{"id":"https://openalex.org/W4232063913","doi":"https://doi.org/10.1109/aspdac.2008.4484012","title":"An industrial perspective of power-aware reliable SoC design","display_name":"An industrial perspective of power-aware reliable SoC design","publication_year":2008,"publication_date":"2008-01-01","ids":{"openalex":"https://openalex.org/W4232063913","doi":"https://doi.org/10.1109/aspdac.2008.4484012"},"language":"en","primary_location":{"id":"doi:10.1109/aspdac.2008.4484012","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2008.4484012","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5055864607","display_name":"Soo-Kwan Eo","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Soo-Kwan Eo","raw_affiliation_strings":["Samsung Electronics Company Limited, Yongin si, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company Limited, Yongin si, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063521444","display_name":"Sungjoo Yoo","orcid":"https://orcid.org/0000-0002-5853-0675"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungjoo Yoo","raw_affiliation_strings":["Samsung Electronics Company Limited, Yongin si, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company Limited, Yongin si, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015760089","display_name":"Kyu-Myung Choi","orcid":"https://orcid.org/0000-0001-8153-8344"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyu-Myung Choi","raw_affiliation_strings":["Samsung Electronics Company Limited, Yongin si, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company Limited, Yongin si, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3392,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.70380381,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"555","last_page":"557"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.7425874471664429},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6650305986404419},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5848589539527893},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5543832778930664},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5416067838668823},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.5373728275299072},{"id":"https://openalex.org/keywords/integrated-circuit-design","display_name":"Integrated circuit design","score":0.4699445068836212},{"id":"https://openalex.org/keywords/frame","display_name":"Frame (networking)","score":0.44290968775749207},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.42983904480934143},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.41738513112068176},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.38166624307632446},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21082362532615662},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.11570939421653748}],"concepts":[{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.7425874471664429},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6650305986404419},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5848589539527893},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5543832778930664},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5416067838668823},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.5373728275299072},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.4699445068836212},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.44290968775749207},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.42983904480934143},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.41738513112068176},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.38166624307632446},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21082362532615662},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.11570939421653748},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aspdac.2008.4484012","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2008.4484012","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2009919741","https://openalex.org/W2028600299","https://openalex.org/W2109161070","https://openalex.org/W2131978583","https://openalex.org/W2173972090","https://openalex.org/W2236351867","https://openalex.org/W4233714602","https://openalex.org/W4240150272","https://openalex.org/W6678706103","https://openalex.org/W6690039675"],"related_works":["https://openalex.org/W4382130817","https://openalex.org/W1929041301","https://openalex.org/W2038859986","https://openalex.org/W2104315811","https://openalex.org/W2142217172","https://openalex.org/W4230312832","https://openalex.org/W1982273910","https://openalex.org/W2032882110","https://openalex.org/W2127843031","https://openalex.org/W2125423773"],"abstract_inverted_index":{"Reliable":[0,43],"SoC":[1,67,71,98,117,138],"design":[2,9,44,68,99,118,133],"is":[3,89],"becoming":[4],"one":[5],"of":[6,15,21,80,86,102,106,115],"important":[7],"real":[8],"problems":[10,30],"since":[11],"the":[12,19,36,62,65,78,84,104,112],"fast":[13],"pace":[14],"semiconductor":[16],"scaling":[17],"and":[18,25,54,119],"introduction":[20],"new":[22,132],"device":[23],"structures":[24],"materials":[26],"incur":[27],"more":[28],"reliability":[29],"than":[31],"can":[32],"be":[33],"solved":[34],"in":[35,64,77,100],"given":[37],"time":[38],"frame":[39],"(2":[40],"years/technology":[41],"node).":[42],"mostly":[45],"requires":[46],"resource":[47],"overhead":[48,63,85,105],"(additional":[49],"power":[50,87,107,124],"consumption,":[51],"silicon":[52],"area,":[53],"execution":[55],"time)":[56],"to":[57],"recover":[58],"from":[59],"errors.":[60],"Minimizing":[61],"reliable":[66,97,116,137],"will":[69],"give":[70],"industries":[72],"a":[73],"competitive":[74],"edge.":[75],"Especially,":[76],"case":[79],"mobile":[81],"SoC,":[82],"mastering":[83],"consumption":[88],"absolutely":[90],"imperative.":[91],"In":[92],"this":[93],"paper,":[94],"we":[95,110,127],"investigate":[96],"terms":[101],"reducing":[103],"consumption.":[108,125],"First,":[109],"review":[111],"current":[113],"practice":[114],"assess":[120],"its":[121],"impact":[122],"on":[123,131],"Then,":[126],"present":[128],"our":[129],"perspective":[130],"methodology":[134],"towards":[135],"power-aware":[136],"design.":[139]},"counts_by_year":[{"year":2013,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}