{"id":"https://openalex.org/W7134904186","doi":"https://doi.org/10.1109/asp-dac66049.2026.11420339","title":"Mask-based Meta-Learning for Stuck-at Faults Tolerance in ReRAM Computing Systems","display_name":"Mask-based Meta-Learning for Stuck-at Faults Tolerance in ReRAM Computing Systems","publication_year":2026,"publication_date":"2026-01-19","ids":{"openalex":"https://openalex.org/W7134904186","doi":"https://doi.org/10.1109/asp-dac66049.2026.11420339"},"language":null,"primary_location":{"id":"doi:10.1109/asp-dac66049.2026.11420339","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asp-dac66049.2026.11420339","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 31st Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5105792550","display_name":"Zhan Shen","orcid":null},"institutions":[{"id":"https://openalex.org/I36399199","display_name":"Nanjing University of Science and Technology","ror":"https://ror.org/00xp9wg62","country_code":"CN","type":"education","lineage":["https://openalex.org/I36399199"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhan Shen","raw_affiliation_strings":["Nanjing University of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanjing University of Science and Technology","institution_ids":["https://openalex.org/I36399199"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5128695115","display_name":"Yiqi Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I36399199","display_name":"Nanjing University of Science and Technology","ror":"https://ror.org/00xp9wg62","country_code":"CN","type":"education","lineage":["https://openalex.org/I36399199"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiqi Zhou","raw_affiliation_strings":["Nanjing University of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanjing University of Science and Technology","institution_ids":["https://openalex.org/I36399199"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103185880","display_name":"Tianyi Xu","orcid":"https://orcid.org/0009-0007-3545-6250"},"institutions":[{"id":"https://openalex.org/I36399199","display_name":"Nanjing University of Science and Technology","ror":"https://ror.org/00xp9wg62","country_code":"CN","type":"education","lineage":["https://openalex.org/I36399199"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianyi Xu","raw_affiliation_strings":["Nanjing University of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanjing University of Science and Technology","institution_ids":["https://openalex.org/I36399199"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078618657","display_name":"Shan Shen","orcid":"https://orcid.org/0000-0003-1383-463X"},"institutions":[{"id":"https://openalex.org/I36399199","display_name":"Nanjing University of Science and Technology","ror":"https://ror.org/00xp9wg62","country_code":"CN","type":"education","lineage":["https://openalex.org/I36399199"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shan Shen","raw_affiliation_strings":["Nanjing University of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanjing University of Science and Technology","institution_ids":["https://openalex.org/I36399199"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102752492","display_name":"Zhen Mei","orcid":"https://orcid.org/0000-0003-0580-8423"},"institutions":[{"id":"https://openalex.org/I36399199","display_name":"Nanjing University of Science and Technology","ror":"https://ror.org/00xp9wg62","country_code":"CN","type":"education","lineage":["https://openalex.org/I36399199"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhen Mei","raw_affiliation_strings":["Nanjing University of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanjing University of Science and Technology","institution_ids":["https://openalex.org/I36399199"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Daying Sun","orcid":null},"institutions":[{"id":"https://openalex.org/I36399199","display_name":"Nanjing University of Science and Technology","ror":"https://ror.org/00xp9wg62","country_code":"CN","type":"education","lineage":["https://openalex.org/I36399199"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Daying Sun","raw_affiliation_strings":["Nanjing University of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanjing University of Science and Technology","institution_ids":["https://openalex.org/I36399199"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5128711966","display_name":"Zichen Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zichen Zhang","raw_affiliation_strings":["Beihang University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beihang University","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.30642681,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1117","last_page":"1123"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.3075000047683716,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.3075000047683716,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.1428000032901764,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.12470000237226486,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.3573000133037567},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.31610000133514404},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.28110000491142273},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.2734000086784363}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5311999917030334},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.3573000133037567},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.31610000133514404},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.30059999227523804},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2964000105857849},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2865999937057495},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.28110000491142273},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.2734000086784363},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.26840001344680786},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.25130000710487366},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asp-dac66049.2026.11420339","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asp-dac66049.2026.11420339","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 31st Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1971319818","https://openalex.org/W2027342132","https://openalex.org/W2112796928","https://openalex.org/W2194775991","https://openalex.org/W2768104155","https://openalex.org/W2787759178","https://openalex.org/W2827033417","https://openalex.org/W2946641467","https://openalex.org/W3000505821","https://openalex.org/W3016762888","https://openalex.org/W3036934002","https://openalex.org/W3174812964","https://openalex.org/W4280630360","https://openalex.org/W4296079404","https://openalex.org/W4313213854","https://openalex.org/W4315606171","https://openalex.org/W4386608690","https://openalex.org/W4399728783","https://openalex.org/W4400034122","https://openalex.org/W4400230828","https://openalex.org/W4409761023"],"related_works":[],"abstract_inverted_index":{"ReRAM":[0,115],"crossbar-based":[1],"computing-in-memory":[2],"(CIM)":[3],"systems":[4],"offer":[5],"computational":[6],"efficiency":[7],"but":[8],"suffer":[9],"from":[10],"significant":[11],"accuracy":[12,148,155],"degradation":[13],"under":[14],"stuck-at":[15],"faults":[16],"(SAFs).":[17],"Conventional":[18],"approaches":[19,158],"like":[20],"retraining-based":[21],"methods":[22],"fail":[23],"to":[24,48,67,119],"effectively":[25],"generalize":[26],"across":[27,149],"diverse":[28],"SAFs":[29,54,61,73,88,151],"ratios.":[30],"To":[31],"address":[32],"this":[33],"challenge,":[34],"we":[35,79,95],"propose":[36],"the":[37,57,91,107,114,137,154],"Mask-based":[38],"Meta":[39],"Learning":[40],"(MML)":[41],"framework,":[42,59],"leveraging":[43],"meta-learning\u2019s":[44],"multi-task":[45],"generalization":[46,134],"capability":[47],"achieve":[49],"robust":[50,139],"performance":[51,135],"of":[52,110,156],"varying":[53],"scenarios.":[55],"Within":[56],"MML":[58],"a":[60,81,97],"mask-based":[62],"task":[63],"formulation":[64],"is":[65],"used":[66],"create":[68],"meta-learning":[69,83],"tasks":[70],"based":[71],"on":[72],"masks":[74,89],"rather":[75],"than":[76],"dataset.":[77],"Second,":[78],"define":[80],"new":[82],"objective":[84],"by":[85],"integrating":[86],"different":[87],"into":[90],"meta":[92],"loss.":[93],"Finally,":[94],"develop":[96],"SAFs-sensitivity":[98],"guided":[99],"weight":[100],"importance":[101],"search":[102],"algorithm":[103],"and":[104,133],"dynamically":[105],"expands":[106],"adjustment":[108],"range":[109],"crucial":[111],"weights":[112],"using":[113],"array\u2019s":[116],"redundant":[117],"cells":[118],"further":[120],"enhance":[121],"model":[122],"performance.":[123],"Experimental":[124],"results":[125],"show":[126],"that":[127],"our":[128,143],"method":[129,144],"demonstrates":[130],"superior":[131],"robustness":[132],"over":[136],"state-of-the-art":[138],"training":[140],"approaches.":[141],"Moreover,":[142],"can":[145],"maintain":[146],"high":[147],"various":[150],"ratios":[152],"while":[153],"other":[157],"illustrates":[159],"large":[160],"fluctuations.":[161]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2026-03-12T00:00:00"}