{"id":"https://openalex.org/W3005146164","doi":"https://doi.org/10.1109/asicon47005.2019.8983517","title":"An Accurate and Efficient Yield Analysis for SRAM dynamic metrics Using Differential Evolution Algorithm","display_name":"An Accurate and Efficient Yield Analysis for SRAM dynamic metrics Using Differential Evolution Algorithm","publication_year":2019,"publication_date":"2019-10-01","ids":{"openalex":"https://openalex.org/W3005146164","doi":"https://doi.org/10.1109/asicon47005.2019.8983517","mag":"3005146164"},"language":"en","primary_location":{"id":"doi:10.1109/asicon47005.2019.8983517","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon47005.2019.8983517","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 13th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012061013","display_name":"Liang Pang","orcid":"https://orcid.org/0000-0002-1535-8975"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]},{"id":"https://openalex.org/I4210090971","display_name":"Southeast University","ror":"https://ror.org/00cf0ab87","country_code":"BD","type":"education","lineage":["https://openalex.org/I4210090971"]}],"countries":["BD","CN"],"is_corresponding":true,"raw_author_name":"Liang Pang","raw_affiliation_strings":["School of Electronic Science & Engineering, Southeast University,Nanjing,210096","School of Electronic Science & Engineering, Southeast University, Nanjing"],"affiliations":[{"raw_affiliation_string":"School of Electronic Science & Engineering, Southeast University,Nanjing,210096","institution_ids":["https://openalex.org/I4210090971","https://openalex.org/I76569877"]},{"raw_affiliation_string":"School of Electronic Science & Engineering, Southeast University, Nanjing","institution_ids":["https://openalex.org/I4210090971"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051390135","display_name":"Yifan Chai","orcid":null},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]},{"id":"https://openalex.org/I4210090971","display_name":"Southeast University","ror":"https://ror.org/00cf0ab87","country_code":"BD","type":"education","lineage":["https://openalex.org/I4210090971"]}],"countries":["BD","CN"],"is_corresponding":false,"raw_author_name":"Yifan Chai","raw_affiliation_strings":["School of Microelectronics, Southeast University,Nanjing,210096","School of Microelectronics, Southeast University, Nanjing"],"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Southeast University,Nanjing,210096","institution_ids":["https://openalex.org/I76569877"]},{"raw_affiliation_string":"School of Microelectronics, Southeast University, Nanjing","institution_ids":["https://openalex.org/I4210090971"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000927466","display_name":"Mengyun Yao","orcid":null},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]},{"id":"https://openalex.org/I4210090971","display_name":"Southeast University","ror":"https://ror.org/00cf0ab87","country_code":"BD","type":"education","lineage":["https://openalex.org/I4210090971"]}],"countries":["BD","CN"],"is_corresponding":false,"raw_author_name":"Mengyun Yao","raw_affiliation_strings":["School of Microelectronics, Southeast University,Nanjing,210096","School of Microelectronics, Southeast University, Nanjing"],"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Southeast University,Nanjing,210096","institution_ids":["https://openalex.org/I76569877"]},{"raw_affiliation_string":"School of Microelectronics, Southeast University, Nanjing","institution_ids":["https://openalex.org/I4210090971"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048535242","display_name":"Yaqing Men","orcid":null},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]},{"id":"https://openalex.org/I4210090971","display_name":"Southeast University","ror":"https://ror.org/00cf0ab87","country_code":"BD","type":"education","lineage":["https://openalex.org/I4210090971"]}],"countries":["BD","CN"],"is_corresponding":false,"raw_author_name":"Yaqing Men","raw_affiliation_strings":["School of Microelectronics, Southeast University,Nanjing,210096","School of Microelectronics, Southeast University, Nanjing"],"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Southeast University,Nanjing,210096","institution_ids":["https://openalex.org/I76569877"]},{"raw_affiliation_string":"School of Microelectronics, Southeast University, Nanjing","institution_ids":["https://openalex.org/I4210090971"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080025233","display_name":"Xuexiang Wang","orcid":"https://orcid.org/0000-0002-4091-8196"},"institutions":[{"id":"https://openalex.org/I4210090971","display_name":"Southeast University","ror":"https://ror.org/00cf0ab87","country_code":"BD","type":"education","lineage":["https://openalex.org/I4210090971"]},{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["BD","CN"],"is_corresponding":false,"raw_author_name":"Xuexiang Wang","raw_affiliation_strings":["School of Electronic Science & Engineering, Southeast University,Nanjing,210096","School of Electronic Science & Engineering, Southeast University, Nanjing"],"affiliations":[{"raw_affiliation_string":"School of Electronic Science & Engineering, Southeast University,Nanjing,210096","institution_ids":["https://openalex.org/I4210090971","https://openalex.org/I76569877"]},{"raw_affiliation_string":"School of Electronic Science & Engineering, Southeast University, Nanjing","institution_ids":["https://openalex.org/I4210090971"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101499715","display_name":"Longxing Shi","orcid":"https://orcid.org/0000-0002-0629-7154"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]},{"id":"https://openalex.org/I4210090971","display_name":"Southeast University","ror":"https://ror.org/00cf0ab87","country_code":"BD","type":"education","lineage":["https://openalex.org/I4210090971"]}],"countries":["BD","CN"],"is_corresponding":false,"raw_author_name":"Longxing Shi","raw_affiliation_strings":["School of Electronic Science & Engineering, Southeast University,Nanjing,210096","School of Electronic Science & Engineering, Southeast University, Nanjing"],"affiliations":[{"raw_affiliation_string":"School