{"id":"https://openalex.org/W2784180364","doi":"https://doi.org/10.1109/asicon.2017.8252517","title":"A universal approach for signal dependent circuit reliability simulation","display_name":"A universal approach for signal dependent circuit reliability simulation","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2784180364","doi":"https://doi.org/10.1109/asicon.2017.8252517","mag":"2784180364"},"language":"en","primary_location":{"id":"doi:10.1109/asicon.2017.8252517","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2017.8252517","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 12th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100781975","display_name":"Lining Zhang","orcid":"https://orcid.org/0000-0003-1472-7852"},"institutions":[{"id":"https://openalex.org/I200769079","display_name":"Hong Kong University of Science and Technology","ror":"https://ror.org/00q4vv597","country_code":"HK","type":"education","lineage":["https://openalex.org/I200769079"]},{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Lining Zhang","raw_affiliation_strings":["Department of the Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Hong Kong"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of the Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Hong Kong","institution_ids":["https://openalex.org/I200769079","https://openalex.org/I889458895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102164917","display_name":"Chenyue Ma","orcid":null},"institutions":[{"id":"https://openalex.org/I200769079","display_name":"Hong Kong University of Science and Technology","ror":"https://ror.org/00q4vv597","country_code":"HK","type":"education","lineage":["https://openalex.org/I200769079"]},{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Chenyue Ma","raw_affiliation_strings":["Department of the Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Hong Kong"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of the Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Hong Kong","institution_ids":["https://openalex.org/I200769079","https://openalex.org/I889458895"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056796025","display_name":"Mansun Chan","orcid":"https://orcid.org/0000-0002-5104-7410"},"institutions":[{"id":"https://openalex.org/I200769079","display_name":"Hong Kong University of Science and Technology","ror":"https://ror.org/00q4vv597","country_code":"HK","type":"education","lineage":["https://openalex.org/I200769079"]},{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Mansun Chan","raw_affiliation_strings":["Department of the Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Hong Kong"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of the Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Hong Kong","institution_ids":["https://openalex.org/I200769079","https://openalex.org/I889458895"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.24573232,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"32","issue":null,"first_page":"476","last_page":"479"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.8031581044197083},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.7310017347335815},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7279707193374634},{"id":"https://openalex.org/keywords/trace","display_name":"TRACE (psycholinguistics)","score":0.5645195841789246},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.5517334342002869},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5420030951499939},{"id":"https://openalex.org/keywords/electronic-circuit-simulation","display_name":"Electronic circuit simulation","score":0.5040306448936462},{"id":"https://openalex.org/keywords/dynamic-simulation","display_name":"Dynamic simulation","score":0.46710196137428284},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4090181589126587},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3691736161708832},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.2804346978664398},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.23260587453842163},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13978981971740723},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07423704862594604}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.8031581044197083},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.7310017347335815},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7279707193374634},{"id":"https://openalex.org/C75291252","wikidata":"https://www.wikidata.org/wiki/Q1315756","display_name":"TRACE (psycholinguistics)","level":2,"score":0.5645195841789246},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.5517334342002869},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5420030951499939},{"id":"https://openalex.org/C46205389","wikidata":"https://www.wikidata.org/wiki/Q1270401","display_name":"Electronic circuit simulation","level":3,"score":0.5040306448936462},{"id":"https://openalex.org/C149808339","wikidata":"https://www.wikidata.org/wiki/Q5319019","display_name":"Dynamic simulation","level":2,"score":0.46710196137428284},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4090181589126587},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3691736161708832},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.2804346978664398},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.23260587453842163},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13978981971740723},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07423704862594604},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/asicon.2017.8252517","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2017.8252517","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 12th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},{"id":"pmh:oai:repository.hkust.edu.hk:1783.1-89123","is_oa":false,"landing_page_url":"http://repository.hkust.edu.hk/ir/Record/1783.1-89123","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Conference paper"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320326427","display_name":"Innovation and Technology Fund","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2096995644"],"related_works":["https://openalex.org/W2061122711","https://openalex.org/W4247954915","https://openalex.org/W2131958170","https://openalex.org/W2273754158","https://openalex.org/W2005671831","https://openalex.org/W2119874545","https://openalex.org/W2143645596","https://openalex.org/W2575977716","https://openalex.org/W3215065089","https://openalex.org/W1677338447"],"abstract_inverted_index":{"A":[0,57],"simulation":[1,18,41,49,96],"framework":[2,80],"to":[3,20,60,88],"capture":[4],"the":[5,27,47,62,64,93],"dynamic":[6,68],"evolution":[7],"of":[8,14],"circuit":[9,86],"degradation":[10,31],"is":[11,76],"described.":[12,78],"Instead":[13],"using":[15,24],"an":[16],"additional":[17],"loop":[19,50],"perform":[21],"reliability":[22,40,95],"verification":[23],"degraded":[25],"parameters,":[26],"time":[28,53],"dependent":[29,54],"parameter":[30,55],"can":[32,42],"be":[33,44],"implemented":[34,83],"inside":[35],"a":[36,85],"compact":[37],"model.":[38],"The":[39,79],"then":[43],"performed":[45],"in":[46],"main":[48],"by":[51],"incorporating":[52],"degradation.":[56],"new":[58],"methodology":[59],"evaluate":[61],"trace":[63],"performance":[65],"drift":[66],"under":[67],"changing":[69],"signal":[70],"based":[71],"on":[72],"statically":[73],"extracted":[74],"parameters":[75],"also":[77],"has":[81],"been":[82],"into":[84],"simulator":[87],"demonstrate":[89],"its":[90],"advantages":[91],"over":[92],"existing":[94],"approach.":[97]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}