{"id":"https://openalex.org/W3004511868","doi":"https://doi.org/10.1109/asicon47005.2019.8983491","title":"A Compact Memory Structure based on 2T1R Against Single-Event Upset in RRAM Arrays","display_name":"A Compact Memory Structure based on 2T1R Against Single-Event Upset in RRAM Arrays","publication_year":2019,"publication_date":"2019-10-01","ids":{"openalex":"https://openalex.org/W3004511868","doi":"https://doi.org/10.1109/asicon47005.2019.8983491","mag":"3004511868"},"language":"en","primary_location":{"id":"doi:10.1109/asicon47005.2019.8983491","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon47005.2019.8983491","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 13th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103257197","display_name":"Yu Ma","orcid":"https://orcid.org/0000-0003-4360-2098"},"institutions":[{"id":"https://openalex.org/I30809798","display_name":"ShanghaiTech University","ror":"https://ror.org/030bhh786","country_code":"CN","type":"education","lineage":["https://openalex.org/I30809798"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Ma","raw_affiliation_strings":["School of Information Science and Technology, Shanghaitech University,Shanghai,China,201210","School of Information Science and Technology, ShanghaiTech University, Shanghai, China, 201210"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Science and Technology, Shanghaitech University,Shanghai,China,201210","institution_ids":["https://openalex.org/I30809798"]},{"raw_affiliation_string":"School of Information Science and Technology, ShanghaiTech University, Shanghai, China, 201210","institution_ids":["https://openalex.org/I30809798"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075332879","display_name":"Dingcheng Jia","orcid":null},"institutions":[{"id":"https://openalex.org/I30809798","display_name":"ShanghaiTech University","ror":"https://ror.org/030bhh786","country_code":"CN","type":"education","lineage":["https://openalex.org/I30809798"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dingcheng Jia","raw_affiliation_strings":["School of Information Science and Technology, Shanghaitech University,Shanghai,China,201210","School of Information Science and Technology, ShanghaiTech University, Shanghai, China, 201210"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Science and Technology, Shanghaitech University,Shanghai,China,201210","institution_ids":["https://openalex.org/I30809798"]},{"raw_affiliation_string":"School of Information Science and Technology, ShanghaiTech University, Shanghai, China, 201210","institution_ids":["https://openalex.org/I30809798"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004921424","display_name":"Huifan Zhang","orcid":"https://orcid.org/0000-0002-5892-931X"},"institutions":[{"id":"https://openalex.org/I30809798","display_name":"ShanghaiTech University","ror":"https://ror.org/030bhh786","country_code":"CN","type":"education","lineage":["https://openalex.org/I30809798"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huifan Zhang","raw_affiliation_strings":["School of Information Science and Technology, Shanghaitech University,Shanghai,China,201210","School of Information Science and Technology, ShanghaiTech University, Shanghai, China, 201210"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Science and Technology, Shanghaitech University,Shanghai,China,201210","institution_ids":["https://openalex.org/I30809798"]},{"raw_affiliation_string":"School of Information Science and Technology, ShanghaiTech University, Shanghai, China, 201210","institution_ids":["https://openalex.org/I30809798"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100653710","display_name":"Ruoyu Wang","orcid":"https://orcid.org/0000-0002-7091-0291"},"institutions":[{"id":"https://openalex.org/I30809798","display_name":"ShanghaiTech University","ror":"https://ror.org/030bhh786","country_code":"CN","type":"education","lineage":["https://openalex.org/I30809798"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ruoyu Wang","raw_affiliation_strings":["School of Information Science and Technology, Shanghaitech University,Shanghai,China,201210","School of Information Science and Technology, ShanghaiTech University, Shanghai, China, 201210"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Science and Technology, Shanghaitech University,Shanghai,China,201210","institution_ids":["https://openalex.org/I30809798"]},{"raw_affiliation_string":"School of Information Science and Technology, ShanghaiTech University, Shanghai, China, 201210","institution_ids":["https://openalex.org/I30809798"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081772659","display_name":"Pingqiang Zhou","orcid":"https://orcid.org/0000-0001-9515-9302"},"institutions":[{"id":"https://openalex.org/I30809798","display_name":"ShanghaiTech University","ror":"https://ror.org/030bhh786","country_code":"CN","type":"education","lineage":["https://openalex.org/I30809798"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pingqiang Zhou","raw_affiliation_strings":["School of Information Science and Technology, Shanghaitech University,Shanghai,China,201210","School of Information Science and Technology, ShanghaiTech University, Shanghai, China, 201210"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Science and Technology, Shanghaitech University,Shanghai,China,201210","institution_ids":["https://openalex.org/I30809798"]},{"raw_affiliation_string":"School of Information Science and Technology, ShanghaiTech University, Shanghai, China, 