{"id":"https://openalex.org/W4391183583","doi":"https://doi.org/10.1109/asicon58565.2023.10396315","title":"Pipelined-SAR ADC Calibration Technique Based on Gain-Bit Weights","display_name":"Pipelined-SAR ADC Calibration Technique Based on Gain-Bit Weights","publication_year":2023,"publication_date":"2023-10-24","ids":{"openalex":"https://openalex.org/W4391183583","doi":"https://doi.org/10.1109/asicon58565.2023.10396315"},"language":"en","primary_location":{"id":"doi:10.1109/asicon58565.2023.10396315","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/asicon58565.2023.10396315","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 15th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5114121285","display_name":"Hang Ling","orcid":null},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Hang Ling","raw_affiliation_strings":["Tongji University,Electronic and Information Engineering College,Shanghai,China","Electronic and Information Engineering College, Tongji University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Tongji University,Electronic and Information Engineering College,Shanghai,China","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"Electronic and Information Engineering College, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113103846","display_name":"Yifei Bai","orcid":null},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yifei Bai","raw_affiliation_strings":["Tongji University,Electronic and Information Engineering College,Shanghai,China","Electronic and Information Engineering College, Tongji University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Tongji University,Electronic and Information Engineering College,Shanghai,China","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"Electronic and Information Engineering College, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032008366","display_name":"Fengyi Mei","orcid":"https://orcid.org/0000-0003-4496-2992"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fengyi Mei","raw_affiliation_strings":["Tongji University,Electronic and Information Engineering College,Shanghai,China","Electronic and Information Engineering College, Tongji University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Tongji University,Electronic and Information Engineering College,Shanghai,China","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"Electronic and Information Engineering College, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104147867","display_name":"Huajun Yao","orcid":null},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huajun Yao","raw_affiliation_strings":["Tongji University,Electronic and Information Engineering College,Shanghai,China","Electronic and Information Engineering College, Tongji University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Tongji University,Electronic and Information Engineering College,Shanghai,China","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"Electronic and Information Engineering College, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101867100","display_name":"Yongzhen Chen","orcid":"https://orcid.org/0000-0002-1018-6289"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongzhen Chen","raw_affiliation_strings":["Tongji University,Electronic and Information Engineering College,Shanghai,China","Electronic and Information Engineering College, Tongji University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Tongji University,Electronic and Information Engineering College,Shanghai,China","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"Electronic and Information Engineering College, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102710667","display_name":"Jiangfeng Wu","orcid":"https://orcid.org/0000-0003-0910-0262"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiangfeng Wu","raw_affiliation_strings":["Tongji University,Electronic and Information Engineering College,Shanghai,China","Electronic and Information Engineering College, Tongji University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Tongji University,Electronic and Information Engineering College,Shanghai,China","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"Electronic and Information Engineering College, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5114121285"],"corresponding_institution_ids":["https://openalex.org/I116953780"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.18672753,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.9367367029190063},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.831285297870636},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.7589453458786011},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6643533706665039},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.6514707207679749},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5046805143356323},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.47729647159576416},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4144854247570038},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.33557724952697754},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15158069133758545},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13897565007209778},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.10703009366989136},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09386420249938965},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.08267229795455933}],"concepts":[{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.9367367029190063},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.831285297870636},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.7589453458786011},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6643533706665039},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.6514707207679749},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5046805143356323},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.47729647159576416},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4144854247570038},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.33557724952697754},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15158069133758545},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13897565007209778},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.10703009366989136},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09386420249938965},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.08267229795455933},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon58565.2023.10396315","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/asicon58565.2023.10396315","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 15th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7699999809265137,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1970246608","https://openalex.org/W2056161289","https://openalex.org/W2144429965"],"related_works":["https://openalex.org/W2904640696","https://openalex.org/W2752640128","https://openalex.org/W2278942241","https://openalex.org/W2997894768","https://openalex.org/W2568520569","https://openalex.org/W2345299457","https://openalex.org/W2418527074","https://openalex.org/W2533361262","https://openalex.org/W4206356469","https://openalex.org/W2368405386"],"abstract_inverted_index":{"In":[0],"this":[1,22],"paper,":[2],"a":[3],"Pipelined-SAR":[4],"ADC":[5,37,58],"reconstruction":[6,23],"strategy":[7],"based":[8],"on":[9],"gain-bit":[10],"weights":[11],"is":[12,49],"used.":[13],"The":[14,47],"foreground":[15],"and":[16,42,63],"background":[17],"calibration":[18],"algorithms":[19],"adapted":[20],"to":[21,32,51,61,68],"are":[24],"proposed":[25],"for":[26],"improving":[27],"the":[28,53,56,64],"performance":[29],"loss":[30],"due":[31],"reference":[33],"voltage":[34],"offset,":[35,41],"SAR":[36],"capacitor":[38],"mismatch,":[39],"comparator":[40],"inter-stage":[43],"amplifier":[44],"gain":[45],"error.":[46],"algorithm":[48],"able":[50],"improve":[52],"SFDR":[54],"of":[55],"target":[57],"from":[59,66],"62.95dB":[60],"90.46dB":[62],"SNDR":[65],"49.53dB":[67],"80.79dB.":[69]},"counts_by_year":[],"updated_date":"2025-12-25T23:11:45.687758","created_date":"2025-10-10T00:00:00"}