{"id":"https://openalex.org/W4212839743","doi":"https://doi.org/10.1109/asp-dac52403.2022.9712573","title":"Accelerate SAT-based ATPG via Preprocessing and New Conflict Management Heuristics","display_name":"Accelerate SAT-based ATPG via Preprocessing and New Conflict Management Heuristics","publication_year":2022,"publication_date":"2022-01-17","ids":{"openalex":"https://openalex.org/W4212839743","doi":"https://doi.org/10.1109/asp-dac52403.2022.9712573"},"language":"en","primary_location":{"id":"doi:10.1109/asp-dac52403.2022.9712573","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asp-dac52403.2022.9712573","pdf_url":null,"source":{"id":"https://openalex.org/S4363608500","display_name":"2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101758751","display_name":"Junhua Huang","orcid":"https://orcid.org/0000-0002-0092-396X"},"institutions":[{"id":"https://openalex.org/I191208505","display_name":"Xiamen University","ror":"https://ror.org/00mcjh785","country_code":"CN","type":"education","lineage":["https://openalex.org/I191208505"]},{"id":"https://openalex.org/I4210159102","display_name":"Huawei Technologies (Sweden)","ror":"https://ror.org/0500fyd17","country_code":"SE","type":"company","lineage":["https://openalex.org/I2250955327","https://openalex.org/I4210159102"]}],"countries":["CN","SE"],"is_corresponding":false,"raw_author_name":"Junhua Huang","raw_affiliation_strings":["Xiamen University","Noah's Ark Lab, Huawei"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xiamen University","institution_ids":["https://openalex.org/I191208505"]},{"raw_affiliation_string":"Noah's Ark Lab, Huawei","institution_ids":["https://openalex.org/I4210159102"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031170152","display_name":"Hui\u2010Ling Zhen","orcid":"https://orcid.org/0000-0003-0310-3825"},"institutions":[{"id":"https://openalex.org/I4210159102","display_name":"Huawei Technologies (Sweden)","ror":"https://ror.org/0500fyd17","country_code":"SE","type":"company","lineage":["https://openalex.org/I2250955327","https://openalex.org/I4210159102"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Hui-Ling Zhen","raw_affiliation_strings":["Noah's Ark Lab,Huawei"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Noah's Ark Lab,Huawei","institution_ids":["https://openalex.org/I4210159102"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039148137","display_name":"Nai\u2010Xing Wang","orcid":"https://orcid.org/0000-0001-9520-3254"},"institutions":[{"id":"https://openalex.org/I2250955327","display_name":"Huawei Technologies (China)","ror":"https://ror.org/00cmhce21","country_code":"CN","type":"company","lineage":["https://openalex.org/I2250955327"]},{"id":"https://openalex.org/I4210100005","display_name":"Silicon Technologies (United States)","ror":"https://ror.org/013qwzt07","country_code":"US","type":"company","lineage":["https://openalex.org/I4210100005"]},{"id":"https://openalex.org/I4210146936","display_name":"Huawei Technologies (United States)","ror":"https://ror.org/03jyqk712","country_code":"US","type":"company","lineage":["https://openalex.org/I2250955327","https://openalex.org/I4210146936"]}],"countries":["CN","US"],"is_corresponding":false,"raw_author_name":"Naixing Wang","raw_affiliation_strings":["Hisilicon,Huawei","Hisilicon, Huawei"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hisilicon,Huawei","institution_ids":["https://openalex.org/I2250955327","https://openalex.org/I4210100005","https://openalex.org/I4210146936"]},{"raw_affiliation_string":"Hisilicon, Huawei","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109233250","display_name":"Mingxuan Yuan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210159102","display_name":"Huawei Technologies (Sweden)","ror":"https://ror.org/0500fyd17","country_code":"SE","type":"company","lineage":["https://openalex.org/I2250955327","https://openalex.org/I4210159102"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Mingxuan Yuan","raw_affiliation_strings":["Noah's Ark Lab,Huawei"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Noah's Ark Lab,Huawei","institution_ids":["https://openalex.org/I4210159102"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068714594","display_name":"Hui Mao","orcid":"https://orcid.org/0000-0002-0147-6022"},"institutions":[{"id":"https://openalex.org/I4210159102","display_name":"Huawei Technologies (Sweden)","ror":"https://ror.org/0500fyd17","country_code":"SE","type":"company","lineage":["https://openalex.org/I2250955327","https://openalex.org/I4210159102"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Hui Mao","raw_affiliation_strings":["Noah's Ark Lab,Huawei"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Noah's