{"id":"https://openalex.org/W3143477733","doi":"https://doi.org/10.1109/aspdac.2010.5419861","title":"Adaptive performance control with embedded timing error predictive sensors for subthreshold circuits","display_name":"Adaptive performance control with embedded timing error predictive sensors for subthreshold circuits","publication_year":2010,"publication_date":"2010-01-01","ids":{"openalex":"https://openalex.org/W3143477733","doi":"https://doi.org/10.1109/aspdac.2010.5419861","mag":"3143477733"},"language":"en","primary_location":{"id":"doi:10.1109/aspdac.2010.5419861","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2010.5419861","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004321250","display_name":"Hiroshi Fuketa","orcid":"https://orcid.org/0000-0003-0171-6679"},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroshi Fuketa","raw_affiliation_strings":["Department Information Systems Engineering, Osaka University, Japan","JST-CREST, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department Information Systems Engineering, Osaka University, Japan","institution_ids":["https://openalex.org/I98285908"]},{"raw_affiliation_string":"JST-CREST, Japan","institution_ids":["https://openalex.org/I4210086780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002405139","display_name":"Masanori Hashimoto","orcid":"https://orcid.org/0000-0002-0377-2108"},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masanori Hashimoto","raw_affiliation_strings":["Department Information Systems Engineering, Osaka University, Japan","JST-CREST, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department Information Systems Engineering, Osaka University, Japan","institution_ids":["https://openalex.org/I98285908"]},{"raw_affiliation_string":"JST-CREST, Japan","institution_ids":["https://openalex.org/I4210086780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015621925","display_name":"Yukio Mitsuyama","orcid":"https://orcid.org/0000-0001-8151-0085"},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yukio Mitsuyama","raw_affiliation_strings":["Department Information Systems Engineering, Osaka University, Japan","JST-CREST, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department Information Systems Engineering, Osaka University, Japan","institution_ids":["https://openalex.org/I98285908"]},{"raw_affiliation_string":"JST-CREST, Japan","institution_ids":["https://openalex.org/I4210086780"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008480880","display_name":"Takao Onoye","orcid":null},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takao Onoye","raw_affiliation_strings":["Department Information Systems Engineering, Osaka University, Japan","JST-CREST, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department Information Systems Engineering, Osaka University, Japan","institution_ids":["https://openalex.org/I98285908"]},{"raw_affiliation_string":"JST-CREST, Japan","institution_ids":["https://openalex.org/I4210086780"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.40290289,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"361","last_page":"362"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.8614379167556763},{"id":"https://openalex.org/keywords/adder","display_name":"Adder","score":0.7507911920547485},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7075140476226807},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6639977693557739},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6544119715690613},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5864291787147522},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.5480723977088928},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.4991168975830078},{"id":"https://openalex.org/keywords/low-power-electronics","display_name":"Low-power electronics","score":0.4777759313583374},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.41159188747406006},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.27793002128601074},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2770739793777466},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2115955948829651},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21004363894462585},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.20266717672348022},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.16360744833946228}],"concepts":[{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.8614379167556763},{"id":"https://openalex.org/C164620267","wikidata":"https://www.wikidata.org/wiki/Q376953","display_name":"Adder","level":3,"score":0.7507911920547485},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7075140476226807},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6639977693557739},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6544119715690613},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5864291787147522},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.5480723977088928},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.4991168975830078},{"id":"https://openalex.org/C117551214","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Low-power electronics","level":4,"score":0.4777759313583374},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.41159188747406006},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.27793002128601074},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2770739793777466},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2115955948829651},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21004363894462585},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.20266717672348022},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.16360744833946228},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aspdac.2010.5419861","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2010.5419861","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320322832","display_name":"University of Tokyo","ror":"https://ror.org/057zh3y96"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2028122837","https://openalex.org/W2101466451","https://openalex.org/W2161032316","https://openalex.org/W6675374072"],"related_works":["https://openalex.org/W2015155483","https://openalex.org/W2020064877","https://openalex.org/W2056387586","https://openalex.org/W2167755006","https://openalex.org/W2545960595","https://openalex.org/W1515931217","https://openalex.org/W2145169882","https://openalex.org/W2762672358","https://openalex.org/W2122945703","https://openalex.org/W2044919502"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"an":[3],"adaptive":[4,46],"technique":[5],"for":[6],"compensating":[7],"manufacturing":[8],"and":[9],"environmental":[10],"variability":[11],"in":[12,35,55],"subthreshold":[13],"circuits":[14],"using":[15],"\u00bfcanary":[16],"flip-flop\u00bf":[17],"that":[18,44],"can":[19,48],"predict":[20],"timing":[21],"errors.":[22],"A":[23],"32-bit":[24],"Kogge-Stone":[25],"adder":[26],"whose":[27],"performance":[28],"was":[29,33],"controlled":[30],"by":[31,53],"body-biasing":[32],"fabricated":[34],"a":[36],"65":[37],"nm":[38],"CMOS":[39],"process.":[40],"Measurement":[41],"results":[42],"show":[43],"the":[45,50,58],"control":[47],"reduce":[49],"power":[51],"dissipation":[52],"46%":[54],"comparison":[56],"with":[57,61],"worst-case":[59],"design":[60],"guardbanding.":[62]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}