{"id":"https://openalex.org/W4391183604","doi":"https://doi.org/10.1109/asicon58565.2023.10396091","title":"A High Precision Capacitive Isolation Amplifier for Current Sensing Applications","display_name":"A High Precision Capacitive Isolation Amplifier for Current Sensing Applications","publication_year":2023,"publication_date":"2023-10-24","ids":{"openalex":"https://openalex.org/W4391183604","doi":"https://doi.org/10.1109/asicon58565.2023.10396091"},"language":"en","primary_location":{"id":"doi:10.1109/asicon58565.2023.10396091","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/asicon58565.2023.10396091","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 15th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100583374","display_name":"Yonghui Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I4391767659","display_name":"State Key Laboratory of Electronic Thin Films and Integrated Devices","ror":"https://ror.org/01t9yse95","country_code":null,"type":"facility","lineage":["https://openalex.org/I150229711","https://openalex.org/I4391767659"]},{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yonghui Wu","raw_affiliation_strings":["University of Electronic Science and Technology of China,State Key Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610000"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China,State Key Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610000","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711","https://openalex.org/I4391767659"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100348081","display_name":"Yiwei Liu","orcid":"https://orcid.org/0000-0002-3077-5777"},"institutions":[{"id":"https://openalex.org/I4391767659","display_name":"State Key Laboratory of Electronic Thin Films and Integrated Devices","ror":"https://ror.org/01t9yse95","country_code":null,"type":"facility","lineage":["https://openalex.org/I150229711","https://openalex.org/I4391767659"]},{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiwei Liu","raw_affiliation_strings":["University of Electronic Science and Technology of China,State Key Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610000"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China,State Key Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610000","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711","https://openalex.org/I4391767659"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061074926","display_name":"Shaowei Zhen","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4391767659","display_name":"State Key Laboratory of Electronic Thin Films and Integrated Devices","ror":"https://ror.org/01t9yse95","country_code":null,"type":"facility","lineage":["https://openalex.org/I150229711","https://openalex.org/I4391767659"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shaowei Zhen","raw_affiliation_strings":["University of Electronic Science and Technology of China,State Key Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610000"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China,State Key Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610000","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711","https://openalex.org/I4391767659"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071939188","display_name":"Yanliang Li","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yanliang Li","raw_affiliation_strings":["Chongqing Optoelectronics Research Institute,Chongqing,China,400060"],"affiliations":[{"raw_affiliation_string":"Chongqing Optoelectronics Research Institute,Chongqing,China,400060","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100610027","display_name":"Yikang Li","orcid":"https://orcid.org/0000-0002-3508-510X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yikang Li","raw_affiliation_strings":["Chongqing Optoelectronics Research Institute,Chongqing,China,400060"],"affiliations":[{"raw_affiliation_string":"Chongqing Optoelectronics Research Institute,Chongqing,China,400060","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100771239","display_name":"Jianing Zhang","orcid":"https://orcid.org/0000-0002-2880-3273"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jia-Ning Zhang","raw_affiliation_strings":["Chongqing Optoelectronics Research Institute,Chongqing,China,400060"],"affiliations":[{"raw_affiliation_string":"Chongqing Optoelectronics Research Institute,Chongqing,China,400060","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101995291","display_name":"Yi Ou","orcid":"https://orcid.org/0000-0002-7773-1894"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yi Ou","raw_affiliation_strings":["Chongqing Optoelectronics Research Institute,Chongqing,China,400060"],"affiliations":[{"raw_affiliation_string":"Chongqing Optoelectronics Research Institute,Chongqing,China,400060","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100320398","display_name":"Bo Zhang","orcid":"https://orcid.org/0000-0003-1288-1549"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I4391767659","display_name":"State Key Laboratory of Electronic Thin Films and Integrated Devices","ror":"https://ror.org/01t9yse95","country_code":null,"type":"facility","lineage":["https://openalex.org/I150229711","https://openalex.org/I4391767659"]},{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Zhang","raw_affiliation_strings":["University of Electronic Science and Technology of China,State Key Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610000"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China,State Key Laboratory of Electronic Thin Films and Integrated Devices,Chengdu,China,610000","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711","https://openalex.org/I4391767659"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5100583374"],"corresponding_institution_ids":["https://openalex.org/I150229711","https://openalex.org/I4210124847","https://openalex.org/I4391767659"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.18361138,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9779999852180481,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.6966578960418701},{"id":"https://openalex.org/keywords/isolation","display_name":"Isolation (microbiology)","score":0.6184258460998535},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5382003784179688},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5285367369651794},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5160724520683289},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4731349050998688},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.46111276745796204},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3767677843570709},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3115759789943695},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2326125204563141},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.1651667356491089},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12239900231361389}],"concepts":[{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.6966578960418701},{"id":"https://openalex.org/C2775941552","wikidata":"https://www.wikidata.org/wiki/Q25212305","display_name":"Isolation (microbiology)","level":2,"score":0.6184258460998535},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5382003784179688},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5285367369651794},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5160724520683289},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4731349050998688},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.46111276745796204},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3767677843570709},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3115759789943695},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2326125204563141},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.1651667356491089},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12239900231361389},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C89423630","wikidata":"https://www.wikidata.org/wiki/Q7193","display_name":"Microbiology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon58565.2023.10396091","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/asicon58565.2023.10396091","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 15th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8799999952316284}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1827743869","https://openalex.org/W2127394451","https://openalex.org/W4299973078"],"related_works":["https://openalex.org/W3102847316","https://openalex.org/W3172386668","https://openalex.org/W2045392317","https://openalex.org/W2035297892","https://openalex.org/W3011006018","https://openalex.org/W4205540626","https://openalex.org/W2143949944","https://openalex.org/W2051563071","https://openalex.org/W4386571252","https://openalex.org/W2135814299"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3,69,75],"high":[4],"precision":[5],"capacitive":[6,45],"isolation":[7,46],"current":[8],"sensing":[9],"amplifier.":[10],"In":[11],"order":[12],"to":[13,22,36],"eliminate":[14],"gain":[15,71,76],"drift":[16,79],"with":[17,55],"temperature":[18,78],"and":[19,30,39,82],"improve":[20],"susceptibility":[21],"common":[23],"mode":[24],"transient":[25],"interference,":[26],"second-order":[27],"sigma-delta":[28],"modulator":[29],"digital":[31],"isolator":[32],"interface":[33],"are":[34],"used":[35],"ensure":[37],"high-precision":[38],"high-stability":[40],"signal":[41,51],"transmission.":[42],"The":[43,60],"proposed":[44,66],"amplifier":[47,67],"is":[48],"designed":[49],"for":[50],"bandwidth":[52],"of":[53,73,80,85],"100kHz":[54],"input":[56],"voltage":[57],"range":[58],"\u00b1250mV.":[59],"Simulation":[61],"results":[62],"indicate":[63],"that":[64],"the":[65],"achieves":[68],"maximum":[70],"error":[72,77],"0.3%,":[74],"10.7ppm/\u00b0C":[81],"an":[83],"SNR":[84],"63.9dB.":[86]},"counts_by_year":[],"updated_date":"2025-12-25T23:11:45.687758","created_date":"2025-10-10T00:00:00"}