{"id":"https://openalex.org/W4391183717","doi":"https://doi.org/10.1109/asicon58565.2023.10396245","title":"High Performance Bootstrap Switch for 14 bit SAR ADC with Redundancy in SMIC 180nm","display_name":"High Performance Bootstrap Switch for 14 bit SAR ADC with Redundancy in SMIC 180nm","publication_year":2023,"publication_date":"2023-10-24","ids":{"openalex":"https://openalex.org/W4391183717","doi":"https://doi.org/10.1109/asicon58565.2023.10396245"},"language":"en","primary_location":{"id":"doi:10.1109/asicon58565.2023.10396245","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/asicon58565.2023.10396245","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 15th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072724519","display_name":"Jing Yuan","orcid":"https://orcid.org/0000-0003-0906-1822"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jing Yuan","raw_affiliation_strings":["Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084509449","display_name":"Wenzhong Bao","orcid":"https://orcid.org/0000-0002-3871-467X"},"institutions":[{"id":"https://openalex.org/I4210156066","display_name":"State Key Laboratory of Chemical Engineering","ror":"https://ror.org/05803vc71","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210156066"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenzhong Bao","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems,Shanghai,China","State Key Laboratory of Integrated Chips and Systems, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems,Shanghai,China","institution_ids":["https://openalex.org/I4210156066"]},{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Shanghai, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001335523","display_name":"Tianxiang Wu","orcid":"https://orcid.org/0000-0003-4920-9932"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianxiang Wu","raw_affiliation_strings":["Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063433812","display_name":"Shunli Ma","orcid":"https://orcid.org/0000-0002-2737-9845"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shunli Ma","raw_affiliation_strings":["Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5072724519"],"corresponding_institution_ids":["https://openalex.org/I24943067"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.18667591,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9904999732971191,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6826394200325012},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6304387450218201},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.49562251567840576},{"id":"https://openalex.org/keywords/bit","display_name":"Bit (key)","score":0.4225074350833893},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.33931517601013184},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17547693848609924},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.16151681542396545},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.132444828748703},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.1085858941078186},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08782720565795898}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6826394200325012},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6304387450218201},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.49562251567840576},{"id":"https://openalex.org/C117011727","wikidata":"https://www.wikidata.org/wiki/Q1278488","display_name":"Bit (key)","level":2,"score":0.4225074350833893},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33931517601013184},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17547693848609924},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.16151681542396545},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.132444828748703},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.1085858941078186},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08782720565795898},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon58565.2023.10396245","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/asicon58565.2023.10396245","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 15th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6100000143051147,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320309612","display_name":"Natural Science Foundation of Shanghai","ror":null},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2111697895","https://openalex.org/W2121335077","https://openalex.org/W2943322887","https://openalex.org/W3011878475","https://openalex.org/W3114570446"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2411923897","https://openalex.org/W4285347720","https://openalex.org/W4381186982","https://openalex.org/W4200259850","https://openalex.org/W2333831899","https://openalex.org/W2484894494","https://openalex.org/W2367385042","https://openalex.org/W2090966292","https://openalex.org/W4390993506"],"abstract_inverted_index":{"This":[0],"paper":[1,22],"presents":[2],"a":[3],"high":[4],"performance":[5],"bootstrap":[6,29],"switch":[7,26],"for":[8],"5Ms/s":[9,43],"14bit":[10],"SAR":[11,46],"ADC":[12,47],"with":[13,30],"redundancy":[14],"in":[15,28,36],"SMIC":[16],"180nm.":[17],"The":[18],"highlight":[19],"of":[20,50,53,57,60],"the":[21,25],"is":[23],"replacing":[24],"MOSFET":[27],"DNW":[31],"MOSFET,":[32],"adding":[33],"redundant":[34],"bits":[35],"capacitor":[37],"arrays.":[38],"At":[39],"1.8V":[40],"supply":[41],"and":[42,55,64],",the":[44],"proposed":[45],"achieves":[48],"SNDR":[49,56],"77.57dB,":[51],"THD":[52,59],"-83.48dB,":[54],"71.47dB,":[58],"-73.17dB":[61],"at":[62],"low":[63],"Nyquist":[65],"frequency":[66],"respectively.":[67]},"counts_by_year":[],"updated_date":"2025-12-25T23:11:45.687758","created_date":"2025-10-10T00:00:00"}