{"id":"https://openalex.org/W4253642326","doi":"https://doi.org/10.1109/aspdac.2006.1594707","title":"A dynamic test compaction procedure for high-quality path delay testing","display_name":"A dynamic test compaction procedure for high-quality path delay testing","publication_year":2006,"publication_date":"2006-03-22","ids":{"openalex":"https://openalex.org/W4253642326","doi":"https://doi.org/10.1109/aspdac.2006.1594707"},"language":"en","primary_location":{"id":"doi:10.1109/aspdac.2006.1594707","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2006.1594707","pdf_url":null,"source":{"id":"https://openalex.org/S4363608292","display_name":"Asia and South Pacific Conference on Design Automation, 2006.","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Asia and South Pacific Conference on Design Automation, 2006.","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018347459","display_name":"M. Fukunaga","orcid":null},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Fukunaga","raw_affiliation_strings":["Fujitsu Laboratories Limited, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Limited, Kawasaki, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080906859","display_name":"S. Kajihara","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Kajihara","raw_affiliation_strings":["Kyushu Institute of Technology, Iizuka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology, Iizuka, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xiaoqing Wen","raw_affiliation_strings":["Kyushu Institute of Technology, Iizuka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology, Iizuka, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049511573","display_name":"T. Maeda","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Maeda","raw_affiliation_strings":["Semiconductor Technology Academic Research Center, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Technology Academic Research Center, Yokohama, Japan","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058094854","display_name":"S. Hamada","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Hamada","raw_affiliation_strings":["Semiconductor Technology Academic Research Center, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Technology Academic Research Center, Yokohama, Japan","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031769825","display_name":"Y. Sato","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Sato","raw_affiliation_strings":["Semiconductor Technology Academic Research Center, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Technology Academic Research Center, Yokohama, Japan","institution_ids":["https://openalex.org/I4210125918"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.31118104,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"348","last_page":"353"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.6967854499816895},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.638015866279602},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.6371136903762817},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6234919428825378},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5778264403343201},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5602479577064514},{"id":"https://openalex.org/keywords/dynamic-compaction","display_name":"Dynamic compaction","score":0.5452802777290344},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5047711133956909},{"id":"https://openalex.org/keywords/compaction","display_name":"Compaction","score":0.5010380744934082},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4849450886249542},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.44058161973953247},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.43354859948158264},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.36002352833747864},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2154862880706787},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16241243481636047},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10211333632469177}],"concepts":[{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.6967854499816895},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.638015866279602},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.6371136903762817},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6234919428825378},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5778264403343201},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5602479577064514},{"id":"https://openalex.org/C2777882295","wikidata":"https://www.wikidata.org/wiki/Q5318957","display_name":"Dynamic compaction","level":3,"score":0.5452802777290344},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5047711133956909},{"id":"https://openalex.org/C196715460","wikidata":"https://www.wikidata.org/wiki/Q1414356","display_name":"Compaction","level":2,"score":0.5010380744934082},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4849450886249542},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.44058161973953247},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.43354859948158264},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.36002352833747864},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2154862880706787},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16241243481636047},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10211333632469177},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C187320778","wikidata":"https://www.wikidata.org/wiki/Q1349130","display_name":"Geotechnical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aspdac.2006.1594707","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2006.1594707","pdf_url":null,"source":{"id":"https://openalex.org/S4363608292","display_name":"Asia and South Pacific Conference on Design Automation, 2006.","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Asia and South Pacific Conference on Design Automation, 2006.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W13277579","https://openalex.org/W63318650","https://openalex.org/W1568932717","https://openalex.org/W1761424569","https://openalex.org/W2095778470","https://openalex.org/W2097410912","https://openalex.org/W2112239008","https://openalex.org/W2112296229","https://openalex.org/W2115483211","https://openalex.org/W2117375946","https://openalex.org/W2121480480","https://openalex.org/W2151526282","https://openalex.org/W2156114148","https://openalex.org/W2165817266","https://openalex.org/W4230349140","https://openalex.org/W4230996632","https://openalex.org/W4236674018","https://openalex.org/W4242245787","https://openalex.org/W4302458519","https://openalex.org/W6600530048","https://openalex.org/W6602516640","https://openalex.org/W7111183471"],"related_works":["https://openalex.org/W2786111245","https://openalex.org/W3009953521","https://openalex.org/W4285708951","https://openalex.org/W2021253405","https://openalex.org/W1991935474","https://openalex.org/W2091533492","https://openalex.org/W2408214455","https://openalex.org/W2118133071","https://openalex.org/W2128148266","https://openalex.org/W2031574699"],"abstract_inverted_index":{"We":[0],"propose":[1],"a":[2,21,30,83],"dynamic":[3],"test":[4,10,24,36,57,64,69,85,99],"compaction":[5,100],"procedure":[6,19,80],"to":[7],"generate":[8,82],"high-quality":[9],"patterns":[11,70],"for":[12,26],"path":[13,31,91],"delay":[14,92],"faults.":[15],"While":[16],"the":[17,34,44,78,97],"proposed":[18,79,103],"generates":[20],"compact":[22,84],"two-pattern":[23],"set":[25,37,86],"paths":[27,46],"selected":[28,45],"by":[29,59,67],"selection":[32],"criterion,":[33],"generated":[35],"would":[38],"detect":[39,88],"not":[40],"only":[41],"faults":[42,49,62,93],"on":[43,50],"but":[47],"also":[48],"many":[51,89],"unselected":[52],"paths.":[53],"Hence":[54],"both":[55],"high":[56],"quality":[58],"detecting":[60],"untargeted":[61,90],"and":[63],"cost":[65],"reduction":[66],"reducing":[68],"can":[71],"be":[72],"achieved.":[73],"Experimental":[74],"results":[75],"show":[76],"that":[77,87],"could":[81],"certainly,":[94],"compared":[95],"with":[96],"static":[98],"method":[101],"previously":[102],"(Kajihara":[104],"et":[105],"al.,":[106],"2005).":[107]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}