{"id":"https://openalex.org/W4391183549","doi":"https://doi.org/10.1109/asicon58565.2023.10396353","title":"Ultra-low-power and High-accuracy CMOS Temperature Sensor","display_name":"Ultra-low-power and High-accuracy CMOS Temperature Sensor","publication_year":2023,"publication_date":"2023-10-24","ids":{"openalex":"https://openalex.org/W4391183549","doi":"https://doi.org/10.1109/asicon58565.2023.10396353"},"language":"en","primary_location":{"id":"doi:10.1109/asicon58565.2023.10396353","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon58565.2023.10396353","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 15th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100406565","display_name":"Jing Li","orcid":"https://orcid.org/0000-0002-7880-1452"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jing Li","raw_affiliation_strings":["University of Electronic Science and Technology of China,StateKey Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610054"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China,StateKey Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610054","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101147388","display_name":"Luhan Yang","orcid":"https://orcid.org/0009-0004-4473-8223"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Luhan Yang","raw_affiliation_strings":["University of Electronic Science and Technology of China,StateKey Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610054"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China,StateKey Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610054","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084380346","display_name":"Dongjian Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dongjian Chen","raw_affiliation_strings":["University of Electronic Science and Technology of China,StateKey Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610054"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China,StateKey Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610054","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100350975","display_name":"Zhong Zhang","orcid":"https://orcid.org/0000-0003-2611-9424"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhong Zhang","raw_affiliation_strings":["University of Electronic Science and Technology of China,StateKey Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610054"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China,StateKey Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610054","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101622962","display_name":"Qihui Zhang","orcid":"https://orcid.org/0000-0001-7015-2059"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qihui Zhang","raw_affiliation_strings":["University of Electronic Science and Technology of China,StateKey Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610054"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China,StateKey Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610054","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100749757","display_name":"Ning Ning","orcid":"https://orcid.org/0000-0001-7893-1428"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ning Ning","raw_affiliation_strings":["University of Electronic Science and Technology of China,StateKey Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610054"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China,StateKey Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610054","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100377679","display_name":"Qi Yu","orcid":"https://orcid.org/0000-0002-0490-0749"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Yu","raw_affiliation_strings":["University of Electronic Science and Technology of China,StateKey Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610054"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China,StateKey Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610054","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5100406565"],"corresponding_institution_ids":["https://openalex.org/I150229711","https://openalex.org/I4210124847"],"apc_list":null,"apc_paid":null,"fwci":0.3371,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.55262382,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/thermistor","display_name":"Thermistor","score":0.8880826234817505},{"id":"https://openalex.org/keywords/relaxation-oscillator","display_name":"Relaxation oscillator","score":0.7918744087219238},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6854093074798584},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.57975172996521},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5681794881820679},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5598026514053345},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5219606757164001},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5005159378051758},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.44510388374328613},{"id":"https://openalex.org/keywords/atmospheric-temperature-range","display_name":"Atmospheric temperature range","score":0.44317370653152466},{"id":"https://openalex.org/keywords/clock-rate","display_name":"Clock rate","score":0.4395091235637665},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3966858386993408},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39031288027763367},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30247318744659424},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2187262773513794}],"concepts":[{"id":"https://openalex.org/C66726788","wikidata":"https://www.wikidata.org/wiki/Q175973","display_name":"Thermistor","level":2,"score":0.8880826234817505},{"id":"https://openalex.org/C135854075","wikidata":"https://www.wikidata.org/wiki/Q1421688","display_name":"Relaxation oscillator","level":4,"score":0.7918744087219238},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6854093074798584},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.57975172996521},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5681794881820679},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5598026514053345},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5219606757164001},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5005159378051758},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.44510388374328613},{"id":"https://openalex.org/C39353612","wikidata":"https://www.wikidata.org/wiki/Q5283759","display_name":"Atmospheric temperature range","level":2,"score":0.44317370653152466},{"id":"https://openalex.org/C178693496","wikidata":"https://www.wikidata.org/wiki/Q911691","display_name":"Clock rate","level":3,"score":0.4395091235637665},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3966858386993408},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39031288027763367},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30247318744659424},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2187262773513794},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C5291336","wikidata":"https://www.wikidata.org/wiki/Q852341","display_name":"Voltage-controlled oscillator","level":3,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon58565.2023.10396353","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon58565.2023.10396353","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 15th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8700000047683716}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2055944305","https://openalex.org/W2518173922","https://openalex.org/W2648793147","https://openalex.org/W2990976435","https://openalex.org/W3111895964","https://openalex.org/W4226024493","https://openalex.org/W4377717241"],"related_works":["https://openalex.org/W2972852035","https://openalex.org/W1512975660","https://openalex.org/W2097335846","https://openalex.org/W2371106326","https://openalex.org/W1975928313","https://openalex.org/W4400808657","https://openalex.org/W2313474253","https://openalex.org/W2349999032","https://openalex.org/W2184704922","https://openalex.org/W2054609799"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"an":[3,74],"integrated":[4],"CMOS":[5],"temperature":[6,29,38],"sensor":[7,64],"based":[8],"on":[9],"resistance":[10,56],"sensing,":[11],"taking":[12],"a":[13,27,67],"frequency-to-digital":[14],"readout,":[15],"which":[16],"makes":[17],"the":[18,52,55,63,70,78,86,91,96],"overall":[19],"structure":[20],"simple":[21],"while":[22],"enabling":[23],"high":[24],"accuracy":[25],"in":[26],"wide":[28],"range":[30],"of":[31,54,85,98],"-40":[32],"\u00b0C":[33],"to":[34,46,59,72],"125":[35],"\u00b0C.":[36],"The":[37,81],"sensing":[39],"element":[40],"employs":[41],"relaxation":[42],"oscillators":[43],"with":[44,57],"thermistors":[45],"output":[47,84],"temperature-dependent":[48],"frequency":[49,68,92],"signals,":[50],"inheriting":[51],"linearity":[53],"respect":[58],"temperature.":[60],"In":[61],"addition,":[62],"itself":[65],"generates":[66],"without":[69],"need":[71],"input":[73],"external":[75],"clock,":[76],"expanding":[77],"application":[79],"scenarios.":[80],"digital":[82],"code":[83],"readout":[87],"circuit":[88],"stands":[89],"for":[90],"ratio,":[93],"thereby":[94],"mitigating":[95],"effects":[97],"supply":[99],"voltage":[100],"fluctuations.":[101]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}