{"id":"https://openalex.org/W3004726369","doi":"https://doi.org/10.1109/asicon47005.2019.8983604","title":"A Comparator-Reused Dynamic-Amplifier for Noise-Shaping SAR ADC","display_name":"A Comparator-Reused Dynamic-Amplifier for Noise-Shaping SAR ADC","publication_year":2019,"publication_date":"2019-10-01","ids":{"openalex":"https://openalex.org/W3004726369","doi":"https://doi.org/10.1109/asicon47005.2019.8983604","mag":"3004726369"},"language":"en","primary_location":{"id":"doi:10.1109/asicon47005.2019.8983604","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon47005.2019.8983604","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 13th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102350009","display_name":"Longheng Luo","orcid":null},"institutions":[{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Longheng Luo","raw_affiliation_strings":["State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,201203","State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,201203","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4391767673"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4391767673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073767046","display_name":"Xingchen Shen","orcid":"https://orcid.org/0009-0006-3993-9623"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xingchen Shen","raw_affiliation_strings":["State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,201203","State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,201203","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4391767673"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4391767673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017373395","display_name":"Jianguo Diao","orcid":null},"institutions":[{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianguo Diao","raw_affiliation_strings":["State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,201203","State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,201203","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4391767673"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4391767673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025053306","display_name":"Fan Ye","orcid":"https://orcid.org/0000-0002-1089-1498"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fan Ye","raw_affiliation_strings":["State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,201203","State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,201203","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4391767673"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4391767673"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016448886","display_name":"Junyan Ren","orcid":"https://orcid.org/0000-0002-7799-6251"},"institutions":[{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junyan Ren","raw_affiliation_strings":["State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,201203","State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,201203","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4391767673"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4391767673"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5102350009"],"corresponding_institution_ids":["https://openalex.org/I24943067","https://openalex.org/I4210132426","https://openalex.org/I4391767673"],"apc_list":null,"apc_paid":null,"fwci":0.0978,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.4604825,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.9138192534446716},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.7850044965744019},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5985349416732788},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5461935997009277},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.5439186096191406},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5093923211097717},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.507569432258606},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4767899513244629},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.42725202441215515},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2194311022758484},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21498563885688782},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.165688157081604},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.10483306646347046}],"concepts":[{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.9138192534446716},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.7850044965744019},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5985349416732788},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5461935997009277},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5439186096191406},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5093923211097717},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.507569432258606},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4767899513244629},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.42725202441215515},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2194311022758484},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21498563885688782},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.165688157081604},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.10483306646347046},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon47005.2019.8983604","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon47005.2019.8983604","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 13th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8999999761581421,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2897458229"],"related_works":["https://openalex.org/W2278942241","https://openalex.org/W2368405386","https://openalex.org/W2044867305","https://openalex.org/W1977749038","https://openalex.org/W1641489184","https://openalex.org/W3004044036","https://openalex.org/W2792167570","https://openalex.org/W2290076986","https://openalex.org/W4206173322","https://openalex.org/W4312326809"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,14,17,27,35,47],"high-speed":[4],"high-gain":[5],"dynamic":[6,31,41,72],"amplifier":[7,32],"which":[8,43],"can":[9,33],"also":[10],"be":[11],"reused":[12],"as":[13],"comparator":[15],"for":[16],"noise-shaping":[18],"(NS)":[19],"successive-approximation-register":[20],"(SAR)":[21],"analog-to-digital":[22],"converter":[23],"(ADC).":[24],"By":[25],"modifying":[26],"strong-arm":[28],"latch,":[29],"this":[30],"achieve":[34],"high":[36],"speed":[37,65],"of":[38,66,100],"comparison":[39,64],"and":[40,69,90],"amplification,":[42],"is":[44,54,87,93],"crucial":[45],"to":[46],"high-performance":[48],"NS":[49],"SAR":[50],"ADC.":[51],"The":[52],"prototype":[53],"designed":[55],"in":[56,74],"28":[57],"nm":[58],"CMOS":[59],"process.":[60],"It":[61],"realizes":[62],"the":[63,84,91,97],"0.2":[67],"ns":[68,76],"8":[70],"times":[71],"amplification":[73],"0.9":[75],"with":[77,96],"0.6":[78],"pF":[79],"single-end":[80],"capacitance":[81],"load.":[82],"Meanwhile,":[83],"noise":[85],"floor":[86],"11":[88],"nV/\u221aHz":[89],"THD":[92],"-76.5":[94],"dB":[95],"power":[98],"consumption":[99],"56":[101],"\u03bcW":[102],"averagely.":[103]},"counts_by_year":[{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}