{"id":"https://openalex.org/W2484323985","doi":"https://doi.org/10.1109/asicon.2015.7517110","title":"A calibration technique for SAR ADC based on code density test","display_name":"A calibration technique for SAR ADC based on code density test","publication_year":2015,"publication_date":"2015-11-01","ids":{"openalex":"https://openalex.org/W2484323985","doi":"https://doi.org/10.1109/asicon.2015.7517110","mag":"2484323985"},"language":"en","primary_location":{"id":"doi:10.1109/asicon.2015.7517110","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2015.7517110","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 11th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111175909","display_name":"Xian Gu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xian Gu","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028865772","display_name":"Xiuju He","orcid":"https://orcid.org/0000-0003-0141-9906"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiuju He","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084959547","display_name":"Fule Li","orcid":"https://orcid.org/0000-0002-7341-7240"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fule Li","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.1984,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.8036496,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.9298644661903381},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.7924332022666931},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.609778106212616},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5526198744773865},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5472474098205566},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4774649441242218},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.4738776385784149},{"id":"https://openalex.org/keywords/analog-to-digital-converter","display_name":"Analog-to-digital converter","score":0.41497525572776794},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.4113316237926483},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.33591610193252563},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18338671326637268},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18201154470443726},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.16021406650543213},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14764347672462463},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14098063111305237}],"concepts":[{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.9298644661903381},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.7924332022666931},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.609778106212616},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5526198744773865},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5472474098205566},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4774649441242218},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.4738776385784149},{"id":"https://openalex.org/C2777271169","wikidata":"https://www.wikidata.org/wiki/Q190169","display_name":"Analog-to-digital converter","level":3,"score":0.41497525572776794},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.4113316237926483},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.33591610193252563},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18338671326637268},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18201154470443726},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16021406650543213},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14764347672462463},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14098063111305237},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon.2015.7517110","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2015.7517110","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 11th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5699999928474426,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2126669347","https://openalex.org/W2170331687","https://openalex.org/W6678584265"],"related_works":["https://openalex.org/W2904640696","https://openalex.org/W2752640128","https://openalex.org/W2278942241","https://openalex.org/W2568520569","https://openalex.org/W4206356469","https://openalex.org/W2368405386","https://openalex.org/W3015687113","https://openalex.org/W4295789136","https://openalex.org/W2341231357","https://openalex.org/W2186189745"],"abstract_inverted_index":{"A":[0,77],"foreground":[1],"calibration":[2,17,38,90],"for":[3],"successive":[4],"approximation":[5],"register":[6],"analog-to-digital":[7],"converter":[8],"(SAR":[9],"ADC)":[10],"is":[11,19,50,86,92],"introduced":[12],"in":[13,29,94],"this":[14],"paper.":[15],"This":[16],"system":[18],"based":[20,69],"on":[21,48,70],"the":[22,30,37,53,66,71,89,103,107,112],"fact":[23],"that":[24,102],"capacitor":[25],"mismatch":[26],"can":[27],"result":[28,72],"discontinuity":[31],"of":[32,73,106],"output":[33],"code":[34,74],"density.":[35],"In":[36],"mode,":[39],"a":[40,44,57,61,95],"triangular":[41],"signal":[42],"with":[43,81],"small":[45],"swing":[46],"generated":[47],"chip":[49],"input":[51],"and":[52,60,111,122,128],"Calibration":[54],"Controller":[55],"utilizes":[56],"data":[58],"comparator":[59],"SAR":[62,97],"logic":[63],"to":[64,119],"trim":[65],"MSB":[67],"capacitors":[68],"density":[75],"test.":[76],"MATLAB":[78],"behavioral":[79],"simulation":[80],"30":[82],"times":[83],"Monte":[84],"Carlo":[85],"done":[87],"when":[88],"method":[91],"applied":[93],"10-bit":[96],"ADC.":[98],"Simulation":[99],"results":[100],"show":[101],"mean":[104],"values":[105],"signal-to-noise-plus-distortion":[108],"ratio":[109],"(SNDR)":[110],"spurious-free":[113],"dynamic":[114],"range":[115],"(SFDR)":[116],"are":[117],"improved":[118],"63.24":[120],"dB":[121,124,127],"70.61":[123],"from":[125],"53.61":[126],"59.23":[129],"dB,":[130],"respectively.":[131]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}