{"id":"https://openalex.org/W3149545534","doi":"https://doi.org/10.1109/aspdac.2010.5419690","title":"Slack redistribution for graceful degradation under voltage overscaling","display_name":"Slack redistribution for graceful degradation under voltage overscaling","publication_year":2010,"publication_date":"2010-01-01","ids":{"openalex":"https://openalex.org/W3149545534","doi":"https://doi.org/10.1109/aspdac.2010.5419690","mag":"3149545534"},"language":"en","primary_location":{"id":"doi:10.1109/aspdac.2010.5419690","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2010.5419690","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073362797","display_name":"Andrew B. Kahng","orcid":null},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andrew B. Kahng","raw_affiliation_strings":["Coordinated Science Laboratory, University of Illinois, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Coordinated Science Laboratory, University of Illinois, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044543389","display_name":"Seokhyeong Kang","orcid":"https://orcid.org/0000-0003-3015-1806"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Seokhyeong Kang","raw_affiliation_strings":["CSE Departments, University of California, San Diego, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CSE Departments, University of California, San Diego, USA","institution_ids":["https://openalex.org/I36258959"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085384121","display_name":"Rakesh Kumar","orcid":"https://orcid.org/0000-0001-5606-5215"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rakesh Kumar","raw_affiliation_strings":["Coordinated Science Laboratory, University of Illinois, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Coordinated Science Laboratory, University of Illinois, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046254855","display_name":"John Sartori","orcid":"https://orcid.org/0000-0002-3467-9862"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John Sartori","raw_affiliation_strings":["Coordinated Science Laboratory, University of Illinois, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Coordinated Science Laboratory, University of Illinois, USA","institution_ids":["https://openalex.org/I157725225"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":10.6724,"has_fulltext":false,"cited_by_count":69,"citation_normalized_percentile":{"value":0.99118826,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"825","last_page":"831"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6168420314788818},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6105412244796753},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.49132218956947327},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.48095884919166565},{"id":"https://openalex.org/keywords/dynamic-voltage-scaling","display_name":"Dynamic voltage scaling","score":0.4751983880996704},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4739948511123657},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.45978525280952454},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4591301381587982},{"id":"https://openalex.org/keywords/routing","display_name":"Routing (electronic design automation)","score":0.45089179277420044},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.440362811088562},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4360354244709015},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36605313420295715},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.26309990882873535},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21738314628601074},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2084127962589264},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.124217689037323}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6168420314788818},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6105412244796753},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.49132218956947327},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.48095884919166565},{"id":"https://openalex.org/C2776047111","wikidata":"https://www.wikidata.org/wiki/Q632037","display_name":"Dynamic voltage scaling","level":3,"score":0.4751983880996704},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4739948511123657},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.45978525280952454},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4591301381587982},{"id":"https://openalex.org/C74172769","wikidata":"https://www.wikidata.org/wiki/Q1446839","display_name":"Routing (electronic design automation)","level":2,"score":0.45089179277420044},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.440362811088562},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4360354244709015},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36605313420295715},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.26309990882873535},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21738314628601074},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2084127962589264},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.124217689037323},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/aspdac.2010.5419690","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2010.5419690","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"},{"id":"pmh:oai:scholarworks.unist.ac.kr:201301/46632","is_oa":false,"landing_page_url":"http://ieeexplore.ieee.org/document/5419690/","pdf_url":null,"source":{"id":"https://openalex.org/S4306401118","display_name":"Scholarworks@UNIST (Ulsan National Institute of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I48566637","host_organization_name":"Ulsan National Institute of Science and Technology","host_organization_lineage":["https://openalex.org/I48566637"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"CONFERENCE"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8399999737739563,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320332222","display_name":"University of Illinois at Urbana-Champaign","ror":"https://ror.org/047426m28"},{"id":"https://openalex.org/F4320332603","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1913985116","https://openalex.org/W2010468809","https://openalex.org/W2091903090","https://openalex.org/W2097544821","https://openalex.org/W2100379261","https://openalex.org/W2100995829","https://openalex.org/W2120635877","https://openalex.org/W2133079932","https://openalex.org/W2148923014","https://openalex.org/W2149870396","https://openalex.org/W2152833313","https://openalex.org/W2153489710","https://openalex.org/W2163421219","https://openalex.org/W2167566128","https://openalex.org/W2170925473","https://openalex.org/W4236432903","https://openalex.org/W6682145182"],"related_works":["https://openalex.org/W39373273","https://openalex.org/W2098026815","https://openalex.org/W2390545901","https://openalex.org/W2351709090","https://openalex.org/W2735012529","https://openalex.org/W2732121450","https://openalex.org/W1619273082","https://openalex.org/W1604566864","https://openalex.org/W2503229030","https://openalex.org/W2359093654"],"abstract_inverted_index":{"Modern":[0],"digital":[1],"IC":[2],"designs":[3,116],"have":[4],"a":[5,25,60,109,135,154],"critical":[6,26],"operating":[7],"point,":[8],"or":[9,42],"\u201cwall":[10],"of":[11,48,78,103,156,161,169,174],"slack\u201d,":[12],"that":[13,98],"limits":[14,45],"voltage":[15,23,27,49,68,79,120],"scaling.":[16],"Even":[17],"with":[18,149],"an":[19,159,166],"error-tolerance":[20],"mechanism,":[21],"scaling":[22,50],"below":[24],"-":[28,31],"so-called":[29],"overscaling":[30],"results":[32],"in":[33,51,108],"more":[34,146,188],"timing":[35,101,106],"errors":[36],"than":[37,189],"can":[38],"be":[39],"effectively":[40],"detected":[41],"corrected.":[43],"This":[44],"the":[46,76,83,100,119,123,142],"effectiveness":[47],"trading":[52,64],"off":[53,65],"system":[54],"reliability":[55,66],"and":[56,67,111,140,158,184],"power.":[57],"We":[58,74],"propose":[59],"design-level":[61],"approach":[62],"to":[63,144],"(power)":[69],"in,":[70],"e.g.,":[71],"microprocessor":[72],"designs.":[73],"increase":[75],"range":[77],"values":[80],"at":[81,121,165],"which":[82,122],"(timing)":[84],"error":[85,126,138,167],"rate":[86,127,139,168],"is":[87,128,186],"acceptable;":[88],"we":[89,152],"achieve":[90,153],"this":[91],"through":[92,179],"techniques":[93],"for":[94,134],"power-aware":[95],"slack":[96,102],"redistribution":[97],"shift":[99],"frequently-exercised,":[104],"near-critical":[105],"paths":[107],"power-":[110],"area-efficient":[112],"manner.":[113],"The":[114,171],"resulting":[115],"heuristically":[117],"minimize":[118],"maximum":[124,137,155],"allowable":[125],"encountered,":[129],"thus":[130],"minimizing":[131],"power":[132,163],"consumption":[133],"prescribed":[136],"allowing":[141],"design":[143],"fail":[145],"gracefully.":[147],"Compared":[148],"baseline":[150],"designs,":[151],"32.8%":[157],"average":[160],"12.5%":[162],"reduction":[164],"2%.":[170],"area":[172],"overhead":[173],"our":[175],"techniques,":[176],"as":[177],"evaluated":[178],"physical":[180],"implementation":[181],"(synthesis,":[182],"placement":[183],"routing),":[185],"no":[187],"2.7%.":[190]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":9},{"year":2014,"cited_by_count":9},{"year":2013,"cited_by_count":9},{"year":2012,"cited_by_count":8}],"updated_date":"2026-08-12T21:12:35.861297","created_date":"2025-10-10T00:00:00"}