{"id":"https://openalex.org/W4391183718","doi":"https://doi.org/10.1109/asicon58565.2023.10396268","title":"An Adaptive Current Source IGBT Gate Driver Based on Current and Voltage Slope Feedback to Reduce EMI","display_name":"An Adaptive Current Source IGBT Gate Driver Based on Current and Voltage Slope Feedback to Reduce EMI","publication_year":2023,"publication_date":"2023-10-24","ids":{"openalex":"https://openalex.org/W4391183718","doi":"https://doi.org/10.1109/asicon58565.2023.10396268"},"language":"en","primary_location":{"id":"doi:10.1109/asicon58565.2023.10396268","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon58565.2023.10396268","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 15th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100353306","display_name":"Chang Liu","orcid":"https://orcid.org/0000-0002-8264-5261"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Chang Liu","raw_affiliation_strings":["Huazhong University of Science and Technology,Dept. School of Integrated Circuits,Wuhan,China","Dept. School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology,Dept. School of Integrated Circuits,Wuhan,China","institution_ids":["https://openalex.org/I47720641"]},{"raw_affiliation_string":"Dept. School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100603761","display_name":"Desheng Zhang","orcid":"https://orcid.org/0000-0001-9174-8011"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Desheng Zhang","raw_affiliation_strings":["Huazhong University of Science and Technology,Dept. School of Integrated Circuits,Wuhan,China","Dept. School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology,Dept. School of Integrated Circuits,Wuhan,China","institution_ids":["https://openalex.org/I47720641"]},{"raw_affiliation_string":"Dept. School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101213827","display_name":"Shuohan Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuohan Yang","raw_affiliation_strings":["Huazhong University of Science and Technology,Dept. School of Integrated Circuits,Wuhan,China","Dept. School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology,Dept. School of Integrated Circuits,Wuhan,China","institution_ids":["https://openalex.org/I47720641"]},{"raw_affiliation_string":"Dept. School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075072079","display_name":"Yinyu Wang","orcid":"https://orcid.org/0000-0001-6600-8281"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yinyu Wang","raw_affiliation_strings":["Huazhong University of Science and Technology,Dept. School of Integrated Circuits,Wuhan,China","Dept. School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology,Dept. School of Integrated Circuits,Wuhan,China","institution_ids":["https://openalex.org/I47720641"]},{"raw_affiliation_string":"Dept. School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113103851","display_name":"Qingyue Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qingyue Zhou","raw_affiliation_strings":["Huazhong University of Science and Technology,Dept. School of Integrated Circuits,Wuhan,China","Dept. School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology,Dept. School of Integrated Circuits,Wuhan,China","institution_ids":["https://openalex.org/I47720641"]},{"raw_affiliation_string":"Dept. School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100450402","display_name":"Shuo Zhang","orcid":"https://orcid.org/0000-0003-1397-5926"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuo Zhang","raw_affiliation_strings":["Huazhong University of Science and Technology,Dept. School of Integrated Circuits,Wuhan,China","Dept. School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology,Dept. School of Integrated Circuits,Wuhan,China","institution_ids":["https://openalex.org/I47720641"]},{"raw_affiliation_string":"Dept. School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044077427","display_name":"Run Min","orcid":"https://orcid.org/0000-0003-3365-6260"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Run Min","raw_affiliation_strings":["Huazhong University of Science and Technology,Dept. School of Integrated Circuits,Wuhan,China","Dept. School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology,Dept. School of Integrated Circuits,Wuhan,China","institution_ids":["https://openalex.org/I47720641"]},{"raw_affiliation_string":"Dept. School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064612882","display_name":"Qiaoling Tong","orcid":"https://orcid.org/0000-0002-9888-0426"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiaoling Tong","raw_affiliation_strings":["Huazhong University of Science and Technology,Dept. School of Integrated Circuits,Wuhan,China","Dept. School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology,Dept. School of Integrated Circuits,Wuhan,China","institution_ids":["https://openalex.org/I47720641"]},{"raw_affiliation_string":"Dept. School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5100353306"],"corresponding_institution_ids":["https://openalex.org/I47720641"],"apc_list":null,"apc_paid":null,"fwci":0.2678,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.56618923,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/emi","display_name":"EMI","score":0.8822318315505981},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.7326708436012268},{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.7204431295394897},{"id":"https://openalex.org/keywords/gate-driver","display_name":"Gate