{"id":"https://openalex.org/W2783879622","doi":"https://doi.org/10.1109/asicon.2017.8252636","title":"A 3600 \u00d7 3600 large-scale ISFET sensor array for high-throughput pH sensing","display_name":"A 3600 \u00d7 3600 large-scale ISFET sensor array for high-throughput pH sensing","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2783879622","doi":"https://doi.org/10.1109/asicon.2017.8252636","mag":"2783879622"},"language":"en","primary_location":{"id":"doi:10.1109/asicon.2017.8252636","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2017.8252636","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 12th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037938209","display_name":"Yongxin Cong","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yongxin Cong","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034895563","display_name":"Ming Xu","orcid":"https://orcid.org/0000-0003-4341-2358"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ming Xu","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085045773","display_name":"Dan Zhao","orcid":"https://orcid.org/0000-0003-2877-3104"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dan Zhao","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113454209","display_name":"Dongping Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dongping Wu","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5037938209"],"corresponding_institution_ids":["https://openalex.org/I24943067"],"apc_list":null,"apc_paid":null,"fwci":1.095,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.77289751,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"957","last_page":"960"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/isfet","display_name":"ISFET","score":0.9812726974487305},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7351365089416504},{"id":"https://openalex.org/keywords/throughput","display_name":"Throughput","score":0.5952184200286865},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5805575847625732},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.575350821018219},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.560576856136322},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5374525189399719},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5328227877616882},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.5217576622962952},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.47190552949905396},{"id":"https://openalex.org/keywords/sensor-array","display_name":"Sensor array","score":0.44831186532974243},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.43112194538116455},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3396143317222595},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3254357874393463},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.27579325437545776},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1983059048652649},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11558747291564941},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.06662794947624207}],"concepts":[{"id":"https://openalex.org/C154275363","wikidata":"https://www.wikidata.org/wiki/Q904133","display_name":"ISFET","level":5,"score":0.9812726974487305},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7351365089416504},{"id":"https://openalex.org/C157764524","wikidata":"https://www.wikidata.org/wiki/Q1383412","display_name":"Throughput","level":3,"score":0.5952184200286865},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5805575847625732},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.575350821018219},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.560576856136322},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5374525189399719},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5328227877616882},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.5217576622962952},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.47190552949905396},{"id":"https://openalex.org/C66251956","wikidata":"https://www.wikidata.org/wiki/Q7451086","display_name":"Sensor array","level":2,"score":0.44831186532974243},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.43112194538116455},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3396143317222595},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3254357874393463},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.27579325437545776},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1983059048652649},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11558747291564941},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.06662794947624207},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon.2017.8252636","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2017.8252636","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 12th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/6","score":0.49000000953674316,"display_name":"Clean water and sanitation"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1988929438","https://openalex.org/W2028403508","https://openalex.org/W2032168109","https://openalex.org/W2039309249","https://openalex.org/W2081484203","https://openalex.org/W2106026808","https://openalex.org/W2119399232","https://openalex.org/W2138270253","https://openalex.org/W2467093478","https://openalex.org/W4391305802"],"related_works":["https://openalex.org/W2063174160","https://openalex.org/W1997963871","https://openalex.org/W4250442938","https://openalex.org/W2333264988","https://openalex.org/W4250415373","https://openalex.org/W2022856681","https://openalex.org/W2031348296","https://openalex.org/W2307187547","https://openalex.org/W2083672075","https://openalex.org/W1923276224"],"abstract_inverted_index":{"This":[0,64],"paper":[1],"presents":[2],"a":[3,31],"large-scale":[4],"ion-sensitive":[5],"field":[6],"effect":[7],"transistor":[8],"(ISFET)":[9],"array":[10,21,72],"chip":[11,73],"for":[12],"pH":[13,38,52],"sensing.":[14],"A":[15,51],"3600":[16],"\u00d7":[17],"3600-pixel":[18],"ISFET":[19,71],"sensor":[20],"and":[22,28,68,87],"corresponding":[23],"readout":[24],"circuitry":[25],"are":[26],"designed":[27],"fabricated":[29],"using":[30],"conventional":[32],"0.18-\u03bcm":[33],"CMOS":[34,66],"process":[35],"flow.":[36],"High-throughput":[37],"sensing":[39],"is":[40,57],"achieved":[41,58],"with":[42],"real-time":[43],"data":[44],"acquisition":[45],"of":[46,54],"26":[47],"frame":[48],"per":[49],"second.":[50],"sensitivity":[53],"73.56":[55],"mV/pH":[56],"owing":[59],"to":[60,77],"the":[61],"in-pixel":[62],"amplification.":[63],"high-density,":[65],"compatible":[67],"cost":[69],"efficient":[70],"has":[74],"great":[75],"potential":[76],"be":[78],"used":[79],"in":[80],"applications":[81],"such":[82],"as":[83],"semiconductor":[84],"DNA":[85],"detection":[86],"sequencing.":[88]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}