of Electronic Science & Engineering, Southeast University,Nanjing,210096","institution_ids":["https://openalex.org/I4210090971","https://openalex.org/I76569877"]},{"raw_affiliation_string":"School of Electronic Science & Engineering, Southeast University, Nanjing","institution_ids":["https://openalex.org/I4210090971"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5012061013"],"corresponding_institution_ids":["https://openalex.org/I4210090971","https://openalex.org/I76569877"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16327432,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/speedup","display_name":"Speedup","score":0.7364518642425537},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6524481773376465},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.6172900795936584},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5690225958824158},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.5564996004104614},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.549836277961731},{"id":"https://openalex.org/keywords/importance-sampling","display_name":"Importance sampling","score":0.5272936820983887},{"id":"https://openalex.org/keywords/differential-evolution","display_name":"Differential evolution","score":0.4712058901786804},{"id":"https://openalex.org/keywords/word-error-rate","display_name":"Word error rate","score":0.4426146149635315},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.4394642412662506},{"id":"https://openalex.org/keywords/differential","display_name":"Differential (mechanical device)","score":0.4116147756576538},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.29447227716445923},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.19718891382217407},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.15673649311065674},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.14809763431549072},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09879925847053528}],"concepts":[{"id":"https://openalex.org/C68339613","wikidata":"https://www.wikidata.org/wiki/Q1549489","display_name":"Speedup","level":2,"score":0.7364518642425537},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6524481773376465},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.6172900795936584},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5690225958824158},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.5564996004104614},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.549836277961731},{"id":"https://openalex.org/C52740198","wikidata":"https://www.wikidata.org/wiki/Q1539564","display_name":"Importance sampling","level":3,"score":0.5272936820983887},{"id":"https://openalex.org/C74750220","wikidata":"https://www.wikidata.org/wiki/Q2662197","display_name":"Differential evolution","level":2,"score":0.4712058901786804},{"id":"https://openalex.org/C40969351","wikidata":"https://www.wikidata.org/wiki/Q3516228","display_name":"Word error rate","level":2,"score":0.4426146149635315},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.4394642412662506},{"id":"https://openalex.org/C93226319","wikidata":"https://www.wikidata.org/wiki/Q193137","display_name":"Differential (mechanical device)","level":2,"score":0.4116147756576538},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.29447227716445923},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.19718891382217407},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.15673649311065674},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.14809763431549072},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09879925847053528},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon47005.2019.8983517","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon47005.2019.8983517","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 13th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1527137186","https://openalex.org/W2033246483","https://openalex.org/W2057920591","https://openalex.org/W2067967003","https://openalex.org/W2083782718","https://openalex.org/W2119312496","https://openalex.org/W2120353978","https://openalex.org/W2142910310","https://openalex.org/W2154477062","https://openalex.org/W3139804307","https://openalex.org/W4247460323","https://openalex.org/W4256012597"],"related_works":["https://openalex.org/W4392590355","https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W2109451123","https://openalex.org/W4378977321","https://openalex.org/W1976168335","https://openalex.org/W3211992815","https://openalex.org/W2154446703"],"abstract_inverted_index":{"Accurately":[0],"and":[1,37,54,73,76,113],"efficiently":[2],"estimate":[3,85],"the":[4,10,26,32,46,52,59,81,86,103,130,136,141],"extremely":[5],"small":[6],"failure":[7,56,87],"rate":[8,88],"of":[9,69,89,96],"SRAM":[11,90,99],"cell":[12,91],"is":[13,44,133],"a":[14,67,77,97],"challenging":[15],"issue.":[16],"In":[17],"this":[18],"paper,":[19],"we":[20,65],"develop":[21],"an":[22,70],"importance":[23,35,39],"sampling":[24,36],"with":[25,120,126],"differential":[27,61],"evolution":[28],"algorithm":[29,62],"to":[30,84],"extend":[31],"minimized":[33],"norm":[34],"mixture":[38,68],"sampling.":[40],"The":[41],"key":[42],"idea":[43],"searching":[45],"optimal":[47],"shift":[48],"vector":[49],"(OSV)":[50],"in":[51],"complex":[53],"nonconvex":[55],"region":[57],"using":[58],"improved":[60],"efficiently.":[63],"Then":[64],"construct":[66],"original":[71],"distribution":[72,75,79],"uniform":[74],"distort":[78],"based":[80],"searched":[82],"OSV":[83],"accurately.":[92],"Our":[93],"experiment":[94],"results":[95],"40nm":[98],"Cell":[100],"show":[101],"that":[102],"proposed":[104],"method":[105,119],"has":[106],"achieved":[107],"1.31x-1.44x":[108],"speedup":[109],"than":[110,115,122],"state-of-art":[111],"methods":[112],"7196x":[114],"Monte":[116],"Carlo":[117],"(MC)":[118],"less":[121],"2%":[123],"error":[124,138],"compared":[125],"MC":[127],"result":[128],"when":[129],"high":[131],"accuracy":[132],"required":[134],"(e.g.,":[135],"relative":[137],"defined":[139],"by":[140],"99%":[142],"confidence":[143],"interval":[144],"reaches":[145],"5%).":[146]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}