{"id":"https://openalex.org/W3004784283","doi":"https://doi.org/10.1109/asicon47005.2019.8983446","title":"Low-Dropout Regulator design with a simple structure for good high frequency PSRR performance based on Bandgap Circuit","display_name":"Low-Dropout Regulator design with a simple structure for good high frequency PSRR performance based on Bandgap Circuit","publication_year":2019,"publication_date":"2019-10-01","ids":{"openalex":"https://openalex.org/W3004784283","doi":"https://doi.org/10.1109/asicon47005.2019.8983446","mag":"3004784283"},"language":"en","primary_location":{"id":"doi:10.1109/asicon47005.2019.8983446","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon47005.2019.8983446","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 13th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086237798","display_name":"Xiaozhi Kang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiaozhi Kang","raw_affiliation_strings":["Shanghai IC R&D Center,Process Technology Department,Shanghai,China,201210","State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,200433","State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Shanghai IC R&D Center,Process Technology Department,Shanghai,China,201210","institution_ids":[]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,200433","institution_ids":["https://openalex.org/I4210132426"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4391767673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029704645","display_name":"Xiaoxu Kang","orcid":"https://orcid.org/0000-0001-8244-8279"},"institutions":[{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoxu Kang","raw_affiliation_strings":["Shanghai IC R&D Center,Process Technology Department,Shanghai,China,201210","State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,200433","Process Technology Department, Shanghai IC R&D Center, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Shanghai IC R&D Center,Process Technology Department,Shanghai,China,201210","institution_ids":[]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,200433","institution_ids":["https://openalex.org/I4210132426"]},{"raw_affiliation_string":"Process Technology Department, Shanghai IC R&D Center, Shanghai, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085850030","display_name":"Zijian Zhao","orcid":"https://orcid.org/0000-0002-1517-0884"},"institutions":[{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zijian Zhao","raw_affiliation_strings":["State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,200433","State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,200433","institution_ids":["https://openalex.org/I4210132426"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4391767673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079803991","display_name":"Jingxiu Ding","orcid":null},"institutions":[{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingxiu Ding","raw_affiliation_strings":["State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,200433","State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,200433","institution_ids":["https://openalex.org/I4210132426"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4391767673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101972729","display_name":"Yi Hu","orcid":"https://orcid.org/0000-0003-4543-9853"},"institutions":[{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Hu","raw_affiliation_strings":["State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,200433","State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,200433","institution_ids":["https://openalex.org/I4210132426"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4391767673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100535972","display_name":"Dapeng Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dapeng Xu","raw_affiliation_strings":["State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,200433","State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,200433","institution_ids":["https://openalex.org/I4210132426"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4391767673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100427505","display_name":"Qingqing Sun","orcid":"https://orcid.org/0000-0002-6533-1834"},"institutions":[{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qingqing Sun","raw_affiliation_strings":["State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,200433","State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,200433","institution_ids":["https://openalex.org/I4210132426"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4391767673"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070642012","display_name":"David Wei Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"David Wei Zhang","raw_affiliation_strings":["State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,200433","State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University,Shanghai,China,200433","institution_ids":["https://openalex.org/I4210132426"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4391767673"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5086237798"],"corresponding_institution_ids":["https://openalex.org/I24943067","https://openalex.org/I4210132426","https://openalex.org/I4391767673"],"apc_list":null,"apc_paid":null,"fwci":0.0978,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.46049851,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-supply-rejection-ratio","display_name":"Power supply rejection ratio","score":0.9589229822158813},{"id":"https://openalex.org/keywords/low-dropout-regulator","display_name":"Low-dropout regulator","score":0.7329629063606262},{"id":"https://openalex.org/keywords/bandgap-voltage-reference","display_name":"Bandgap voltage reference","score":0.6597460508346558},{"id":"https://openalex.org/keywords/regulator","display_name":"Regulator","score":0.6326306462287903},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6104581952095032},{"id":"https://openalex.org/keywords/dropout-voltage","display_name":"Dropout voltage","score":0.5431221723556519},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5032429099082947},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.432742178440094},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.39377856254577637},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.37417057156562805},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35767751932144165},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.3563084304332733},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25519120693206787},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.06424298882484436}],"concepts":[{"id":"https://openalex.org/C15892472","wikidata":"https://www.wikidata.org/wiki/Q1482413","display_name":"Power supply rejection ratio","level":4,"score":0.9589229822158813},{"id":"https://openalex.org/C140501009","wikidata":"https://www.wikidata.org/wiki/Q6692746","display_name":"Low-dropout regulator","level":5,"score":0.7329629063606262},{"id":"https://openalex.org/C127033052","wikidata":"https://www.wikidata.org/wiki/Q48635","display_name":"Bandgap voltage reference","level":5,"score":0.6597460508346558},{"id":"https://openalex.org/C6929976","wikidata":"https://www.wikidata.org/wiki/Q3771881","display_name":"Regulator","level":3,"score":0.6326306462287903},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6104581952095032},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.5431221723556519},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5032429099082947},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.432742178440094},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.39377856254577637},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.37417057156562805},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35767751932144165},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.3563084304332733},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25519120693206787},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.06424298882484436},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon47005.2019.8983446","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon47005.2019.8983446","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 13th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7200000286102295,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1543455109","https://openalex.org/W2034720635","https://openalex.org/W2057577136","https://openalex.org/W2157204167","https://openalex.org/W2158426860","https://openalex.org/W6682985981"],"related_works":["https://openalex.org/W2347289947","https://openalex.org/W2388657413","https://openalex.org/W2348622193","https://openalex.org/W2348464439","https://openalex.org/W2038852706","https://openalex.org/W2359920985","https://openalex.org/W2225727459","https://openalex.org/W2391314465","https://openalex.org/W2563838980","https://openalex.org/W2530387006"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"an":[3],"op-amp":[4,27,64],"free":[5,65],"low-dropout":[6],"regulator":[7],"with":[8,81],"a":[9,13,50,58,88,95,104],"high":[10,21,38,52],"PSRR":[11,22,54,105],"over":[12],"broad":[14],"frequency":[15,53],"range.":[16],"The":[17,63,77],"design":[18],"merges":[19],"the":[20,33,43,75],"bandgap":[23],"and":[24,29,93,110],"LDO":[25,66,102],"without":[26],"involved":[28],"thus":[30],"greatly":[31],"reduces":[32],"silicon":[34],"area.":[35],"As":[36],"no":[37],"impedence":[39],"node":[40],"engaged":[41],"in":[42,74],"circuit,":[44],"it":[45],"is":[46,67,79],"easy":[47],"to":[48],"achieve":[49],"good":[51],"performance":[55],"by":[56,70],"using":[57],"locally":[59],"regulated":[60],"supply":[61],"voltage.":[62],"then":[68],"developed":[69],"embedding":[71],"replica":[72],"technique":[73],"bandgap.":[76],"circuit":[78],"evaluated":[80],"HHGrace":[82],"0.35\u03bcm":[83],"CMOS":[84],"technology.":[85],"It":[86],"generates":[87],"reference":[89],"voltage":[90],"of":[91,98,106],"1.152V":[92],"has":[94,103],"temperature":[96],"coefficient":[97],"0.01mV/K":[99],"at":[100,108,113],"27C.":[101],"-96dB":[107],"DC":[109],"still":[111],"-48.5dB":[112],"1MHz.":[114]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}