiki/Q967768","display_name":"Compatibility (geochemistry)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aspdac.2011.5722292","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2011.5722292","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W3151751772"],"related_works":["https://openalex.org/W2095646370","https://openalex.org/W2388589331","https://openalex.org/W1569991298","https://openalex.org/W2545489593","https://openalex.org/W4246351405","https://openalex.org/W2549099758","https://openalex.org/W1970762549","https://openalex.org/W2291870163","https://openalex.org/W2366713167","https://openalex.org/W3021581891"],"abstract_inverted_index":{"STARC":[0],"is":[1],"developing":[2],"an":[3],"RTL-to-GDS2":[4],"design":[5,16,28,30,36,50,64],"methodology":[6,17,65],"for":[7,31],"32nm":[8],"(and":[9],"28nm)":[10],"system":[11],"LSIs":[12],"called":[13],"STARCAD-CEL.":[14],"The":[15],"focuses":[18],"on":[19],"four":[20,70],"key":[21,71],"areas:":[22],"low":[23],"power":[24],"design,":[25],"variation":[26],"aware":[27],"and":[29],"manufacturability":[32],"as":[33,35],"well":[34],"productivity.":[37],"This":[38],"paper":[39],"examines":[40],"several":[41],"techniques":[42],"we":[43],"used":[44],"to":[45,68],"solve":[46],"issues":[47],"the":[48,59,62,69],"in":[49],"of":[51,61],"challenging,":[52],"leading":[53],"edge":[54],"devices.":[55],"It":[56],"also":[57],"describes":[58],"effectiveness":[60],"STARCAD-CEL":[63],"when":[66],"applied":[67],"areas.":[72]},"counts_by_year":[],"updated_date":"2026-04-08T06:01:36.053099","created_date":"2025-10-10T00:00:00"}