201210","institution_ids":["https://openalex.org/I30809798"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I30809798"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.23891097,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":"2019","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reset","display_name":"Reset (finance)","score":0.8373022079467773},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.8283112049102783},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.7454428672790527},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.625912070274353},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6117614507675171},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.592042088508606},{"id":"https://openalex.org/keywords/array-data-structure","display_name":"Array data structure","score":0.5627428293228149},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.5362116098403931},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4552307724952698},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.4502342641353607},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.449550986289978},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.41934698820114136},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3940340578556061},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.34935975074768066},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30716174840927124},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.183843195438385},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1585831344127655},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10520613193511963}],"concepts":[{"id":"https://openalex.org/C2779795794","wikidata":"https://www.wikidata.org/wiki/Q7315343","display_name":"Reset (finance)","level":2,"score":0.8373022079467773},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.8283112049102783},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.7454428672790527},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.625912070274353},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6117614507675171},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.592042088508606},{"id":"https://openalex.org/C146064661","wikidata":"https://www.wikidata.org/wiki/Q186152","display_name":"Array data structure","level":2,"score":0.5627428293228149},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.5362116098403931},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4552307724952698},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.4502342641353607},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.449550986289978},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41934698820114136},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3940340578556061},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.34935975074768066},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30716174840927124},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.183843195438385},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1585831344127655},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10520613193511963},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C106159729","wikidata":"https://www.wikidata.org/wiki/Q2294553","display_name":"Financial economics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/asicon47005.2019.8983491","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon47005.2019.8983491","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 13th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},{"id":"mag:3087161499","is_oa":false,"landing_page_url":"https://jglobal.jst.go.jp/en/detail?JGLOBAL_ID=202002244553301307","pdf_url":null,"source":{"id":"https://openalex.org/S4306512817","display_name":"IEEE Conference Proceedings","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":"IEEE Conference Proceedings","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8899999856948853,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1663597234","https://openalex.org/W2032965366","https://openalex.org/W2162279286","https://openalex.org/W2553657511","https://openalex.org/W2802305152"],"related_works":["https://openalex.org/W4312903428","https://openalex.org/W2621306919","https://openalex.org/W1966944787","https://openalex.org/W2102538861","https://openalex.org/W2032785938","https://openalex.org/W2765704306","https://openalex.org/W2123934961","https://openalex.org/W3185106882","https://openalex.org/W2909760123","https://openalex.org/W1540420234"],"abstract_inverted_index":{"The":[0],"single-event":[1],"upset":[2],"(SEU)":[3],"has":[4],"significant":[5],"influence":[6],"on":[7,27],"the":[8,32,39,46,52,61,82,91],"reliability":[9],"of":[10,63,70,78,84],"1-transistor-1-RRAM":[11],"(1T1R)":[12],"array":[13,41,57],"due":[14],"to":[15,90],"heavy":[16],"ion":[17],"strikes.":[18],"This":[19],"paper":[20],"proposes":[21],"a":[22],"compact":[23],"memory":[24],"structure":[25,48],"based":[26],"2-transistor-1-RRAM":[28],"(2T1R),":[29],"which":[30],"exploits":[31],"signal":[33],"space":[34],"between":[35],"adjacent":[36],"cells":[37],"in":[38,55],"RRAM":[40,56],"structure.":[42,93],"Results":[43],"show":[44],"that":[45],"proposed":[47],"can":[49],"successfully":[50],"alleviate":[51],"SEU":[53],"effect":[54],"-":[58],"it":[59],"eliminates":[60],"overhead":[62,88],"1ns":[64],"delay":[65,77],"and":[66],"400pJ":[67],"power":[68],"consumption":[69],"READ":[71],"operation,":[72,80],"as":[73,75],"well":[74],"2ns":[76],"RESET":[79],"at":[81],"cost":[83],"only":[85],"1.9%":[86],"area":[87],"compared":[89],"1T2R":[92]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}