{"id":"https://openalex.org/W4200051957","doi":"https://doi.org/10.1109/asicon52560.2021.9620287","title":"A Charge Pump with Perfect Current Matching Applied to Phase-Locked Loop in 65nm CMOS","display_name":"A Charge Pump with Perfect Current Matching Applied to Phase-Locked Loop in 65nm CMOS","publication_year":2021,"publication_date":"2021-10-26","ids":{"openalex":"https://openalex.org/W4200051957","doi":"https://doi.org/10.1109/asicon52560.2021.9620287"},"language":"en","primary_location":{"id":"doi:10.1109/asicon52560.2021.9620287","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon52560.2021.9620287","pdf_url":null,"source":{"id":"https://openalex.org/S4363607945","display_name":"2021 IEEE 14th International Conference on ASIC (ASICON)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE 14th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065015672","display_name":"Jintao Zu","orcid":null},"institutions":[{"id":"https://openalex.org/I3131625388","display_name":"University Town of Shenzhen","ror":"https://ror.org/05f5j6225","country_code":"CN","type":"education","lineage":["https://openalex.org/I3131625388"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jintao Zu","raw_affiliation_strings":["Shenzhen International Graduate School, Tsinghua University, Shenzhen, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shenzhen International Graduate School, Tsinghua University, Shenzhen, China","institution_ids":["https://openalex.org/I3131625388","https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064229348","display_name":"Xinpeng Xing","orcid":"https://orcid.org/0000-0002-5535-9577"},"institutions":[{"id":"https://openalex.org/I3131625388","display_name":"University Town of Shenzhen","ror":"https://ror.org/05f5j6225","country_code":"CN","type":"education","lineage":["https://openalex.org/I3131625388"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinpeng Xing","raw_affiliation_strings":["Shenzhen International Graduate School, Tsinghua University, Shenzhen, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shenzhen International Graduate School, Tsinghua University, Shenzhen, China","institution_ids":["https://openalex.org/I3131625388","https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052172658","display_name":"Haigang Feng","orcid":"https://orcid.org/0000-0002-8377-1171"},"institutions":[{"id":"https://openalex.org/I3131625388","display_name":"University Town of Shenzhen","ror":"https://ror.org/05f5j6225","country_code":"CN","type":"education","lineage":["https://openalex.org/I3131625388"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haigang Feng","raw_affiliation_strings":["Shenzhen International Graduate School, Tsinghua University, Shenzhen, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shenzhen International Graduate School, Tsinghua University, Shenzhen, China","institution_ids":["https://openalex.org/I3131625388","https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.035,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.87331691,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/current-mirror","display_name":"Current mirror","score":0.8315066695213318},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.8092097043991089},{"id":"https://openalex.org/keywords/charge-pump","display_name":"Charge pump","score":0.7059661746025085},{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.6694186329841614},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.6433008313179016},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5814079642295837},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5691336989402771},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5250682234764099},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5030261874198914},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.4486331641674042},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4431779384613037},{"id":"https://openalex.org/keywords/current-source","display_name":"Current source","score":0.4212886095046997},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.32006728649139404},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28819507360458374},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.2639525830745697},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.14342829585075378}],"concepts":[{"id":"https://openalex.org/C173966970","wikidata":"https://www.wikidata.org/wiki/Q786012","display_name":"Current mirror","level":4,"score":0.8315066695213318},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.8092097043991089},{"id":"https://openalex.org/C114825011","wikidata":"https://www.wikidata.org/wiki/Q440704","display_name":"Charge pump","level":4,"score":0.7059661746025085},{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.6694186329841614},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.6433008313179016},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5814079642295837},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5691336989402771},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5250682234764099},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5030261874198914},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.4486331641674042},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4431779384613037},{"id":"https://openalex.org/C2781331714","wikidata":"https://www.wikidata.org/wiki/Q1163768","display_name":"Current source","level":3,"score":0.4212886095046997},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.32006728649139404},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28819507360458374},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.2639525830745697},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.14342829585075378},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon52560.2021.9620287","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon52560.2021.9620287","pdf_url":null,"source":{"id":"https://openalex.org/S4363607945","display_name":"2021 IEEE 14th International Conference on ASIC (ASICON)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE 14th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8899999856948853,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320337504","display_name":"Research and Development","ror":"https://ror.org/027s68j25"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1677884181","https://openalex.org/W2059165051","https://openalex.org/W2062737926","https://openalex.org/W2297460310","https://openalex.org/W2955243976","https://openalex.org/W3125804451"],"related_works":["https://openalex.org/W66112532","https://openalex.org/W4385624389","https://openalex.org/W2979324006","https://openalex.org/W2409831949","https://openalex.org/W2087564251","https://openalex.org/W2369807905","https://openalex.org/W2036999063","https://openalex.org/W2348650573","https://openalex.org/W2752021769","https://openalex.org/W2378414896"],"abstract_inverted_index":{"A":[0],"source-switched":[1],"charge":[2],"pump":[3],"(CP)":[4],"with":[5],"low":[6],"current":[7,22,28,35,45,50,79],"mismatch":[8,23,80],"used":[9],"in":[10,16,43,63],"phase-locked":[11],"loop":[12],"(PLL)":[13],"is":[14,24,61],"presented":[15],"this":[17],"paper.":[18],"Up":[19],"and":[20,31],"down":[21],"detected":[25],"by":[26,33],"two":[27,48],"detection":[29],"circuits":[30,52],"cancelled":[32],"add-on":[34],"mirrors.":[36],"Considering":[37],"the":[38,44,58,73,82],"channel-length":[39],"modulation":[40],"effect":[41],"impact":[42],"mirror":[46],"transistors,":[47],"dynamic":[49],"compensation":[51],"are":[53],"introduced.":[54],"The":[55],"concept":[56],"of":[57],"improved":[59],"CP":[60],"implemented":[62],"a":[64],"65nm":[65],"CMOS":[66],"technology.":[67],"With":[68],"50":[69],"\u00b5A":[70],"output":[71,83],"current,":[72],"circuit":[74],"achieves":[75],"less":[76],"than":[77],"0.78%":[78],"over":[81],"voltage":[84],"range":[85],"from":[86],"0.21":[87],"to":[88],"1.62":[89],"V":[90,93],"under":[91],"1.8":[92],"supply.":[94]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}