{"id":"https://openalex.org/W4391183662","doi":"https://doi.org/10.1109/asicon58565.2023.10396319","title":"A Bandgap Voltage Reference with Low Temperature Coefficient and High PSRR Designed for LDO","display_name":"A Bandgap Voltage Reference with Low Temperature Coefficient and High PSRR Designed for LDO","publication_year":2023,"publication_date":"2023-10-24","ids":{"openalex":"https://openalex.org/W4391183662","doi":"https://doi.org/10.1109/asicon58565.2023.10396319"},"language":"en","primary_location":{"id":"doi:10.1109/asicon58565.2023.10396319","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon58565.2023.10396319","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 15th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060450753","display_name":"Yuzi Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yuzi Wang","raw_affiliation_strings":["Shanghai University,School of Microelectronics,Shanghai,China","School of Microelectronics, Shanghai University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Shanghai University,School of Microelectronics,Shanghai,China","institution_ids":["https://openalex.org/I113940042"]},{"raw_affiliation_string":"School of Microelectronics, Shanghai University, Shanghai, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021600686","display_name":"Xichen Duan","orcid":null},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xichen Duan","raw_affiliation_strings":["Shanghai University,School of Microelectronics,Shanghai,China","School of Microelectronics, Shanghai University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Shanghai University,School of Microelectronics,Shanghai,China","institution_ids":["https://openalex.org/I113940042"]},{"raw_affiliation_string":"School of Microelectronics, Shanghai University, Shanghai, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000897156","display_name":"Kai Sun","orcid":"https://orcid.org/0000-0003-3018-7219"},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kai Sun","raw_affiliation_strings":["Shanghai University,School of Microelectronics,Shanghai,China","School of Microelectronics, Shanghai University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Shanghai University,School of Microelectronics,Shanghai,China","institution_ids":["https://openalex.org/I113940042"]},{"raw_affiliation_string":"School of Microelectronics, Shanghai University, Shanghai, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075198432","display_name":"Peng Huang","orcid":"https://orcid.org/0000-0002-1133-0713"},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Huang","raw_affiliation_strings":["Shanghai University,School of Microelectronics,Shanghai,China","School of Microelectronics, Shanghai University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Shanghai University,School of Microelectronics,Shanghai,China","institution_ids":["https://openalex.org/I113940042"]},{"raw_affiliation_string":"School of Microelectronics, Shanghai University, Shanghai, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108142671","display_name":"Liuyang Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210136793","display_name":"Peng Cheng Laboratory","ror":"https://ror.org/03qdqbt06","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210136793"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liuyang Zhang","raw_affiliation_strings":["Peng Cheng Laboratory,Shenzhen,China","Peng Cheng Laboratory, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Peng Cheng Laboratory,Shenzhen,China","institution_ids":["https://openalex.org/I4210136793"]},{"raw_affiliation_string":"Peng Cheng Laboratory, Shenzhen, China","institution_ids":["https://openalex.org/I4210136793"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061718818","display_name":"Jie Liang","orcid":"https://orcid.org/0000-0002-0595-8598"},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Liang","raw_affiliation_strings":["Shanghai University,School of Microelectronics,Shanghai,China","School of Microelectronics, Shanghai University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Shanghai University,School of Microelectronics,Shanghai,China","institution_ids":["https://openalex.org/I113940042"]},{"raw_affiliation_string":"School of Microelectronics, Shanghai University, Shanghai, China","institution_ids":["https://openalex.org/I113940042"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5060450753"],"corresponding_institution_ids":["https://openalex.org/I113940042"],"apc_list":null,"apc_paid":null,"fwci":0.4012,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.64321671,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9745000004768372,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9745000004768372,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9577000141143799,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9046000242233276,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bandgap-voltage-reference","display_name":"Bandgap voltage reference","score":0.8891742825508118},{"id":"https://openalex.org/keywords/power-supply-rejection-ratio","display_name":"Power supply rejection ratio","score":0.8317440748214722},{"id":"https://openalex.org/keywords/temperature-coefficient","display_name":"Temperature coefficient","score":0.7899123430252075},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5746005773544312},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.5246068239212036},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4475715756416321},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4471094608306885},{"id":"https://openalex.org/keywords/band-gap","display_name":"Band gap","score":0.4151563346385956},{"id":"https://openalex.org/keywords/dropout-voltage","display_name":"Dropout voltage","score":0.3179813325405121},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.312008798122406},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.1464994251728058},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14009064435958862},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.09166747331619263}],"concepts":[{"id":"https://openalex.org/C127033052","wikidata":"https://www.wikidata.org/wiki/Q48635","display_name":"Bandgap voltage reference","level":5,"score":0.8891742825508118},{"id":"https://openalex.org/C15892472","wikidata":"https://www.wikidata.org/wiki/Q1482413","display_name":"Power supply rejection ratio","level":4,"score":0.8317440748214722},{"id":"https://openalex.org/C16643434","wikidata":"https://www.wikidata.org/wiki/Q898642","display_name":"Temperature coefficient","level":2,"score":0.7899123430252075},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5746005773544312},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.5246068239212036},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4475715756416321},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4471094608306885},{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.4151563346385956},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.3179813325405121},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.312008798122406},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.1464994251728058},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14009064435958862},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.09166747331619263},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon58565.2023.10396319","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon58565.2023.10396319","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 15th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8899999856948853}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W3004564537","https://openalex.org/W2393887177","https://openalex.org/W2354567683","https://openalex.org/W2544323617","https://openalex.org/W2348464439","https://openalex.org/W2091010831","https://openalex.org/W2384491229","https://openalex.org/W2370976371","https://openalex.org/W1970992322","https://openalex.org/W2359862740"],"abstract_inverted_index":{"This":[0,27,67],"paper":[1,68],"proposes":[2],"a":[3,7,35,48,64,70],"structure":[4,38,45],"for":[5,10],"providing":[6],"reference":[8,29],"voltage":[9,28,81],"low":[11,17],"drop-out":[12],"(LDO)":[13],"regulators":[14],"with":[15,32],"extremely":[16],"temperature":[18,51,86],"coefficient":[19,87],"and":[20,74],"high":[21],"power":[22,79],"supply":[23,80],"rejection":[24],"ratio":[25],"(PSRR).":[26],"is":[30,39,60,82,91,99],"designed":[31],"bandgap":[33,44],"technology,":[34],"high-order":[36],"compensation":[37],"added":[40],"to":[41,46,62],"the":[42,54,57,78,85,94],"basic":[43],"obtain":[47,63],"much":[49],"lower":[50],"coefficient.":[52],"Also":[53],"gain":[55],"of":[56],"operational":[58],"amplifier":[59],"increased":[61],"higher":[65],"PSRR.":[66],"uses":[69],"0.18":[71],"\u03bcm":[72],"process":[73],"shows":[75],"that":[76],"when":[77],"3.3":[83],"V,":[84],"between":[88],"-40~180":[89],"\u2103":[90],"2.352":[92],"ppm/\u2103,":[93],"PSRR":[95],"at":[96],"1":[97],"kHz":[98],"-112.16":[100],"dB.":[101]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}