{"id":"https://openalex.org/W4212967088","doi":"https://doi.org/10.1109/asp-dac52403.2022.9712516","title":"Voronoi Diagram Based Heterogeneous Circuit Layout Centerline Extraction for Mask Verification","display_name":"Voronoi Diagram Based Heterogeneous Circuit Layout Centerline Extraction for Mask Verification","publication_year":2022,"publication_date":"2022-01-17","ids":{"openalex":"https://openalex.org/W4212967088","doi":"https://doi.org/10.1109/asp-dac52403.2022.9712516"},"language":"en","primary_location":{"id":"doi:10.1109/asp-dac52403.2022.9712516","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asp-dac52403.2022.9712516","pdf_url":null,"source":{"id":"https://openalex.org/S4363608500","display_name":"2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101183675","display_name":"Xiqiong Bai","orcid":null},"institutions":[{"id":"https://openalex.org/I80947539","display_name":"Fuzhou University","ror":"https://ror.org/011xvna82","country_code":"CN","type":"education","lineage":["https://openalex.org/I80947539"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiqiong Bai","raw_affiliation_strings":["Center for Discrete Mathematics and Theoretical Computer Science, Fuzhou University,Fuzhou,China,350108"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Discrete Mathematics and Theoretical Computer Science, Fuzhou University,Fuzhou,China,350108","institution_ids":["https://openalex.org/I80947539"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065790763","display_name":"Ziran Zhu","orcid":"https://orcid.org/0000-0002-9475-6364"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ziran Zhu","raw_affiliation_strings":["School of Electronic Science and Engineering, Southeast University,National ASIC System Engineering Center,Nanjing,China,210096"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, Southeast University,National ASIC System Engineering Center,Nanjing,China,210096","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002478857","display_name":"Peng Zou","orcid":"https://orcid.org/0000-0002-8345-0976"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Zou","raw_affiliation_strings":["Fudan University,State Key Lab of ASIC & System,Shanghai,China,200433"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Lab of ASIC & System,Shanghai,China,200433","institution_ids":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101854580","display_name":"Jianli Chen","orcid":"https://orcid.org/0000-0002-1391-2696"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianli Chen","raw_affiliation_strings":["Fudan University,State Key Lab of ASIC & System,Shanghai,China,200433"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Lab of ASIC & System,Shanghai,China,200433","institution_ids":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103098516","display_name":"Jun Yu","orcid":"https://orcid.org/0000-0003-4286-9292"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Yu","raw_affiliation_strings":["Fudan University,State Key Lab of ASIC & System,Shanghai,China,200433"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Lab of ASIC & System,Shanghai,China,200433","institution_ids":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018371636","display_name":"Yao\u2010Wen Chang","orcid":"https://orcid.org/0000-0002-0564-5719"},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yao-Wen Chang","raw_affiliation_strings":["Graduate Institute of Electronics Engineering, National Taiwan University,Taipei,Taiwan,10617","Department of Electrical Engineering, National Taiwan University, Taipei, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate Institute of Electronics Engineering, National Taiwan University,Taipei,Taiwan,10617","institution_ids":["https://openalex.org/I16733864"]},{"raw_affiliation_string":"Department of Electrical Engineering, National Taiwan University, Taipei, Taiwan","institution_ids":["https://openalex.org/I16733864"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"172","last_page":"177"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voronoi-diagram","display_name":"Voronoi diagram","score":0.7374808192253113},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6746193170547485},{"id":"https://openalex.org/keywords/integrated-circuit-layout","display_name":"Integrated circuit