{"id":"https://openalex.org/W4393146437","doi":"https://doi.org/10.1109/asp-dac58780.2024.10473922","title":"HybMT: Hybrid Meta-Predictor based ML Algorithm for Fast Test Vector Generation","display_name":"HybMT: Hybrid Meta-Predictor based ML Algorithm for Fast Test Vector Generation","publication_year":2024,"publication_date":"2024-01-22","ids":{"openalex":"https://openalex.org/W4393146437","doi":"https://doi.org/10.1109/asp-dac58780.2024.10473922"},"language":"en","primary_location":{"id":"doi:10.1109/asp-dac58780.2024.10473922","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asp-dac58780.2024.10473922","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007815410","display_name":"Shruti Pandey","orcid":"https://orcid.org/0000-0002-5269-1582"},"institutions":[{"id":"https://openalex.org/I68891433","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06","country_code":"IN","type":"education","lineage":["https://openalex.org/I68891433"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Shruti Pandey","raw_affiliation_strings":["Electrical Engineering Indian Institute of Technology, Delhi,New Delhi,India"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Indian Institute of Technology, Delhi,New Delhi,India","institution_ids":["https://openalex.org/I68891433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002842122","display_name":"Jayadeva","orcid":null},"institutions":[{"id":"https://openalex.org/I68891433","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06","country_code":"IN","type":"education","lineage":["https://openalex.org/I68891433"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Jayadeva","raw_affiliation_strings":["Electrical Engineering Indian Institute of Technology, Delhi,New Delhi,India"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Indian Institute of Technology, Delhi,New Delhi,India","institution_ids":["https://openalex.org/I68891433"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007225479","display_name":"Smruti R. Sarangi","orcid":"https://orcid.org/0000-0002-1657-8523"},"institutions":[{"id":"https://openalex.org/I68891433","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06","country_code":"IN","type":"education","lineage":["https://openalex.org/I68891433"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Smruti R. Sarangi","raw_affiliation_strings":["Electrical Engineering Indian Institute of Technology, Delhi,New Delhi,India"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Indian Institute of Technology, Delhi,New Delhi,India","institution_ids":["https://openalex.org/I68891433"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5007815410"],"corresponding_institution_ids":["https://openalex.org/I68891433"],"apc_list":null,"apc_paid":null,"fwci":0.8118,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.73740358,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"497","last_page":"502"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14025","display_name":"Educational Technology and Assessment","score":0.9682000279426575,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14025","display_name":"Educational Technology and Assessment","score":0.9682000279426575,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9435999989509583,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5955306887626648},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5679948925971985},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5216629505157471}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5955306887626648},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5679948925971985},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5216629505157471},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asp-dac58780.2024.10473922","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asp-dac58780.2024.10473922","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W2149107969","https://openalex.org/W2194775991","https://openalex.org/W2242458479","https://openalex.org/W2896457183","https://openalex.org/W3121121478","https://openalex.org/W3122610987","https://openalex.org/W3124695806","https://openalex.org/W3158327736","https://openalex.org/W3169517138","https://openalex.org/W3171087525","https://openalex.org/W3172942293","https://openalex.org/W3176008069","https://openalex.org/W3182943170","https://openalex.org/W6755207826","https://openalex.org/W6796931752","https://openalex.org/W6958870032"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2051487156","https://openalex.org/W2073681303","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2478288626","https://openalex.org/W4391913857"],"abstract_inverted_index":{"ML":[0],"models":[1],"are":[2],"increasingly":[3],"being":[4],"used":[5],"to":[6,94,97,138],"increase":[7],"the":[8,13,68,84,100,112,120,130,153,159,163,175,188],"test":[9],"coverage":[10,161,186],"and":[11,25,44,129],"decrease":[12],"overall":[14,148],"testing":[15],"time.":[16],"This":[17],"field":[18],"is":[19,102,124,132],"still":[20],"in":[21,40,55,152],"its":[22],"nascent":[23],"stage":[24],"up":[26],"till":[27],"now":[28],"there":[29],"were":[30],"no":[31],"algorithms":[32],"that":[33,58,72,82,99],"could":[34],"match":[35],"or":[36,107,183],"outperform":[37],"commercial":[38,142],"tools":[39],"terms":[41],"of":[42,87,150,172],"speed":[43],"accuracy":[45],"for":[46,162,187],"large":[47],"circuits.":[48,166,191],"We":[49,76],"propose":[50],"an":[51,133,147,181],"ATPG":[52,143],"algorithm":[53,71,178],"HybMT":[54,145,167],"this":[56,61],"paper":[57],"finally":[59],"breaks":[60],"barrier":[62],"Like":[63],"sister":[64],"methods,":[65],"we":[66],"augment":[67],"classical":[69],"PODEM":[70],"uses":[73],"recursive":[74],"backtracking.":[75],"design":[77],"a":[78,88,103,125,139,170],"custom":[79],"2-level":[80],"predictor":[81,110],"predicts":[83],"input":[85],"net":[86],"logic":[89],"gate":[90],"whose":[91],"value":[92,105],"needs":[93],"be":[95],"set":[96],"ensure":[98],"output":[101,113],"given":[104],"(0":[106],"1).":[108],"Our":[109],"chooses":[111],"from":[114],"among":[115],"two":[116],"first-level":[117],"predictors,":[118],"where":[119],"most":[121],"effective":[122],"one":[123],"bespoke":[126],"neural":[127],"network":[128],"other":[131],"SVM":[134],"regressor.":[135],"As":[136],"compared":[137],"popular,":[140],"state-of-the-art":[141],"tool,":[144],"shows":[146,169],"reduction":[149],"56.6%":[151],"CPU":[154],"time":[155],"without":[156],"compromising":[157],"on":[158],"fault":[160,185],"EPFL":[164,189],"benchmark":[165,190],"also":[168],"speedup":[171],"126.4%":[173],"over":[174],"best":[176],"ML-based":[177],"while":[179],"obtaining":[180],"equal":[182],"better":[184]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}