{"id":"https://openalex.org/W3144560805","doi":"https://doi.org/10.1109/aspdac.2010.5419869","title":"A CMOS image sensor with 2.0-&amp;#x0113; random noise and 110-k&amp;#x0113; full well capacity using column source follower readout circuits","display_name":"A CMOS image sensor with 2.0-&amp;#x0113; random noise and 110-k&amp;#x0113; full well capacity using column source follower readout circuits","publication_year":2010,"publication_date":"2010-01-01","ids":{"openalex":"https://openalex.org/W3144560805","doi":"https://doi.org/10.1109/aspdac.2010.5419869","mag":"3144560805"},"language":"en","primary_location":{"id":"doi:10.1109/aspdac.2010.5419869","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2010.5419869","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109855870","display_name":"Takahiro Kohara","orcid":null},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Takahiro Kohara","raw_affiliation_strings":["Graduate School of Engineering, University of Tohoku, Sendai, Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, University of Tohoku, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100689737","display_name":"Woonghee Lee","orcid":"https://orcid.org/0000-0002-9641-2071"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Woonghee Lee","raw_affiliation_strings":["Graduate School of Engineering, University of Tohoku, Sendai, Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, University of Tohoku, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072743845","display_name":"Koichi Mizobuchi","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Koichi Mizobuchi","raw_affiliation_strings":["DISP Development, Texas Instruments Japan Limited, Inashiki, Ibaraki, Japan"],"affiliations":[{"raw_affiliation_string":"DISP Development, Texas Instruments Japan Limited, Inashiki, Ibaraki, Japan","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110456758","display_name":"Shigetoshi Sugawa","orcid":null},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shigetoshi Sugawa","raw_affiliation_strings":["Graduate School of Engineering, University of Tohoku, Sendai, Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, University of Tohoku, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5109855870"],"corresponding_institution_ids":["https://openalex.org/I201537933"],"apc_list":null,"apc_paid":null,"fwci":0.2886,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.68535339,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"33","issue":null,"first_page":"345","last_page":"346"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.658101499080658},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.6512554287910461},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5670672655105591},{"id":"https://openalex.org/keywords/column","display_name":"Column (typography)","score":0.5218966603279114},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.49982738494873047},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4730740487575531},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.36375105381011963},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.31621110439300537},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.30310577154159546},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.21285119652748108},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17365753650665283},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13134285807609558}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.658101499080658},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.6512554287910461},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5670672655105591},{"id":"https://openalex.org/C2780551164","wikidata":"https://www.wikidata.org/wiki/Q2306599","display_name":"Column (typography)","level":3,"score":0.5218966603279114},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.49982738494873047},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4730740487575531},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.36375105381011963},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.31621110439300537},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30310577154159546},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.21285119652748108},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17365753650665283},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13134285807609558},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aspdac.2010.5419869","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2010.5419869","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.47999998927116394}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W4248956746","https://openalex.org/W4255218942"],"related_works":["https://openalex.org/W2022123780","https://openalex.org/W2349576212","https://openalex.org/W1981776476","https://openalex.org/W2352535872","https://openalex.org/W1590693222","https://openalex.org/W2382967348","https://openalex.org/W2944239605","https://openalex.org/W1873415836","https://openalex.org/W2334823507","https://openalex.org/W2107073676"],"abstract_inverted_index":{"A":[0],"low":[1],"noise":[2],"CMOS":[3,34],"image":[4,35,83],"sensor":[5,36,84],"without":[6],"degradation":[7],"of":[8,18,21],"saturation":[9],"performance":[10],"has":[11,37],"been":[12],"developed":[13,82],"by":[14,80],"using":[15,81],"column":[16,40],"amplifiers":[17],"the":[19,77],"gains":[20],"about":[22],"1.0":[23],"with":[24],"a":[25],"lateral":[26],"overflow":[27],"integration":[28],"capacitor":[29],"technology.":[30],"The":[31],"1/4-inch,":[32],"SVGA":[33],"achieved":[38],"0.98":[39],"readout":[41,61],"gain,":[42,48],"100-\u00bfV/e":[43],"<sup":[44,50,57,64],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[45,51,58,65],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-</sup>":[46,52,59,66],"conversion":[47],"2.0-e":[49],"total":[53],"random":[54],"noise,":[55],"0.5-e":[56],"in":[60],"circuits,":[62],"110,000-e":[63],"full":[67],"well":[68],"capacity":[69],"and":[70,85],"95-dB":[71],"dynamic":[72],"range.":[73],"Moreover,":[74],"we":[75],"measure":[76],"pixel":[78,87],"noises":[79],"optimize":[86],"operating":[88],"condition.":[89]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}