Ark Lab,Huawei","institution_ids":["https://openalex.org/I4210159102"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101775144","display_name":"Yu Huang","orcid":"https://orcid.org/0000-0003-2619-4686"},"institutions":[{"id":"https://openalex.org/I2250955327","display_name":"Huawei Technologies (China)","ror":"https://ror.org/00cmhce21","country_code":"CN","type":"company","lineage":["https://openalex.org/I2250955327"]},{"id":"https://openalex.org/I4210100005","display_name":"Silicon Technologies (United States)","ror":"https://ror.org/013qwzt07","country_code":"US","type":"company","lineage":["https://openalex.org/I4210100005"]},{"id":"https://openalex.org/I4210146936","display_name":"Huawei Technologies (United States)","ror":"https://ror.org/03jyqk712","country_code":"US","type":"company","lineage":["https://openalex.org/I2250955327","https://openalex.org/I4210146936"]}],"countries":["CN","US"],"is_corresponding":false,"raw_author_name":"Yu Huang","raw_affiliation_strings":["Hisilicon,Huawei","Hisilicon, Huawei"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hisilicon,Huawei","institution_ids":["https://openalex.org/I2250955327","https://openalex.org/I4210100005","https://openalex.org/I4210146936"]},{"raw_affiliation_string":"Hisilicon, Huawei","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083291399","display_name":"Jiping Tao","orcid":"https://orcid.org/0000-0002-4183-5130"},"institutions":[{"id":"https://openalex.org/I191208505","display_name":"Xiamen University","ror":"https://ror.org/00mcjh785","country_code":"CN","type":"education","lineage":["https://openalex.org/I191208505"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiping Tao","raw_affiliation_strings":["Xiamen University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xiamen University","institution_ids":["https://openalex.org/I191208505"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"365","last_page":"370"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.8881584405899048},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.746655285358429},{"id":"https://openalex.org/keywords/heuristics","display_name":"Heuristics","score":0.7157071828842163},{"id":"https://openalex.org/keywords/boolean-satisfiability-problem","display_name":"Boolean satisfiability problem","score":0.6217207908630371},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6001206040382385},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.47408902645111084},{"id":"https://openalex.org/keywords/satisfiability","display_name":"Satisfiability","score":0.4545939266681671},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4528749883174896},{"id":"https://openalex.org/keywords/transformation","display_name":"Transformation (genetics)","score":0.43731772899627686},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.42924875020980835},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.4288696050643921},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.42775967717170715},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.40908777713775635},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.20268768072128296},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.1242724061012268},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10474377870559692},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10196080803871155}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.8881584405899048},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.746655285358429},{"id":"https://openalex.org/C127705205","wikidata":"https://www.wikidata.org/wiki/Q5748245","display_name":"Heuristics","level":2,"score":0.7157071828842163},{"id":"https://openalex.org/C6943359","wikidata":"https://www.wikidata.org/wiki/Q875276","display_name":"Boolean satisfiability problem","level":2,"score":0.6217207908630371},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6001206040382385},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.47408902645111084},{"id":"https://openalex.org/C168773769","wikidata":"https://www.wikidata.org/wiki/Q1350299","display_name":"Satisfiability","level":2,"score":0.4545939266681671},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4528749883174896},{"id":"https://openalex.org/C204241405","wikidata":"https://www.wikidata.org/wiki/Q461499","display_name":"Transformation (genetics)","level":3,"score":0.43731772899627686},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.42924875020980835},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.4288696050643921},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.42775967717170715},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.40908777713775635},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.20268768072128296},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.1242724061012268},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10474377870559692},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10196080803871155},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asp-dac52403.2022.9712573","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asp-dac52403.2022.9712573","pdf_url":null,"source":{"id":"https://openalex.org/S4363608500","display_name":"2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W249930514","https://openalex.org/W1496529478","https://openalex.org/W1840416799","https://openalex.org/W1958909498","https://openalex.org/W1968292327","https://openalex.org/W2019500818","https://openalex.org/W2111994103","https://openalex.org/W2115632957","https://openalex.org/W2119241964","https://openalex.org/W2127167802","https://openalex.org/W2133654799","https://openalex.org/W2149107969","https://openalex.org/W2152321821","https://openalex.org/W2156837195","https://openalex.org/W2165929878","https://openalex.org/W2563331787","https://openalex.org/W2609538613","https://openalex.org/W2913503789","https://openalex.org/W2980614276","https://openalex.org/W3000087619","https://openalex.org/W4213132743","https://openalex.org/W4249360401","https://openalex.org/W4256313551","https://openalex.org/W6638781664","https://openalex.org/W6678054916","https://openalex.org/W6682987458"],"related_works":["https://openalex.org/W2117563988","https://openalex.org/W2120257283","https://openalex.org/W2132684947","https://openalex.org/W1412895167","https://openalex.org/W2019500818","https://openalex.org/W2165817266","https://openalex.org/W2360180534","https://openalex.org/W2127167802","https://openalex.org/W2109674123","https://openalex.org/W1493811107"],"abstract_inverted_index":{"Due":[0],"to":[1,21,39,44,64,73,79,124,153,175],"the":[2,23,53,87,98,106,126,145,167,182,207,214],"continuous":[3],"advancement":[4],"of":[5,69,89,108,213],"semicon-ductor":[6],"technologies,":[7],"there":[8],"are":[9],"more":[10,177],"defects":[11],"than":[12],"ever":[13],"widely":[14],"distributed":[15],"in":[16,97,156,161],"manufactured":[17],"chips.":[18],"In":[19,114],"order":[20],"meet":[22],"high":[24],"product":[25],"quality":[26],"and":[27,148,159,189],"low":[28],"defective-parts-per-million":[29],"(DPPM)":[30],"goals,":[31],"Boolean":[32],"Satisfiability":[33],"(SAT)":[34],"technique":[35],"has":[36],"been":[37],"shown":[38],"be":[40],"a":[41,75,80,119,139,190,218,223],"robust":[42],"alternative":[43],"conventional":[45],"APTG":[46],"techniques,":[47],"especially":[48],"for":[49,142,185,193],"hard-to-detect":[50],"faults.":[51],"However,":[52],"SAT-based":[54,121],"ATPG":[55,122,220],"still":[56],"confronts":[57],"two":[58,127],"challenges.":[59],"The":[60,93],"first":[61],"one":[62,95],"is":[63,86,103],"reduce":[65,133],"extra":[66],"computational":[67],"overhead":[68],"SAT":[70,91,99],"modeling,":[71],"i.e.":[72],"transform":[74],"circuit":[76],"testing":[77],"problem":[78],"Conjunctive":[81],"Normal":[82],"Form":[83],"(CNF)":[84],"which":[85,102],"foundation":[88],"modern":[90],"solvers.":[92],"second":[94],"lies":[96],"solver's":[100],"efficiency":[101],"brought":[104],"by":[105,217],"loss":[107],"structural":[109],"information":[110],"during":[111],"CNF":[112,134,157],"transformation.":[113],"this":[115],"work,":[116],"we":[117,137],"propose":[118,171],"new":[120,172],"approach":[123,209],"address":[125],"challenges":[128],"mentioned":[129],"above:":[130],"(1)":[131],"To":[132,164],"transformation":[135,158],"overhead,":[136],"utilize":[138],"simulation-driven":[140],"pre-processing":[141],"narrowing":[143],"down":[144],"fault":[146],"propagation":[147],"activation":[149],"logic":[150],"cones,":[151],"leading":[152],"an":[154],"improvement":[155],"reduction":[160],"runtime.":[162,225],"(2)":[163],"further":[165],"improve":[166],"solving":[168,184],"efficiency,":[169],"We":[170],"ranking-based":[173],"heuristics":[174],"build":[176],"effective":[178],"conflict":[179],"database,":[180],"enabling":[181],"direct":[183],"small":[186],"scale":[187,195],"instance":[188],"looking-head":[191],"method":[192],"large":[194],"ones.":[196],"Extensive":[197],"experimental":[198],"results":[199],"on":[200,205],"industrial":[201],"circuits":[202],"demonstrate":[203],"that":[204],"average":[206],"proposed":[208],"could":[210],"cover":[211],"89.67%":[212],"faults":[215],"failed":[216],"commercial":[219],"tool":[221],"with":[222],"comparable":[224]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":3}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}