{"id":"https://openalex.org/W4391183555","doi":"https://doi.org/10.1109/asicon58565.2023.10396359","title":"Design of PUF Circuit Based on Charge Leakage of Cascade Dynamic Gate","display_name":"Design of PUF Circuit Based on Charge Leakage of Cascade Dynamic Gate","publication_year":2023,"publication_date":"2023-10-24","ids":{"openalex":"https://openalex.org/W4391183555","doi":"https://doi.org/10.1109/asicon58565.2023.10396359"},"language":"en","primary_location":{"id":"doi:10.1109/asicon58565.2023.10396359","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/asicon58565.2023.10396359","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 15th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039707001","display_name":"Xudong Wu","orcid":"https://orcid.org/0000-0002-0752-0282"},"institutions":[{"id":"https://openalex.org/I146620803","display_name":"Wenzhou University","ror":"https://ror.org/020hxh324","country_code":"CN","type":"education","lineage":["https://openalex.org/I146620803"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xudong Wu","raw_affiliation_strings":["Wenzhou University,College of Electrical and Electronic Engineering,Wenzhou,China","College of Electrical and Electronic Engineering, Wenzhou University, Wenzhou, China"],"affiliations":[{"raw_affiliation_string":"Wenzhou University,College of Electrical and Electronic Engineering,Wenzhou,China","institution_ids":["https://openalex.org/I146620803"]},{"raw_affiliation_string":"College of Electrical and Electronic Engineering, Wenzhou University, Wenzhou, China","institution_ids":["https://openalex.org/I146620803"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100438648","display_name":"Gang Li","orcid":"https://orcid.org/0000-0001-9133-8282"},"institutions":[{"id":"https://openalex.org/I146620803","display_name":"Wenzhou University","ror":"https://ror.org/020hxh324","country_code":"CN","type":"education","lineage":["https://openalex.org/I146620803"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gang Li","raw_affiliation_strings":["Wenzhou University,College of Electrical and Electronic Engineering,Wenzhou,China","College of Electrical and Electronic Engineering, Wenzhou University, Wenzhou, China"],"affiliations":[{"raw_affiliation_string":"Wenzhou University,College of Electrical and Electronic Engineering,Wenzhou,China","institution_ids":["https://openalex.org/I146620803"]},{"raw_affiliation_string":"College of Electrical and Electronic Engineering, Wenzhou University, Wenzhou, China","institution_ids":["https://openalex.org/I146620803"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5106892182","display_name":"Pengjun Wang","orcid":"https://orcid.org/0000-0002-1461-3719"},"institutions":[{"id":"https://openalex.org/I146620803","display_name":"Wenzhou University","ror":"https://ror.org/020hxh324","country_code":"CN","type":"education","lineage":["https://openalex.org/I146620803"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pengjun Wang","raw_affiliation_strings":["Wenzhou University,College of Electrical and Electronic Engineering,Wenzhou,China","College of Electrical and Electronic Engineering, Wenzhou University, Wenzhou, China"],"affiliations":[{"raw_affiliation_string":"Wenzhou University,College of Electrical and Electronic Engineering,Wenzhou,China","institution_ids":["https://openalex.org/I146620803"]},{"raw_affiliation_string":"College of Electrical and Electronic Engineering, Wenzhou University, Wenzhou, China","institution_ids":["https://openalex.org/I146620803"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5039707001"],"corresponding_institution_ids":["https://openalex.org/I146620803"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.20901382,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cascade","display_name":"Cascade","score":0.7733175158500671},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.7496691346168518},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5309801697731018},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.5204018354415894},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.46751338243484497},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4328393340110779},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.40438202023506165},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35649460554122925},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2595922350883484}],"concepts":[{"id":"https://openalex.org/C34146451","wikidata":"https://www.wikidata.org/wiki/Q5048094","display_name":"Cascade","level":2,"score":0.7733175158500671},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.7496691346168518},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5309801697731018},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.5204018354415894},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.46751338243484497},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4328393340110779},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40438202023506165},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35649460554122925},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2595922350883484},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon58565.2023.10396359","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/asicon58565.2023.10396359","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 15th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8199999928474426}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321543","display_name":"China Postdoctoral Science Foundation","ror":"https://ror.org/0426zh255"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1574944801","https://openalex.org/W2169212403","https://openalex.org/W2792313743","https://openalex.org/W3033257916","https://openalex.org/W3082443080","https://openalex.org/W3183496847","https://openalex.org/W4206566515","https://openalex.org/W4286656226","https://openalex.org/W4288391417","https://openalex.org/W4308843239","https://openalex.org/W4312264836","https://openalex.org/W4361987546"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2153719181","https://openalex.org/W1971748923","https://openalex.org/W2060986072","https://openalex.org/W1566155057","https://openalex.org/W2052574922","https://openalex.org/W2065045110","https://openalex.org/W64588465","https://openalex.org/W3120641340","https://openalex.org/W2117825986"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposed":[2,84,123],"a":[3,80],"novel":[4],"physical":[5],"unclonable":[6],"function":[7],"(PUF)":[8],"circuit":[9,106,125],"based":[10,65],"on":[11,21,32,66],"dynamic":[12,22,36,49,59],"logic.":[13],"In":[14],"this":[15],"scheme,":[16],"two":[17,74],"cascade":[18,38],"inverter":[19],"base":[20],"logic":[23],"are":[24],"used":[25,70],"for":[26],"generating":[27],"entropy":[28,75],"source":[29,76],"voltage.":[30],"Based":[31],"the":[33,41,44,48,53,57,73,92,104,122,132,138],"principle":[34],"of":[35,43,47,56,103,140],"gate":[37,50],"charge":[39],"leakage,":[40],"performance":[42,102],"middle":[45],"node":[46],"will":[51],"affect":[52],"output":[54,81],"voltage":[55,62],"rear":[58],"gate.":[60],"A":[61],"sensitive":[63],"amplifier":[64],"cross-coupling":[67],"structure":[68],"is":[69,97],"to":[71,134],"compare":[72],"voltages":[77],"and":[78,91,129,143],"generate":[79],"response.":[82],"The":[83,101,117],"PUF":[85,93,105,124],"design":[86],"in":[87,137],"TSMC":[88],"65-nm":[89],"process,":[90],"cell\u2019s":[94],"layout":[95],"area":[96],"1.5":[98],"\u03bcm\u00d72.3":[99],"\u03bcm.":[100],"was":[107],"analyzed":[108],"through":[109],"Monte":[110],"Carlo":[111],"simulation":[112],"under":[113],"different":[114],"operating":[115],"conditions.":[116],"experimental":[118],"results":[119],"show":[120],"that":[121],"has":[126,131],"excellent":[127],"randomness(50.03%)":[128],"stability(8.2%),":[130],"potential":[133],"be":[135],"applied":[136],"field":[139],"key":[141],"generation":[142],"device":[144],"authentication.":[145]},"counts_by_year":[],"updated_date":"2025-12-22T23:10:17.713674","created_date":"2025-10-10T00:00:00"}