{"id":"https://openalex.org/W3004939265","doi":"https://doi.org/10.1109/asicon47005.2019.8983531","title":"Design of CMOS integrated circuits for radiation hardening and its application to space electronics","display_name":"Design of CMOS integrated circuits for radiation hardening and its application to space electronics","publication_year":2019,"publication_date":"2019-10-01","ids":{"openalex":"https://openalex.org/W3004939265","doi":"https://doi.org/10.1109/asicon47005.2019.8983531","mag":"3004939265"},"language":"en","primary_location":{"id":"doi:10.1109/asicon47005.2019.8983531","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon47005.2019.8983531","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 13th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068662659","display_name":"Yann Deval","orcid":"https://orcid.org/0000-0002-7358-8904"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Yann Deval","raw_affiliation_strings":["Univ. Bordeaux, Bordeaux INP, CNRS UMR5218, Laboratoire IMS,Talence,France","Univ. Bordeaux, Bordeaux INP, CNRS UMR5218, Laboratoire IMS, Talence, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Bordeaux, Bordeaux INP, CNRS UMR5218, Laboratoire IMS,Talence,France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210160189"]},{"raw_affiliation_string":"Univ. Bordeaux, Bordeaux INP, CNRS UMR5218, Laboratoire IMS, Talence, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110758665","display_name":"H. Lapuyade","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Herv\u00e9 Lapuyade","raw_affiliation_strings":["Univ. Bordeaux, Bordeaux INP, CNRS UMR5218, Laboratoire IMS,Talence,France","Univ. Bordeaux, Bordeaux INP, CNRS UMR5218, Laboratoire IMS, Talence, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Bordeaux, Bordeaux INP, CNRS UMR5218, Laboratoire IMS,Talence,France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210160189"]},{"raw_affiliation_string":"Univ. Bordeaux, Bordeaux INP, CNRS UMR5218, Laboratoire IMS, Talence, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090763602","display_name":"Fran\u00e7ois Rivet","orcid":"https://orcid.org/0000-0002-6003-4208"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Fran\u00e7ois Rivet","raw_affiliation_strings":["Univ. Bordeaux, Bordeaux INP, CNRS UMR5218, Laboratoire IMS,Talence,France","Univ. Bordeaux, Bordeaux INP, CNRS UMR5218, Laboratoire IMS, Talence, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Bordeaux, Bordeaux INP, CNRS UMR5218, Laboratoire IMS,Talence,France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210160189"]},{"raw_affiliation_string":"Univ. Bordeaux, Bordeaux INP, CNRS UMR5218, Laboratoire IMS, Talence, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6709643602371216},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6698629260063171},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6604154109954834},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6169601678848267},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.5753636360168457},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.5704561471939087},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.5550598502159119},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5379311442375183},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.5281457901000977},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.47967100143432617},{"id":"https://openalex.org/keywords/radiation-hardening","display_name":"Radiation hardening","score":0.43742942810058594},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.42845314741134644},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33773916959762573}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6709643602371216},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6698629260063171},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6604154109954834},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6169601678848267},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.5753636360168457},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.5704561471939087},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.5550598502159119},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5379311442375183},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.5281457901000977},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.47967100143432617},{"id":"https://openalex.org/C119349744","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation hardening","level":3,"score":0.43742942810058594},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.42845314741134644},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33773916959762573},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon47005.2019.8983531","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon47005.2019.8983531","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 13th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4699999988079071,"id":"https://metadata.un.org/sdg/11","display_name":"Sustainable cities and communities"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1996555925","https://openalex.org/W2046974502","https://openalex.org/W2099158499","https://openalex.org/W2106163649","https://openalex.org/W2116256011","https://openalex.org/W2167698666","https://openalex.org/W4247364319","https://openalex.org/W4302341087"],"related_works":["https://openalex.org/W1603142061","https://openalex.org/W2296682797","https://openalex.org/W1917800633","https://openalex.org/W2373371022","https://openalex.org/W2015464935","https://openalex.org/W1862020018","https://openalex.org/W2490098294","https://openalex.org/W3208256281","https://openalex.org/W2357284929","https://openalex.org/W4318953393"],"abstract_inverted_index":{"This":[0],"paper":[1],"addresses":[2],"some":[3],"design":[4],"tricks":[5],"that":[6],"allow":[7],"canceling":[8],"-":[9,14],"or":[10],"at":[11],"least":[12],"reducing":[13],"the":[15,46,63],"sensitivity":[16],"of":[17,48,62],"silicon":[18],"integrated":[19],"circuits":[20,28],"to":[21,60],"radiation":[22,49],"effects.":[23],"Both":[24],"analog":[25],"and":[26,58],"digital":[27],"are":[29,55],"here":[30],"addressed.":[31],"Redundancy,":[32],"specific":[33,51],"topology,":[34],"system-level":[35],"compensation:":[36],"any":[37],"combination":[38],"is":[39],"helpful":[40],"as":[41,43,53],"long":[42],"it":[44],"avoids":[45],"implementation":[47],"hardened":[50],"technologies,":[52],"these":[54],"both":[56],"expensive":[57],"unsuited":[59],"most":[61],"state-of-the-art":[64],"building":[65],"blocks.":[66]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}