driver","score":0.6055639982223511},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5762499570846558},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.5368509888648987},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5330459475517273},{"id":"https://openalex.org/keywords/current-source","display_name":"Current source","score":0.5030390620231628},{"id":"https://openalex.org/keywords/gate-voltage","display_name":"Gate voltage","score":0.48572832345962524},{"id":"https://openalex.org/keywords/voltage-source","display_name":"Voltage source","score":0.4638742208480835},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4454284906387329},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43920350074768066},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4203528165817261},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2520514726638794},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.14566436409950256}],"concepts":[{"id":"https://openalex.org/C43461449","wikidata":"https://www.wikidata.org/wiki/Q2495531","display_name":"EMI","level":3,"score":0.8822318315505981},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.7326708436012268},{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.7204431295394897},{"id":"https://openalex.org/C179141203","wikidata":"https://www.wikidata.org/wiki/Q1495747","display_name":"Gate driver","level":3,"score":0.6055639982223511},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5762499570846558},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.5368509888648987},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5330459475517273},{"id":"https://openalex.org/C2781331714","wikidata":"https://www.wikidata.org/wiki/Q1163768","display_name":"Current source","level":3,"score":0.5030390620231628},{"id":"https://openalex.org/C2984119601","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Gate voltage","level":4,"score":0.48572832345962524},{"id":"https://openalex.org/C144655898","wikidata":"https://www.wikidata.org/wiki/Q1161128","display_name":"Voltage source","level":3,"score":0.4638742208480835},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4454284906387329},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43920350074768066},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4203528165817261},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2520514726638794},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.14566436409950256}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon58565.2023.10396268","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon58565.2023.10396268","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 15th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8500000238418579,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2564193318","https://openalex.org/W2347268629","https://openalex.org/W1900689440","https://openalex.org/W3165795363","https://openalex.org/W2348060780","https://openalex.org/W3088879894","https://openalex.org/W2378831118","https://openalex.org/W2382314166","https://openalex.org/W2062551440","https://openalex.org/W3028583087"],"abstract_inverted_index":{"To":[0,69],"reduce":[1],"the":[2,14,38,41,63,83,117,122,148],"electromagnetic":[3],"interference":[4],"(EMI)":[5],"generated":[6,51],"by":[7],"insulated":[8],"gate":[9,22,143,150],"bipolar":[10],"transistors":[11],"(IGBT)":[12],"during":[13,62,91,103],"switching":[15,43,105,132,137],"process,":[16,44,160],"an":[17,73,162],"adaptive":[18],"current":[19,26,56,87,102,110,191],"source":[20],"IGBT":[21,42,64,92],"driver":[23,124,151],"based":[24],"on":[25],"and":[27,58,66,75,88,112,115,134,179,183],"voltage":[28,59,90,113,194],"slope":[29,84],"feedback":[30],"is":[31,46,50,152],"presented":[32],"in":[33,100,131,139,155,181],"this":[34,71],"paper.":[35],"According":[36],"to":[37,81,141],"analysis":[39],"of":[40,55,85,119,147,165,177,190],"it":[45],"determined":[47],"that":[48],"EMI":[49],"as":[52],"a":[53,76,98,128,156,175],"result":[54],"overshoot":[57,60,111,114,192],"occurring":[61],"turn-on":[65,182],"turn-off":[67,184],"processes.":[68],"address":[70],"issue,":[72],"inductor":[74],"high-voltage":[77],"capacitor":[78],"are":[79],"used":[80],"detect":[82],"collector":[86],"collector-emitter":[89],"switching.":[93],"This":[94],"detection":[95],"allows":[96],"for":[97],"reduction":[99,176],"drive":[101],"specific":[104],"stages,":[106],"effectively":[107],"suppressing":[108],"both":[109],"inhibiting":[116],"generation":[118],"EMI.":[120],"Furthermore,":[121],"proposed":[123,149],"does":[125],"not":[126],"introduce":[127],"significant":[129],"increase":[130],"time":[133],"demonstrates":[135],"reduced":[136],"losses":[138],"comparison":[140],"conventional":[142],"drivers.":[144],"The":[145],"implementation":[146],"carried":[153],"out":[154],"0.18":[157],"\u03bcm":[158],"BCD":[159],"occupying":[161],"active":[163],"area":[164],"4.21":[166],"mm":[167],"<sup":[168],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[169],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[170],".":[171],"Simulation":[172],"results":[173],"indicate":[174],"16%":[178],"26%":[180],"losses,":[185],"respectively,":[186],"under":[187],"identical":[188],"conditions":[189],"or":[193],"overshoot.":[195]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}