{"id":"https://openalex.org/W3139946980","doi":"https://doi.org/10.1109/aspdac.2011.5722275","title":"Accounting for inherent circuit resilience and process variations in analyzing gate oxide reliability","display_name":"Accounting for inherent circuit resilience and process variations in analyzing gate oxide reliability","publication_year":2011,"publication_date":"2011-01-01","ids":{"openalex":"https://openalex.org/W3139946980","doi":"https://doi.org/10.1109/aspdac.2011.5722275","mag":"3139946980"},"language":"en","primary_location":{"id":"doi:10.1109/aspdac.2011.5722275","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2011.5722275","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007059788","display_name":"Jianxin Fang","orcid":"https://orcid.org/0009-0000-6376-7119"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Jianxin Fang","raw_affiliation_strings":["Department of ECE, University of Minnesota, USA"],"affiliations":[{"raw_affiliation_string":"Department of ECE, University of Minnesota, USA","institution_ids":["https://openalex.org/I130238516"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068714995","display_name":"Sachin S. Sapatnekar","orcid":"https://orcid.org/0000-0002-5353-2364"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sachin S. Sapatnekar","raw_affiliation_strings":["Department of ECE, University of Minnesota, USA"],"affiliations":[{"raw_affiliation_string":"Department of ECE, University of Minnesota, USA","institution_ids":["https://openalex.org/I130238516"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5007059788"],"corresponding_institution_ids":["https://openalex.org/I130238516"],"apc_list":null,"apc_paid":null,"fwci":1.0599,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.81283141,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"689","last_page":"694"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6192819476127625},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5687758326530457},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5478314161300659},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5392526388168335},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.4692991375923157},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4460516571998596},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40569016337394714},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22891616821289062},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1545838713645935},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.11418041586875916}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6192819476127625},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5687758326530457},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5478314161300659},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5392526388168335},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.4692991375923157},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4460516571998596},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40569016337394714},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22891616821289062},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1545838713645935},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.11418041586875916},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aspdac.2011.5722275","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2011.5722275","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1699495354","https://openalex.org/W2007792906","https://openalex.org/W2010868641","https://openalex.org/W2102434753","https://openalex.org/W2103512568","https://openalex.org/W2119610788","https://openalex.org/W2121437951","https://openalex.org/W2125220969","https://openalex.org/W2126564504","https://openalex.org/W2132389735","https://openalex.org/W2132948050","https://openalex.org/W2139006661","https://openalex.org/W2147842458","https://openalex.org/W2158750015","https://openalex.org/W3147797681","https://openalex.org/W6653172151","https://openalex.org/W6678664461","https://openalex.org/W6679386655"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"Gate":[0],"oxide":[1],"breakdown":[2,58],"is":[3,95],"a":[4,27,31,54,57,75,87],"major":[5],"cause":[6],"of":[7,26,41,65],"reliability":[8],"failures":[9],"in":[10,30,53],"future":[11],"nanometer-scale":[12],"CMOS":[13],"designs.":[14],"This":[15],"paper":[16],"develops":[17],"an":[18],"analysis":[19],"technique":[20],"that":[21,111],"can":[22],"predict":[23],"the":[24,42,50,63,82],"probability":[25,85],"functional":[28],"failure":[29,84],"large":[32],"digital":[33],"circuit":[34,55,83],"due":[35],"to":[36,47,56],"this":[37,79,93],"phenomenon.":[38],"Novel":[39],"features":[40],"method":[43],"include":[44],"its":[45],"ability":[46],"account":[48],"for":[49],"inherent":[51],"resilience":[52],"event,":[59],"while":[60],"simultaneously":[61],"considering":[62],"impact":[64],"process":[66,71],"variations.":[67],"Based":[68],"on":[69,114],"standard":[70],"variation":[72],"models,":[73],"at":[74],"specified":[76],"time":[77],"instant,":[78],"procedure":[80],"determines":[81],"as":[86],"lognormal":[88],"distribution.":[89],"Experimental":[90],"results":[91],"demonstrate":[92],"approach":[94],"accurate":[96],"compared":[97],"with":[98],"Monte":[99],"Carlo":[100],"simulation,":[101],"and":[102],"gives":[103],"4.7-5.9\u00d7":[104],"better":[105],"lifetime":[106],"prediction":[107],"over":[108],"existing":[109],"methods":[110],"are":[112],"based":[113],"pessimistic":[115],"area-scaling":[116],"models.":[117]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}