{"id":"https://openalex.org/W2491766355","doi":"https://doi.org/10.1109/asicon.2015.7516965","title":"A 30-GHz to 39-GHz mm-Wave low-power injection-locked frequency divider in 65nm CMOS","display_name":"A 30-GHz to 39-GHz mm-Wave low-power injection-locked frequency divider in 65nm CMOS","publication_year":2015,"publication_date":"2015-11-01","ids":{"openalex":"https://openalex.org/W2491766355","doi":"https://doi.org/10.1109/asicon.2015.7516965","mag":"2491766355"},"language":"en","primary_location":{"id":"doi:10.1109/asicon.2015.7516965","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2015.7516965","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 11th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065040593","display_name":"Guangyao Zhou","orcid":"https://orcid.org/0000-0002-8966-4617"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guangyao Zhou","raw_affiliation_strings":["State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063433812","display_name":"Shunli Ma","orcid":"https://orcid.org/0000-0002-2737-9845"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shunli Ma","raw_affiliation_strings":["State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002438352","display_name":"Fazhi An","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fazhi An","raw_affiliation_strings":["State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100710683","display_name":"Ning Li","orcid":"https://orcid.org/0000-0003-0294-1747"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ning Li","raw_affiliation_strings":["Department of Microelectronics, Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067","https://openalex.org/I4210132426"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025053306","display_name":"Fan Ye","orcid":"https://orcid.org/0000-0002-1089-1498"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fan Ye","raw_affiliation_strings":["Department of Microelectronics, Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067","https://openalex.org/I4210132426"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016448886","display_name":"Junyan Ren","orcid":"https://orcid.org/0000-0002-7799-6251"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junyan Ren","raw_affiliation_strings":["Department of Microelectronics, Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067","https://openalex.org/I4210132426"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/frequency-divider","display_name":"Frequency divider","score":0.7809836864471436},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7143323421478271},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.7097738981246948},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.5834643840789795},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5300875306129456},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5275577902793884},{"id":"https://openalex.org/keywords/voltage-divider","display_name":"Voltage divider","score":0.4937351644039154},{"id":"https://openalex.org/keywords/current-divider","display_name":"Current divider","score":0.4478970170021057},{"id":"https://openalex.org/keywords/frequency-multiplier","display_name":"Frequency multiplier","score":0.44073182344436646},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3685934543609619},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.36533528566360474}],"concepts":[{"id":"https://openalex.org/C74982907","wikidata":"https://www.wikidata.org/wiki/Q1455624","display_name":"Frequency divider","level":3,"score":0.7809836864471436},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7143323421478271},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.7097738981246948},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.5834643840789795},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5300875306129456},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5275577902793884},{"id":"https://openalex.org/C49324399","wikidata":"https://www.wikidata.org/wiki/Q466758","display_name":"Voltage divider","level":3,"score":0.4937351644039154},{"id":"https://openalex.org/C97264828","wikidata":"https://www.wikidata.org/wiki/Q4157078","display_name":"Current divider","level":4,"score":0.4478970170021057},{"id":"https://openalex.org/C146002875","wikidata":"https://www.wikidata.org/wiki/Q1074289","display_name":"Frequency multiplier","level":3,"score":0.44073182344436646},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3685934543609619},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.36533528566360474}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon.2015.7516965","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2015.7516965","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 11th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8899999856948853,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320335773","display_name":"National High-tech Research and Development Program","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1972750347","https://openalex.org/W2016167819","https://openalex.org/W2045474081","https://openalex.org/W2128889905","https://openalex.org/W2154596119","https://openalex.org/W2169836049"],"related_works":["https://openalex.org/W2137088108","https://openalex.org/W2786631194","https://openalex.org/W2148435004","https://openalex.org/W2278825048","https://openalex.org/W2921934250","https://openalex.org/W2155015791","https://openalex.org/W2353526865","https://openalex.org/W2613801068","https://openalex.org/W1570838942","https://openalex.org/W2289448604"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3,90,96],"wide":[4],"locking":[5,30],"range":[6],"and":[7,44,78],"low":[8],"power":[9,64,75],"Injection-Locked":[10],"Frequency":[11],"Divider":[12],"(ILFD)":[13],"is":[14,25,37,57,65,76],"presented.":[15],"Compared":[16],"to":[17,27,39,60],"conventional":[18],"structure,":[19],"2-b":[20],"digital":[21],"controlled":[22],"capacitor":[23],"array":[24],"introduced":[26],"extend":[28],"its":[29],"range.":[31],"Meanwhile,":[32],"the":[33,41,46,54,73],"tail":[34],"current":[35,92],"source":[36],"eliminated":[38],"reduce":[40],"supply":[42,97],"voltage":[43,48,98],"enlarge":[45],"output":[47,74,106],"swing.":[49],"The":[50,86,101],"post-simulations":[51],"show":[52],"that":[53],"total":[55,102],"locking-range":[56],"from":[58],"29.7GHz":[59],"39.2GHz":[61],"when":[62],"input":[63],"0dBm.":[66],"While":[67],"operating":[68],"at":[69,81],"highest":[70],"frequency":[71],"band,":[72],"1.3dBm,":[77],"phase":[79],"noise":[80],"1-MHz":[82],"offset":[83],"are":[84],"-156.9dBc/Hz.":[85],"divider":[87,103],"core":[88],"draws":[89],"RMS":[91],"of":[93,99],"8.5mA":[94],"under":[95],"0.65V.":[100],"with":[104],"50\u03a9":[105],"buffer":[107],"takes":[108],"up":[109],"540\u03bcm\u00d7205\u03bcm":[110],"without":[111],"probe":[112],"pad":[113],"in":[114],"TSMC":[115],"65-nm":[116],"CMOS":[117],"process.":[118]},"counts_by_year":[{"year":2017,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}