{"id":"https://openalex.org/W4391183534","doi":"https://doi.org/10.1109/asicon58565.2023.10396150","title":"A Sinusoidal Fitting-based Digital Foreground Calibration Technique for Pipelined ADC","display_name":"A Sinusoidal Fitting-based Digital Foreground Calibration Technique for Pipelined ADC","publication_year":2023,"publication_date":"2023-10-24","ids":{"openalex":"https://openalex.org/W4391183534","doi":"https://doi.org/10.1109/asicon58565.2023.10396150"},"language":"en","primary_location":{"id":"doi:10.1109/asicon58565.2023.10396150","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon58565.2023.10396150","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 15th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101296215","display_name":"Beicheng Xue","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Beicheng Xue","raw_affiliation_strings":["University of Electronic Science and Technology of China,School of Integrated Circuit Science and Engineering,Chengdu,China","School of Integrated Circuit Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China,School of Integrated Circuit Science and Engineering,Chengdu,China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"School of Integrated Circuit Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041242177","display_name":"Zhifei Lu","orcid":"https://orcid.org/0000-0003-2574-7015"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhifei Lu","raw_affiliation_strings":["University of Electronic Science and Technology of China,School of Integrated Circuit Science and Engineering,Chengdu,China","School of Integrated Circuit Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China,School of Integrated Circuit Science and Engineering,Chengdu,China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"School of Integrated Circuit Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100349326","display_name":"Wei Zhang","orcid":"https://orcid.org/0000-0001-8772-5634"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Zhang","raw_affiliation_strings":["University of Electronic Science and Technology of China,School of Integrated Circuit Science and Engineering,Chengdu,China","School of Integrated Circuit Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China,School of Integrated Circuit Science and Engineering,Chengdu,China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"School of Integrated Circuit Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021922409","display_name":"He Tang","orcid":"https://orcid.org/0000-0001-8624-5671"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"He Tang","raw_affiliation_strings":["University of Electronic Science and Technology of China,School of Integrated Circuit Science and Engineering,Chengdu,China","School of Integrated Circuit Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China,School of Integrated Circuit Science and Engineering,Chengdu,China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"School of Integrated Circuit Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063863513","display_name":"Xizhu Peng","orcid":"https://orcid.org/0000-0002-8410-6237"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xizhu Peng","raw_affiliation_strings":["University of Electronic Science and Technology of China,School of Integrated Circuit Science and Engineering,Chengdu,China","School of Integrated Circuit Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China","Chongqing Institute of Microelectronics Industry Technology, University of Electronic Science and Technology of China, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China,School of Integrated Circuit Science and Engineering,Chengdu,China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"School of Integrated Circuit Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Chongqing Institute of Microelectronics Industry Technology, University of Electronic Science and Technology of China, Chongqing, China","institution_ids":["https://openalex.org/I150229711","https://openalex.org/I4210119392"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101296215"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":null,"apc_paid":null,"fwci":0.3379,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.55308667,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7012869119644165},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6723951101303101},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3824256658554077},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.18263372778892517},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08564189076423645}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7012869119644165},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6723951101303101},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3824256658554077},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18263372778892517},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08564189076423645}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon58565.2023.10396150","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon58565.2023.10396150","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 15th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321133","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1967180561","https://openalex.org/W2082487225","https://openalex.org/W2149528610","https://openalex.org/W2973925275","https://openalex.org/W3090442715","https://openalex.org/W3131395393"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2350741829","https://openalex.org/W2530322880","https://openalex.org/W1596801655","https://openalex.org/W2359140296"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3],"novel":[4],"foreground":[5],"digital":[6,37],"calibration":[7,86],"technique":[8,103],"for":[9],"pipelined":[10],"ADCs":[11],"to":[12,39,72,113],"compensate":[13],"nonlinearity":[14],"caused":[15],"by":[16,30,34,55],"inter-stage":[17],"gain":[18],"error":[19,43,52,79],"(IGE)":[20],"and":[21,48,62,77,91,107,111,115],"DAC":[22,51,78],"error.":[23],"The":[24],"proposed":[25],"algorithm":[26],"calibrates":[27],"the":[28,41,46,57,67,93,105],"IGE":[29,63,76],"iterating":[31],"coefficients":[32],"multiplied":[33],"different":[35],"stage":[36],"output":[38,61,65],"reduce":[40],"mean-square":[42],"(MSE)":[44],"between":[45,59],"fitted":[47,60],"reintegrated":[49],"output.":[50,70],"is":[53],"extracted":[54],"averaging":[56],"difference":[58],"calibrated":[64],"of":[66],"same":[68],"sub-stage":[69],"Compared":[71],"previous":[73],"works":[74],"on":[75,95],"calibration,":[80],"this":[81,102],"work":[82],"could":[83],"achieve":[84],"effective":[85],"under":[87],"various":[88],"static":[89],"errors":[90],"minimize":[92],"demand":[94],"hardware":[96],"design.":[97],"Simulation":[98],"results":[99],"show":[100],"that":[101],"increases":[104],"ENOB":[106],"SFDR":[108],"from":[109],"9.24bits":[110],"63.41dB":[112],"11.03bits":[114],"78.68dB,":[116],"respectively.":[117]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}