{"id":"https://openalex.org/W4247577920","doi":"https://doi.org/10.1109/aspdac.2009.4796491","title":"Trade-off analysis between timing error rate and power dissipation for adaptive speed control with timing error prediction","display_name":"Trade-off analysis between timing error rate and power dissipation for adaptive speed control with timing error prediction","publication_year":2009,"publication_date":"2009-01-01","ids":{"openalex":"https://openalex.org/W4247577920","doi":"https://doi.org/10.1109/aspdac.2009.4796491"},"language":"en","primary_location":{"id":"doi:10.1109/aspdac.2009.4796491","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2009.4796491","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004321250","display_name":"Hiroshi Fuketa","orcid":"https://orcid.org/0000-0003-0171-6679"},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroshi Fuketa","raw_affiliation_strings":["CREST, Japan Science and Technology Agency, Japan","Department Information Systems Engineering, Osaka University, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CREST, Japan Science and Technology Agency, Japan","institution_ids":["https://openalex.org/I4210086780"]},{"raw_affiliation_string":"Department Information Systems Engineering, Osaka University, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002405139","display_name":"Masanori Hashimoto","orcid":"https://orcid.org/0000-0002-0377-2108"},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masanori Hashimoto","raw_affiliation_strings":["CREST, Japan Science and Technology Agency, Japan","Department Information Systems Engineering, Osaka University, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CREST, Japan Science and Technology Agency, Japan","institution_ids":["https://openalex.org/I4210086780"]},{"raw_affiliation_string":"Department Information Systems Engineering, Osaka University, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015621925","display_name":"Yukio Mitsuyama","orcid":"https://orcid.org/0000-0001-8151-0085"},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yukio Mitsuyama","raw_affiliation_strings":["CREST, Japan Science and Technology Agency, Japan","Department Information Systems Engineering, Osaka University, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CREST, Japan Science and Technology Agency, Japan","institution_ids":["https://openalex.org/I4210086780"]},{"raw_affiliation_string":"Department Information Systems Engineering, Osaka University, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008480880","display_name":"Takao Onoye","orcid":null},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takao Onoye","raw_affiliation_strings":["CREST, Japan Science and Technology Agency, Japan","Department Information Systems Engineering, Osaka University, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CREST, Japan Science and Technology Agency, Japan","institution_ids":["https://openalex.org/I4210086780"]},{"raw_affiliation_string":"Department Information Systems Engineering, Osaka University, Japan","institution_ids":["https://openalex.org/I98285908"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3052,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.69225205,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"266","last_page":"271"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.7053820490837097},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.62421053647995},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.58162522315979},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5490874648094177},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5271710157394409},{"id":"https://openalex.org/keywords/ripple","display_name":"Ripple","score":0.48886364698410034},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.48848235607147217},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.4818623960018158},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4737842082977295},{"id":"https://openalex.org/keywords/adder","display_name":"Adder","score":0.46521735191345215},{"id":"https://openalex.org/keywords/word-error-rate","display_name":"Word error rate","score":0.4603199362754822},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44640350341796875},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.24868136644363403},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.20970064401626587},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.20549902319908142},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18540647625923157},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.14218711853027344},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12126263976097107}],"concepts":[{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.7053820490837097},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.62421053647995},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.58162522315979},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5490874648094177},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5271710157394409},{"id":"https://openalex.org/C2779599953","wikidata":"https://www.wikidata.org/wiki/Q1776117","display_name":"Ripple","level":3,"score":0.48886364698410034},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.48848235607147217},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.4818623960018158},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4737842082977295},{"id":"https://openalex.org/C164620267","wikidata":"https://www.wikidata.org/wiki/Q376953","display_name":"Adder","level":3,"score":0.46521735191345215},{"id":"https://openalex.org/C40969351","wikidata":"https://www.wikidata.org/wiki/Q3516228","display_name":"Word error rate","level":2,"score":0.4603199362754822},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44640350341796875},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.24868136644363403},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.20970064401626587},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.20549902319908142},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18540647625923157},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.14218711853027344},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12126263976097107},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C28490314","wikidata":"https://www.wikidata.org/wiki/Q189436","display_name":"Speech recognition","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aspdac.2009.4796491","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2009.4796491","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2009919741","https://openalex.org/W2102587899","https://openalex.org/W2129314919","https://openalex.org/W2150526221","https://openalex.org/W2151802820","https://openalex.org/W2162250277"],"related_works":["https://openalex.org/W2160859600","https://openalex.org/W3092420867","https://openalex.org/W2115729972","https://openalex.org/W2042032654","https://openalex.org/W2158291854","https://openalex.org/W2123535323","https://openalex.org/W2165340891","https://openalex.org/W2134944363","https://openalex.org/W4231005419","https://openalex.org/W168676510"],"abstract_inverted_index":{"Timing":[0],"margin":[1,35],"of":[2,44,110],"a":[3,28,41,49,82,91,97],"chip":[4,6,8],"varies":[5],"by":[7],"due":[9],"to":[10,31,58],"manufacturing":[11],"variability,":[12],"and":[13,18,66,103,106],"depends":[14],"on":[15,113],"operating":[16],"environment":[17],"aging.":[19],"Adaptive":[20],"speed":[21],"control":[22],"with":[23,72],"timing":[24,34,45,63,73,100],"error":[25,46,64,74,101],"prediction":[26],"is":[27,51,78],"promising":[29],"approach":[30],"mitigate":[32],"the":[33,60,108,111],"variation,":[36],"whereas":[37],"it":[38],"inherently":[39],"has":[40],"critical":[42],"risk":[43],"occurrence":[47],"when":[48],"circuit":[50],"slowed":[52],"down.":[53],"This":[54],"paper":[55],"presents":[56],"how":[57],"evaluate":[59],"relation":[61],"between":[62,99],"rate":[65,102],"power":[67,104],"dissipation":[68],"in":[69,87,90],"self-adaptive":[70],"circuits":[71],"prediction.":[75],"The":[76],"discussion":[77],"experimentally":[79],"validated":[80],"using":[81],"32-bit":[83],"ripple":[84],"carry":[85],"adder":[86],"subthreshold":[88],"operation":[89],"90nm":[92],"CMOS":[93],"process.":[94],"We":[95],"show":[96],"trade-off":[98,112],"dissipation,":[105],"reveal":[107],"dependency":[109],"design":[114],"parameters.":[115]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}