layout","score":0.49170881509780884},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.47611790895462036},{"id":"https://openalex.org/keywords/graph","display_name":"Graph","score":0.4654233157634735},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.43374723196029663},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3236232399940491},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.27979177236557007},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.2530592679977417},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.2215670645236969},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15898314118385315},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.10645094513893127}],"concepts":[{"id":"https://openalex.org/C24881265","wikidata":"https://www.wikidata.org/wiki/Q757267","display_name":"Voronoi diagram","level":2,"score":0.7374808192253113},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6746193170547485},{"id":"https://openalex.org/C2765594","wikidata":"https://www.wikidata.org/wiki/Q2624187","display_name":"Integrated circuit layout","level":3,"score":0.49170881509780884},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.47611790895462036},{"id":"https://openalex.org/C132525143","wikidata":"https://www.wikidata.org/wiki/Q141488","display_name":"Graph","level":2,"score":0.4654233157634735},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.43374723196029663},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3236232399940491},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.27979177236557007},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.2530592679977417},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.2215670645236969},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15898314118385315},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.10645094513893127},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asp-dac52403.2022.9712516","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asp-dac52403.2022.9712516","pdf_url":null,"source":{"id":"https://openalex.org/S4363608500","display_name":"2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G506419027","display_name":null,"funder_award_id":"61977017","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5833310483","display_name":null,"funder_award_id":"2242021k30031","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1989933050","https://openalex.org/W2070164574","https://openalex.org/W2111216261","https://openalex.org/W2114105164","https://openalex.org/W2125444180","https://openalex.org/W2161126829","https://openalex.org/W2234721259","https://openalex.org/W2326172112","https://openalex.org/W2760358816","https://openalex.org/W2984749222"],"related_works":["https://openalex.org/W3020555194","https://openalex.org/W2793256277","https://openalex.org/W4360958759","https://openalex.org/W2348235448","https://openalex.org/W2116218375","https://openalex.org/W2389906634","https://openalex.org/W176898926","https://openalex.org/W3097018712","https://openalex.org/W2997143235","https://openalex.org/W3204804334"],"abstract_inverted_index":{"Modern":[0],"circuit":[1,33],"layout":[2,17,38],"centerline":[3,39,60,66,75,81,90,132],"extraction":[4,40,103,133],"is":[5,69,84],"an":[6],"essential":[7],"step":[8],"in":[9,19,110],"estimating":[10],"the":[11,16,23,29,97,107,111,124],"parasitic":[12,101],"inductance":[13],"and":[14,28,106],"verifying":[15],"performance":[18],"mask":[20],"verification.":[21],"As":[22],"continued":[24],"feature":[25],"size":[26],"shrinking":[27],"complexity":[30],"of":[31,129],"modern":[32],"design":[34,137],"keeps":[35],"growing,":[36],"heterogeneous":[37],"has":[41],"become":[42],"even":[43],"more":[44],"challenging.":[45],"In":[46],"this":[47],"paper,":[48],"we":[49],"first":[50],"formulate":[51],"a":[52,63,79],"Voronoi":[53],"diagram-based":[54],"problem":[55],"transformation":[56],"to":[57,71,86],"collect":[58],"all":[59,73,136],"points.":[61],"Then,":[62],"graph-based":[64],"initial":[65],"generation":[67],"algorithm":[68,122],"presented":[70],"handle":[72],"invalid":[74],"points":[76],"effectively.":[77],"Finally,":[78],"heterogeneity-aware":[80],"optimization":[82],"method":[83],"proposed":[85],"generate":[87],"optimized":[88],"design-violation-free":[89],"results":[91,118],"for":[92],"irregular":[93],"structures.":[94],"Compared":[95],"with":[96],"state-of-the-art":[98],"commercial":[99],"3D-RC":[100],"parameter":[102],"tool":[104],"RCExplorer":[105],"1st":[108],"place":[109],"2019":[112],"EDA":[113],"Elite":[114],"Challenge":[115],"Contest,":[116],"experimental":[117],"show":[119],"that":[120],"our":[121],"achieves":[123],"best":[125],"average":[126],"precision":[127],"ratio":[128],"99.7%":[130],"on":[131],"while":[134],"satisfying":[135],"constraints.":[138]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}