{"id":"https://openalex.org/W3142320814","doi":"https://doi.org/10.1109/aspdac.2008.4483917","title":"Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification","display_name":"Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification","publication_year":2008,"publication_date":"2008-01-01","ids":{"openalex":"https://openalex.org/W3142320814","doi":"https://doi.org/10.1109/aspdac.2008.4483917","mag":"3142320814"},"language":"en","primary_location":{"id":"doi:10.1109/aspdac.2008.4483917","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2008.4483917","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072741891","display_name":"Yasuhiro Ogasahara","orcid":"https://orcid.org/0000-0003-2718-1756"},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yasuhiro Ogasahara","raw_affiliation_strings":["Department Information Systems Engineering, Osaka University, Suita, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department Information Systems Engineering, Osaka University, Suita, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002405139","display_name":"Masanori Hashimoto","orcid":"https://orcid.org/0000-0002-0377-2108"},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masanori Hashimoto","raw_affiliation_strings":["Department Information Systems Engineering, Osaka University, Suita, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department Information Systems Engineering, Osaka University, Suita, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061693379","display_name":"Takao Onoye","orcid":"https://orcid.org/0000-0002-1894-2448"},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takao Onoye","raw_affiliation_strings":["Department Information Systems Engineering, Osaka University, Suita, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department Information Systems Engineering, Osaka University, Suita, Japan","institution_ids":["https://openalex.org/I98285908"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3392,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.70262965,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"107","last_page":"108"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.6322903633117676},{"id":"https://openalex.org/keywords/power-integrity","display_name":"Power integrity","score":0.6033239364624023},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5828868746757507},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5384544730186462},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5338125824928284},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5249668955802917},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38714420795440674},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2682547867298126},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.2202552855014801},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.20503604412078857},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.17066088318824768},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10080277919769287}],"concepts":[{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.6322903633117676},{"id":"https://openalex.org/C2777561913","wikidata":"https://www.wikidata.org/wiki/Q19599527","display_name":"Power integrity","level":4,"score":0.6033239364624023},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5828868746757507},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5384544730186462},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5338125824928284},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5249668955802917},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38714420795440674},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2682547867298126},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.2202552855014801},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.20503604412078857},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.17066088318824768},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10080277919769287},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aspdac.2008.4483917","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2008.4483917","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 Asia and South Pacific Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8700000047683716,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1487984748","https://openalex.org/W1973513762","https://openalex.org/W2103065376","https://openalex.org/W2111944961","https://openalex.org/W2136756462","https://openalex.org/W2141592563","https://openalex.org/W6681436805"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W4235454973","https://openalex.org/W4239401071","https://openalex.org/W2067224723","https://openalex.org/W2898734073","https://openalex.org/W1974895211","https://openalex.org/W2176409448","https://openalex.org/W2129841057","https://openalex.org/W3040712279","https://openalex.org/W2364769705"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"an":[3],"all":[4],"digital":[5],"measurement":[6],"circuit":[7],"called":[8],"\u201cgated":[9],"oscillator\u201d":[10],"for":[11,35],"capturing":[12],"waveforms":[13],"of":[14,40],"dynamic":[15],"power":[16],"supply":[17],"noise.":[18],"The":[19,38],"gated":[20,42],"oscillator":[21,43],"is":[22,44],"constructed":[23],"with":[24,46],"standard":[25],"cells,":[26],"and":[27],"thus":[28],"can":[29],"be":[30],"easily":[31],"embedded":[32],"in":[33,50],"SoCs":[34],"design":[36],"verification.":[37],"performance":[39],"the":[41],"verified":[45],"fabricated":[47],"test":[48],"chips":[49],"a":[51],"90nm":[52],"process.":[53]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}