{"id":"https://openalex.org/W2502664435","doi":"https://doi.org/10.1109/asicon.2015.7517100","title":"A hall sensor microsystem for current measurement used in watt-hour meter","display_name":"A hall sensor microsystem for current measurement used in watt-hour meter","publication_year":2015,"publication_date":"2015-11-01","ids":{"openalex":"https://openalex.org/W2502664435","doi":"https://doi.org/10.1109/asicon.2015.7517100","mag":"2502664435"},"language":"en","primary_location":{"id":"doi:10.1109/asicon.2015.7517100","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2015.7517100","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 11th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012923675","display_name":"Wenhao Xu","orcid":"https://orcid.org/0000-0003-1735-3956"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenhao Xu","raw_affiliation_strings":["School of Microelectronics, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100543068","display_name":"Xunhua Guo","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xunhua Guo","raw_affiliation_strings":["School of Microelectronics, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101931827","display_name":"Jinling Chen","orcid":"https://orcid.org/0000-0002-3245-2613"},"institutions":[{"id":"https://openalex.org/I4210090830","display_name":"Kolon Industries (South Korea)","ror":"https://ror.org/00btywz65","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210090830"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jinling Chen","raw_affiliation_strings":["Wasion Group Limited, Changsha"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wasion Group Limited, Changsha","institution_ids":["https://openalex.org/I4210090830"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087716003","display_name":"Guoxing Wang","orcid":"https://orcid.org/0000-0002-0235-1475"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guoxing Wang","raw_affiliation_strings":["School of Microelectronics, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hall-effect-sensor","display_name":"Hall effect sensor","score":0.8981157541275024},{"id":"https://openalex.org/keywords/microsystem","display_name":"Microsystem","score":0.7976523637771606},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.7376987934112549},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.7090423107147217},{"id":"https://openalex.org/keywords/hall-effect","display_name":"Hall effect","score":0.6550291776657104},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5987510085105896},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5475094318389893},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4948250651359558},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4511682987213135},{"id":"https://openalex.org/keywords/input-offset-voltage","display_name":"Input offset voltage","score":0.44677284359931946},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4445640742778778},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.43097835779190063},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.4286521375179291},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.42217472195625305},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.2957685589790344},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.29155218601226807},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.1246759295463562},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.11365014314651489},{"id":"https://openalex.org/keywords/electrical-resistivity-and-conductivity","display_name":"Electrical resistivity and conductivity","score":0.10108950734138489}],"concepts":[{"id":"https://openalex.org/C107637996","wikidata":"https://www.wikidata.org/wiki/Q1431247","display_name":"Hall effect sensor","level":3,"score":0.8981157541275024},{"id":"https://openalex.org/C151054161","wikidata":"https://www.wikidata.org/wiki/Q379385","display_name":"Microsystem","level":2,"score":0.7976523637771606},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.7376987934112549},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.7090423107147217},{"id":"https://openalex.org/C134112204","wikidata":"https://www.wikidata.org/wiki/Q10656","display_name":"Hall effect","level":3,"score":0.6550291776657104},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5987510085105896},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5475094318389893},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4948250651359558},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4511682987213135},{"id":"https://openalex.org/C63651839","wikidata":"https://www.wikidata.org/wiki/Q478566","display_name":"Input offset voltage","level":5,"score":0.44677284359931946},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4445640742778778},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.43097835779190063},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.4286521375179291},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.42217472195625305},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2957685589790344},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.29155218601226807},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1246759295463562},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.11365014314651489},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.10108950734138489},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon.2015.7517100","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2015.7517100","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 11th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7900000214576721}],"awards":[],"funders":[{"id":"https://openalex.org/F4320335967","display_name":"Science and Technology Project of State Grid","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2014034928","https://openalex.org/W2059217543","https://openalex.org/W2068200693","https://openalex.org/W2104295662","https://openalex.org/W2111146447","https://openalex.org/W2129952074","https://openalex.org/W2144363007","https://openalex.org/W2160403268","https://openalex.org/W2178912108","https://openalex.org/W2331632140"],"related_works":["https://openalex.org/W1986634776","https://openalex.org/W3162919010","https://openalex.org/W2622830326","https://openalex.org/W2089541377","https://openalex.org/W3130636831","https://openalex.org/W2151516162","https://openalex.org/W2094461049","https://openalex.org/W2906319801","https://openalex.org/W1517482417","https://openalex.org/W2106084719"],"abstract_inverted_index":{"A":[0],"Hall":[1,15,32,60,88],"sensor":[2,16,33,61],"is":[3],"widely":[4],"used":[5],"in":[6],"automotive":[7],"and":[8,25,39,82],"industrial":[9],"applications.":[10],"However,":[11],"the":[12,20,47,56,59,73],"design":[13],"of":[14,22,58],"on":[17],"silicon":[18],"faces":[19],"challenges":[21],"temperature":[23],"drifting":[24],"DC":[26],"offset.":[27],"This":[28],"paper":[29],"presents":[30],"a":[31,94,100],"microsystem":[34],"with":[35,86,99],"continuous":[36],"sensitivity":[37,75],"auto-calibration":[38],"offset":[40,57],"voltage":[41,63],"compensation,":[42],"which":[43],"do":[44],"not":[45],"disturb":[46],"sensor's":[48],"normal":[49],"operation.":[50],"It":[51],"has":[52,64],"been":[53,65,91],"shown":[54],"that":[55],"output":[62],"minimized":[66],"to":[67],"be":[68,77],"less":[69],"than":[70],"5mV.":[71],"Moreover,":[72],"system":[74],"can":[76],"fully":[78],"programmed,":[79],"between":[80],"60V/T":[81],"200V/T.":[83],"The":[84],"circuits":[85],"on-chip":[87],"plates":[89],"have":[90],"implemented":[92],"using":[93],"3.3V":[95],"0.35\u03bcm":[96],"CMOS":[97],"process":[98],"12.25mm":[101],"<sup":[102],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[103],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[104],"area.":[105]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}