{"id":"https://openalex.org/W4200586982","doi":"https://doi.org/10.1109/asicon52560.2021.9620248","title":"A Self-regulating Dynamic Reference Sensing Scheme with Balanced Trade-Off between Read Disturbance and Sensing Margin","display_name":"A Self-regulating Dynamic Reference Sensing Scheme with Balanced Trade-Off between Read Disturbance and Sensing Margin","publication_year":2021,"publication_date":"2021-10-26","ids":{"openalex":"https://openalex.org/W4200586982","doi":"https://doi.org/10.1109/asicon52560.2021.9620248"},"language":"en","primary_location":{"id":"doi:10.1109/asicon52560.2021.9620248","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon52560.2021.9620248","pdf_url":null,"source":{"id":"https://openalex.org/S4363607945","display_name":"2021 IEEE 14th International Conference on ASIC (ASICON)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE 14th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077580931","display_name":"Jia-le Cui","orcid":"https://orcid.org/0009-0004-0795-8657"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jia-le Cui","raw_affiliation_strings":["National ASIC System Engineering Center, Southeast University, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100408835","display_name":"Haibin Wang","orcid":"https://orcid.org/0000-0002-9269-1229"},"institutions":[{"id":"https://openalex.org/I163340411","display_name":"Hohai University","ror":"https://ror.org/01wd4xt90","country_code":"CN","type":"education","lineage":["https://openalex.org/I163340411"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hai-bin Wang","raw_affiliation_strings":["Collage of IoT Engineering, Hohai University, Changzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Collage of IoT Engineering, Hohai University, Changzhou, China","institution_ids":["https://openalex.org/I163340411"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089840020","display_name":"Hao Cai","orcid":"https://orcid.org/0000-0002-0566-9411"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Cai","raw_affiliation_strings":["National ASIC System Engineering Center, Southeast University, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.45306122,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12510","display_name":"Magneto-Optical Properties and Applications","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10382","display_name":"Quantum and electron transport phenomena","score":0.9911999702453613,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7134093642234802},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.5542294383049011},{"id":"https://openalex.org/keywords/magnetoresistive-random-access-memory","display_name":"Magnetoresistive random-access memory","score":0.5445778965950012},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.46905258297920227},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4448511600494385},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4348936676979065},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21678581833839417},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.19689780473709106},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.16571664810180664},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1527378261089325}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7134093642234802},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.5542294383049011},{"id":"https://openalex.org/C46891859","wikidata":"https://www.wikidata.org/wiki/Q1061546","display_name":"Magnetoresistive random-access memory","level":3,"score":0.5445778965950012},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.46905258297920227},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4448511600494385},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4348936676979065},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21678581833839417},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.19689780473709106},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.16571664810180664},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1527378261089325},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon52560.2021.9620248","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon52560.2021.9620248","pdf_url":null,"source":{"id":"https://openalex.org/S4363607945","display_name":"2021 IEEE 14th International Conference on ASIC (ASICON)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE 14th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.41999998688697815,"id":"https://metadata.un.org/sdg/4","display_name":"Quality Education"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2141626281","https://openalex.org/W2086829516","https://openalex.org/W2472395098","https://openalex.org/W1908441109","https://openalex.org/W1840158209","https://openalex.org/W4367339106","https://openalex.org/W4385525234","https://openalex.org/W2913371358","https://openalex.org/W2055167838","https://openalex.org/W2155835898"],"abstract_inverted_index":{"Spin":[0],"transfer":[1],"torque":[2],"MRAM":[3,22],"(STT-MRAM)":[4],"is":[5,25,85],"a":[6,41,113],"promising":[7],"candidate":[8],"for":[9],"next-generation":[10],"memory":[11],"thanks":[12],"to":[13,28,49,78,131],"its":[14],"high":[15],"endurance":[16],"and":[17,68,125],"non-volatility.":[18],"In":[19],"low-power":[20],"scenario,":[21],"sensing":[23,47,51,101,108],"margin":[24,109],"degraded":[26],"due":[27],"the":[29,59,66,71,79,97,103,107,121,127],"limited":[30],"reading":[31],"current,":[32],"which":[33],"makes":[34],"read":[35,115],"operation":[36],"difficult.":[37],"This":[38],"paper":[39],"proposes":[40],"novel":[42],"self-regulating":[43],"dynamic":[44,61,99],"reference":[45,62],"(SRDR)":[46],"scheme":[48,57,84,105],"alleviate":[50],"bit-error":[52],"rate":[53],"(BER).":[54],"The":[55,82],"proposed":[56,83,104],"optimizes":[58],"conventional":[60],"generator":[63],"so":[64],"that":[65],"gain":[67],"bias":[69],"of":[70,120],"attenuator":[72],"can":[73],"be":[74],"adaptively":[75],"changed":[76],"according":[77],"bit-line":[80],"voltage.":[81],"evaluated":[86],"with":[87,96],"65-nm":[88],"CMOS.":[89],"Simulation":[90],"results":[91],"show":[92],"significant":[93],"improvement.":[94],"Compared":[95],"previous":[98],"dual-reference":[100],"scheme,":[102],"improves":[106],"by":[110],"103%":[111],"at":[112],"lower":[114],"current":[116],"(10.09\u03bcA,":[117],"only":[118],"18%":[119],"critical":[122],"switching":[123],"current)":[124],"reduces":[126],"BER":[128],"from":[129],"3.5E-02":[130],"9.6E-06.":[132]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}