{"id":"https://openalex.org/W4237509200","doi":"https://doi.org/10.1109/aspdac.2008.4484031","title":"A new low energy BIST using a statistical code","display_name":"A new low energy BIST using a statistical code","publication_year":2008,"publication_date":"2008-01-01","ids":{"openalex":"https://openalex.org/W4237509200","doi":"https://doi.org/10.1109/aspdac.2008.4484031"},"language":"en","primary_location":{"id":"doi:10.1109/aspdac.2008.4484031","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2008.4484031","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102227100","display_name":"Sunghoon Chun","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Sunghoon Chun","raw_affiliation_strings":["Department of Electrical and Electronic Engineering Yonsei University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100671796","display_name":"Taejin Kim","orcid":"https://orcid.org/0000-0002-7977-3422"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taejin Kim","raw_affiliation_strings":["Department of Electrical and Electronic Engineering Yonsei University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068528309","display_name":"Sungho Kang","orcid":"https://orcid.org/0000-0002-7093-2095"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungho Kang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering Yonsei University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5102227100"],"corresponding_institution_ids":["https://openalex.org/I193775966"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.27727847,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"647","last_page":"652"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.991599977016449,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7947490215301514},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.7923024892807007},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6556497812271118},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6181463003158569},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.5947381258010864},{"id":"https://openalex.org/keywords/code","display_name":"Code (set theory)","score":0.5466547012329102},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.5347406268119812},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.5253457427024841},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5044451951980591},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.48402971029281616},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.47844910621643066},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.4759249985218048},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4502071142196655},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.438294917345047},{"id":"https://openalex.org/keywords/low-energy","display_name":"Low energy","score":0.4206010103225708},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.41634631156921387},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.388095885515213},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.32017749547958374},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21534866094589233},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.16552576422691345},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.105762779712677},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08787274360656738}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7947490215301514},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.7923024892807007},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6556497812271118},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6181463003158569},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.5947381258010864},{"id":"https://openalex.org/C2776760102","wikidata":"https://www.wikidata.org/wiki/Q5139990","display_name":"Code (set theory)","level":3,"score":0.5466547012329102},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.5347406268119812},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.5253457427024841},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5044451951980591},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.48402971029281616},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.47844910621643066},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.4759249985218048},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4502071142196655},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.438294917345047},{"id":"https://openalex.org/C2989164559","wikidata":"https://www.wikidata.org/wiki/Q15637420","display_name":"Low energy","level":2,"score":0.4206010103225708},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.41634631156921387},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.388095885515213},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.32017749547958374},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21534866094589233},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.16552576422691345},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.105762779712677},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08787274360656738},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aspdac.2008.4484031","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2008.4484031","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8999999761581421,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1581405316","https://openalex.org/W1921137125","https://openalex.org/W2096757277","https://openalex.org/W2097117126","https://openalex.org/W2103029029","https://openalex.org/W2114980975","https://openalex.org/W2132881562","https://openalex.org/W2138654786","https://openalex.org/W2144907792","https://openalex.org/W2145157329","https://openalex.org/W2149690470","https://openalex.org/W2152415903","https://openalex.org/W2155004241","https://openalex.org/W2155267750","https://openalex.org/W2160621850","https://openalex.org/W2166243422","https://openalex.org/W4238901649","https://openalex.org/W6634808979","https://openalex.org/W6682633095","https://openalex.org/W7028683319"],"related_works":["https://openalex.org/W4285708951","https://openalex.org/W2147986372","https://openalex.org/W2786111245","https://openalex.org/W1979305473","https://openalex.org/W3009953521","https://openalex.org/W4234763172","https://openalex.org/W2154529098","https://openalex.org/W2535245920","https://openalex.org/W2137475190","https://openalex.org/W2147058777"],"abstract_inverted_index":{"To":[0],"tackle":[1],"with":[2,93],"the":[3,8,45,53,63,76],"increased":[4],"switching":[5],"activity":[6],"during":[7,57],"test":[9,18,37,59,65,96],"operation,":[10],"this":[11,48],"paper":[12],"proposes":[13],"a":[14,27,31,40,58,85],"new":[15,32],"built-in":[16],"self":[17],"(BIST)":[19],"scheme":[20,81],"for":[21],"low":[22,78],"energy":[23,79,100],"testing":[24],"that":[25],"uses":[26],"statistical":[28],"code":[29],"and":[30,60,99],"technique":[33,49],"to":[34,51,61,68,95],"skip":[35],"unnecessary":[36],"sequences.":[38],"From":[39],"general":[41],"point":[42],"of":[43,47,75,87],"view,":[44],"goal":[46],"is":[50],"minimize":[52],"total":[54],"power":[55],"consumption":[56],"allow":[62],"at-speed":[64],"in":[66],"order":[67],"achieve":[69],"high":[70],"fault":[71],"coverage.":[72],"The":[73],"effectiveness":[74],"proposed":[77],"BIST":[80],"was":[82],"validated":[83],"on":[84],"set":[86],"ISC":[88],"AS":[89],"'89":[90],"benchmark":[91],"circuits":[92],"respect":[94],"data":[97],"volume":[98],"saving.":[101]},"counts_by_year":[{"year":2014,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}