{"id":"https://openalex.org/W3004746777","doi":"https://doi.org/10.1109/asicon47005.2019.8983599","title":"Soft-Error Tolerance Depending on Supply Voltage by Heavy Ions on Radiation-Hardened Flip Flops in a 65 nm Bulk Process","display_name":"Soft-Error Tolerance Depending on Supply Voltage by Heavy Ions on Radiation-Hardened Flip Flops in a 65 nm Bulk Process","publication_year":2019,"publication_date":"2019-10-01","ids":{"openalex":"https://openalex.org/W3004746777","doi":"https://doi.org/10.1109/asicon47005.2019.8983599","mag":"3004746777"},"language":"en","primary_location":{"id":"doi:10.1109/asicon47005.2019.8983599","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon47005.2019.8983599","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 13th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066400650","display_name":"Yuto Tsukita","orcid":null},"institutions":[{"id":"https://openalex.org/I27429435","display_name":"Kyoto Institute of Technology","ror":"https://ror.org/00965ax52","country_code":"JP","type":"education","lineage":["https://openalex.org/I27429435"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Yuto Tsukita","raw_affiliation_strings":["Kyoto Institute of Technology,Japan","Kyoto Institute of Technology, Japan"],"affiliations":[{"raw_affiliation_string":"Kyoto Institute of Technology,Japan","institution_ids":["https://openalex.org/I27429435"]},{"raw_affiliation_string":"Kyoto Institute of Technology, Japan","institution_ids":["https://openalex.org/I27429435"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007689904","display_name":"Mitsunori Ebara","orcid":"https://orcid.org/0000-0003-1505-0935"},"institutions":[{"id":"https://openalex.org/I27429435","display_name":"Kyoto Institute of Technology","ror":"https://ror.org/00965ax52","country_code":"JP","type":"education","lineage":["https://openalex.org/I27429435"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Mitsunori Ebara","raw_affiliation_strings":["Kyoto Institute of Technology,Japan","Kyoto Institute of Technology, Japan"],"affiliations":[{"raw_affiliation_string":"Kyoto Institute of Technology,Japan","institution_ids":["https://openalex.org/I27429435"]},{"raw_affiliation_string":"Kyoto Institute of Technology, Japan","institution_ids":["https://openalex.org/I27429435"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050140256","display_name":"Jun Furuta","orcid":"https://orcid.org/0000-0003-0146-3077"},"institutions":[{"id":"https://openalex.org/I27429435","display_name":"Kyoto Institute of Technology","ror":"https://ror.org/00965ax52","country_code":"JP","type":"education","lineage":["https://openalex.org/I27429435"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Jun Furuta","raw_affiliation_strings":["Kyoto Institute of Technology,Japan","Kyoto Institute of Technology, Japan"],"affiliations":[{"raw_affiliation_string":"Kyoto Institute of Technology,Japan","institution_ids":["https://openalex.org/I27429435"]},{"raw_affiliation_string":"Kyoto Institute of Technology, Japan","institution_ids":["https://openalex.org/I27429435"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049656449","display_name":"Kazutoshi Kobayashi","orcid":"https://orcid.org/0000-0002-7139-7274"},"institutions":[{"id":"https://openalex.org/I27429435","display_name":"Kyoto Institute of Technology","ror":"https://ror.org/00965ax52","country_code":"JP","type":"education","lineage":["https://openalex.org/I27429435"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazutoshi Kobayashi","raw_affiliation_strings":["Kyoto Institute of Technology,Japan","Kyoto Institute of Technology, Japan"],"affiliations":[{"raw_affiliation_string":"Kyoto Institute of Technology,Japan","institution_ids":["https://openalex.org/I27429435"]},{"raw_affiliation_string":"Kyoto Institute of Technology, Japan","institution_ids":["https://openalex.org/I27429435"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5066400650"],"corresponding_institution_ids":["https://openalex.org/I27429435"],"apc_list":null,"apc_paid":null,"fwci":0.5961,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.70035634,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ion","display_name":"Ion","score":0.6149684190750122},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.610083281993866},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.5501143336296082},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4962471127510071},{"id":"https://openalex.org/keywords/flops","display_name":"FLOPS","score":0.4244967997074127},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.38063329458236694},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.36390846967697144},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.3550412654876709},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.32504042983055115},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3205200731754303},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3014821410179138},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2410147488117218},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14201515913009644},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.08882150053977966}],"concepts":[{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.6149684190750122},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.610083281993866},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.5501143336296082},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4962471127510071},{"id":"https://openalex.org/C3826847","wikidata":"https://www.wikidata.org/wiki/Q188768","display_name":"FLOPS","level":2,"score":0.4244967997074127},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.38063329458236694},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.36390846967697144},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.3550412654876709},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.32504042983055115},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3205200731754303},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3014821410179138},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2410147488117218},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14201515913009644},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.08882150053977966},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon47005.2019.8983599","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon47005.2019.8983599","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 13th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.800000011920929,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1564617507","https://openalex.org/W1968121555","https://openalex.org/W2011024076","https://openalex.org/W2017426388","https://openalex.org/W2050362621","https://openalex.org/W2050431855","https://openalex.org/W2083664225","https://openalex.org/W2167002145"],"related_works":["https://openalex.org/W4315697128","https://openalex.org/W4382323155","https://openalex.org/W3205506801","https://openalex.org/W2971502891","https://openalex.org/W4287067436","https://openalex.org/W4280599700","https://openalex.org/W3183570023","https://openalex.org/W3102845713","https://openalex.org/W2090290079","https://openalex.org/W2801372096"],"abstract_inverted_index":{"We":[0],"evaluated":[1],"soft-error":[2,65,111],"tolerance":[3,66,112],"by":[4,55,69,90,103],"heavy":[5,71],"ions":[6,72,92],"on":[7],"several":[8],"types":[9],"of":[10,60],"flip":[11],"flops":[12],"(FFs)":[13],"called":[14],"transmission-gate":[15],"FF":[16,22,29],"(TGFF),":[17],"Dual":[18,26],"Interlocked":[19],"Storage":[20],"Cell":[21],"(DICEFF),":[23],"Bistable":[24],"Cross-coupled":[25],"Modular":[27],"Redundancy":[28],"(BCDMRFF)":[30],"and":[31,35],"BCDMRFF":[32,68,82,108],"with":[33],"Set":[34],"Reset":[36],"(BCDMRFFSR)":[37],"in":[38],"a":[39,52],"65":[40],"nm":[41],"bulk":[42],"process.":[43],"Radiation-hardened":[44],"FFs":[45],"are":[46],"stronger":[47,84],"against":[48,85],"soft":[49,86],"errors":[50],"than":[51,67,74,88,113,120],"standard":[53],"TGFF":[54],"two":[56],"or":[57],"three":[58],"order":[59],"magnitude.":[61],"DICEFF":[62,89,100,114],"has":[63,109],"higher":[64,110],"low-LET":[70],"less":[73,119],"40":[75,94],"MeV-cm":[76,95],"<sup":[77,96],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[78,97],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[79,98],"/mg,":[80],"while":[81,107],"is":[83,118],"error":[87],"high-LET":[91],"over":[93],"/mg.":[99],"becomes":[101],"weaker":[102],"lowering":[104],"supply":[105,116],"voltage,":[106],"when":[115],"voltages":[117],"1.0":[121],"V.":[122]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}