{"id":"https://openalex.org/W3144524534","doi":"https://doi.org/10.1109/aspdac.2010.5419875","title":"A novel characterization technique for high speed I/O mixed signal circuit components using random jitter injection","display_name":"A novel characterization technique for high speed I/O mixed signal circuit components using random jitter injection","publication_year":2010,"publication_date":"2010-01-01","ids":{"openalex":"https://openalex.org/W3144524534","doi":"https://doi.org/10.1109/aspdac.2010.5419875","mag":"3144524534"},"language":"en","primary_location":{"id":"doi:10.1109/aspdac.2010.5419875","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2010.5419875","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019332672","display_name":"Ji Hwan Chun","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]},{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ji Hwan Chun","raw_affiliation_strings":["Computer Engineering Research Center, University of Texas, Austin, Austin, TX, USA","Intel Corporation, Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Research Center, University of Texas, Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"Intel Corporation, Austin, TX, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100415738","display_name":"Jae Wook Lee","orcid":"https://orcid.org/0000-0002-8756-0195"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jae Wook Lee","raw_affiliation_strings":["Computer Engineering Research Center, University of Texas, Austin, Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Research Center, University of Texas, Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068070739","display_name":"Jacob A. Abraham","orcid":"https://orcid.org/0000-0002-5336-5631"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jacob A. Abraham","raw_affiliation_strings":["Computer Engineering Research Center, University of Texas, Austin, Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Research Center, University of Texas, Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"312","last_page":"317"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/undersampling","display_name":"Undersampling","score":0.8801205158233643},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.8636093139648438},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.7880306243896484},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5794858932495117},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5495662689208984},{"id":"https://openalex.org/keywords/differential-nonlinearity","display_name":"Differential nonlinearity","score":0.537521481513977},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4951898157596588},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.37732914090156555},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15812966227531433},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13969996571540833},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.13912883400917053},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13561564683914185}],"concepts":[{"id":"https://openalex.org/C136536468","wikidata":"https://www.wikidata.org/wiki/Q1225894","display_name":"Undersampling","level":2,"score":0.8801205158233643},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.8636093139648438},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.7880306243896484},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5794858932495117},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5495662689208984},{"id":"https://openalex.org/C71217194","wikidata":"https://www.wikidata.org/wiki/Q575958","display_name":"Differential nonlinearity","level":3,"score":0.537521481513977},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4951898157596588},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.37732914090156555},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15812966227531433},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13969996571540833},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.13912883400917053},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13561564683914185}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aspdac.2010.5419875","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2010.5419875","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7300000190734863}],"awards":[],"funders":[{"id":"https://openalex.org/F4320307102","display_name":"Intel Corporation","ror":"https://ror.org/01ek73717"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W35149875","https://openalex.org/W1658809881","https://openalex.org/W2081089490","https://openalex.org/W2096471740","https://openalex.org/W2108528814","https://openalex.org/W2112489816","https://openalex.org/W2134275296","https://openalex.org/W2142613800","https://openalex.org/W2145873744","https://openalex.org/W2145923236","https://openalex.org/W6674550122"],"related_works":["https://openalex.org/W2109073422","https://openalex.org/W2168668096","https://openalex.org/W2953726986","https://openalex.org/W2595218477","https://openalex.org/W1990158658","https://openalex.org/W4385813579","https://openalex.org/W2015667454","https://openalex.org/W2971835802","https://openalex.org/W2045890828","https://openalex.org/W1998256653"],"abstract_inverted_index":{"Timing":[0],"problems":[1],"in":[2,25],"high-speed":[3],"serial":[4],"communications":[5],"are":[6,81],"mitigated":[7],"with":[8],"phase-interpolator":[9],"(PI)":[10],"circuitry.":[11],"Linearity":[12],"testing":[13],"of":[14,61,101],"PI":[15,21,42,52],"has":[16,33],"been":[17],"challenging,":[18],"even":[19],"though":[20],"is":[22,117],"widely":[23],"used":[24],"modern":[26],"high":[27],"speed":[28],"I/O":[29,63],"architectures.":[30],"Previous":[31],"research":[32],"focused":[34],"on":[35],"implementing":[36],"additional":[37],"built-in":[38],"circuits":[39],"to":[40],"measure":[41],"linearity.":[43],"In":[44],"this":[45],"paper,":[46],"we":[47],"present":[48],"a":[49],"cost":[50],"effective":[51],"linearity":[53],"measurement":[54],"technique":[55],"which":[56],"requires":[57],"no":[58],"significant":[59],"modification":[60],"existing":[62],"circuits.":[64],"Our":[65],"method":[66],"uses":[67],"jitter":[68,73],"distributions":[69,80],"obtained":[70,83],"from":[71,98],"random":[72],"injected":[74],"into":[75],"the":[76,94,99,108,114],"data":[77],"channel.":[78],"Two":[79],"separately":[82],"using":[84,88],"undersampling":[85],"and":[86],"sampling":[87],"PI.":[89],"The":[90],"proposed":[91],"algorithm":[92],"calculates":[93],"differential":[95],"nonlinearity":[96],"(DNL)":[97],"difference":[100],"these":[102],"distributions.":[103],"Simulation":[104],"results":[105],"show":[106],"that":[107],"average":[109],"prediction":[110],"RMS":[111],"error":[112],"for":[113],"DNL":[115],"calculation":[116],"0.31":[118],"LSB.":[119]},"counts_by_year":[{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}