{"id":"https://openalex.org/W3151751772","doi":"https://doi.org/10.1109/aspdac.2010.5419786","title":"Gate delay estimation in STA under dynamic power supply noise","display_name":"Gate delay estimation in STA under dynamic power supply noise","publication_year":2010,"publication_date":"2010-01-01","ids":{"openalex":"https://openalex.org/W3151751772","doi":"https://doi.org/10.1109/aspdac.2010.5419786","mag":"3151751772"},"language":"en","primary_location":{"id":"doi:10.1109/aspdac.2010.5419786","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2010.5419786","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009270907","display_name":"Takaaki Okumura","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takaaki Okumura","raw_affiliation_strings":["Development Depatment-1, Semiconductor Technology Academic Research Center, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Development Depatment-1, Semiconductor Technology Academic Research Center, Japan","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113451551","display_name":"F. Minami","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Fumihiro Minami","raw_affiliation_strings":["Development Depatment-1, Semiconductor Technology Academic Research Center, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Development Depatment-1, Semiconductor Technology Academic Research Center, Japan","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113975211","display_name":"Kenji Shimazaki","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kenji Shimazaki","raw_affiliation_strings":["Development Depatment-1, Semiconductor Technology Academic Research Center, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Development Depatment-1, Semiconductor Technology Academic Research Center, Japan","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030587658","display_name":"Kimihiko Kuwada","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kimihiko Kuwada","raw_affiliation_strings":["Development Depatment-1, Semiconductor Technology Academic Research Center, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Development Depatment-1, Semiconductor Technology Academic Research Center, Japan","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002405139","display_name":"Masanori Hashimoto","orcid":"https://orcid.org/0000-0002-0377-2108"},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masanori Hashimoto","raw_affiliation_strings":["Department of Information Systems Engineering, Osaka University, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information Systems Engineering, Osaka University, Japan","institution_ids":["https://openalex.org/I98285908"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.9425,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.91738549,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"775","last_page":"780"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6448670029640198},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.6281369924545288},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6196836829185486},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.614526629447937},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5259388089179993},{"id":"https://openalex.org/keywords/delay-calculation","display_name":"Delay calculation","score":0.5167895555496216},{"id":"https://openalex.org/keywords/power-network-design","display_name":"Power network design","score":0.49707964062690735},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4915662705898285},{"id":"https://openalex.org/keywords/voltage-drop","display_name":"Voltage drop","score":0.47543954849243164},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.46006858348846436},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.459585577249527},{"id":"https://openalex.org/keywords/dynamic-demand","display_name":"Dynamic demand","score":0.4532032608985901},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.41253942251205444},{"id":"https://openalex.org/keywords/propagation-delay","display_name":"Propagation delay","score":0.34279710054397583},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2932356595993042},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19275575876235962},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.19031456112861633}],"concepts":[{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6448670029640198},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.6281369924545288},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6196836829185486},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.614526629447937},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5259388089179993},{"id":"https://openalex.org/C174086752","wikidata":"https://www.wikidata.org/wiki/Q5253471","display_name":"Delay calculation","level":3,"score":0.5167895555496216},{"id":"https://openalex.org/C164565468","wikidata":"https://www.wikidata.org/wiki/Q7236535","display_name":"Power network design","level":3,"score":0.49707964062690735},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4915662705898285},{"id":"https://openalex.org/C82178898","wikidata":"https://www.wikidata.org/wiki/Q166839","display_name":"Voltage drop","level":3,"score":0.47543954849243164},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.46006858348846436},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.459585577249527},{"id":"https://openalex.org/C45872418","wikidata":"https://www.wikidata.org/wiki/Q5318966","display_name":"Dynamic demand","level":3,"score":0.4532032608985901},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.41253942251205444},{"id":"https://openalex.org/C90806461","wikidata":"https://www.wikidata.org/wiki/Q1144416","display_name":"Propagation delay","level":2,"score":0.34279710054397583},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2932356595993042},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19275575876235962},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.19031456112861633},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aspdac.2010.5419786","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2010.5419786","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8700000047683716}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1980043105","https://openalex.org/W1992804126","https://openalex.org/W2153280661","https://openalex.org/W2159621090","https://openalex.org/W2164729680","https://openalex.org/W2165604639","https://openalex.org/W2629157711","https://openalex.org/W4233794767","https://openalex.org/W6675809723"],"related_works":["https://openalex.org/W3015599398","https://openalex.org/W2034656493","https://openalex.org/W2108172432","https://openalex.org/W2188730438","https://openalex.org/W2157230896","https://openalex.org/W2792778858","https://openalex.org/W2119232911","https://openalex.org/W2362904186","https://openalex.org/W121910558","https://openalex.org/W2114232017"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,25,55],"gate":[4,56],"delay":[5,45,57,88],"estimation":[6],"method":[7,27,85],"that":[8,38,59,82],"takes":[9],"into":[10],"account":[11],"dynamic":[12,29],"power":[13],"supply":[14],"noise.":[15],"We":[16,52],"review":[17],"STA":[18],"based":[19],"on":[20,94],"static":[21],"IR-drop":[22],"analysis":[23],"and":[24,32,36,43,66,77],"conventional":[26],"for":[28],"noise":[30,78],"waveform,":[31],"reveal":[33],"their":[34],"limitations":[35],"problems":[37,62],"originate":[39],"from":[40],"circuit":[41],"structures":[42],"higher":[44],"sensitivity":[46],"to":[47],"voltage":[48,70],"in":[49],"advanced":[50],"technologies.":[51],"then":[53],"propose":[54],"computation":[58],"overcomes":[60],"the":[61,83],"with":[63,74],"iterative":[64],"computations":[65],"consideration":[67],"of":[68],"input":[69],"drop.":[71],"Evaluation":[72],"results":[73],"various":[75],"circuits":[76],"injection":[79],"timings":[80],"show":[81],"proposed":[84],"estimates":[86],"path":[87],"fluctuation":[89],"well":[90],"within":[91],"2%":[92],"error":[93],"average.":[95]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}