{"id":"https://openalex.org/W2494795389","doi":"https://doi.org/10.1109/asicon.2015.7516898","title":"A load-transient-enhanced output-capacitor-free low-dropout regulator based on an ultra-fast push-pull amplifier","display_name":"A load-transient-enhanced output-capacitor-free low-dropout regulator based on an ultra-fast push-pull amplifier","publication_year":2015,"publication_date":"2015-11-01","ids":{"openalex":"https://openalex.org/W2494795389","doi":"https://doi.org/10.1109/asicon.2015.7516898","mag":"2494795389"},"language":"en","primary_location":{"id":"doi:10.1109/asicon.2015.7516898","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2015.7516898","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 11th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061074926","display_name":"Shaowei Zhen","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Shaowei Zhen","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100386450","display_name":"Ji Wang","orcid":"https://orcid.org/0000-0002-0724-7538"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ji Wang","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066858008","display_name":"Dongjie Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dongjie Yang","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053460929","display_name":"Canhua Cao","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Canhua Cao","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054488515","display_name":"Ping Luo","orcid":"https://orcid.org/0000-0002-8840-6739"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]},{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ping Luo","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5061074926"],"corresponding_institution_ids":["https://openalex.org/I150229711","https://openalex.org/I4210124847"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.20941304,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/slew-rate","display_name":"Slew rate","score":0.8162223100662231},{"id":"https://openalex.org/keywords/overshoot","display_name":"Overshoot (microwave communication)","score":0.6468180418014526},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5706673860549927},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5531962513923645},{"id":"https://openalex.org/keywords/dropout-voltage","display_name":"Dropout voltage","score":0.4888016879558563},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.4805920124053955},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.4523800015449524},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.451651006937027},{"id":"https://openalex.org/keywords/decoupling-capacitor","display_name":"Decoupling capacitor","score":0.44933977723121643},{"id":"https://openalex.org/keywords/low-dropout-regulator","display_name":"Low-dropout regulator","score":0.4488905370235443},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4298170804977417},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.4229472875595093},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.42021501064300537},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4123595952987671},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.35618311166763306},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3411950469017029},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2996439039707184},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.2912038564682007},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2649972438812256},{"id":"https://openalex.org/keywords/voltage-regulator","display_name":"Voltage regulator","score":0.25670915842056274},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18917781114578247}],"concepts":[{"id":"https://openalex.org/C82517063","wikidata":"https://www.wikidata.org/wiki/Q1591315","display_name":"Slew rate","level":3,"score":0.8162223100662231},{"id":"https://openalex.org/C2780323453","wikidata":"https://www.wikidata.org/wiki/Q7113957","display_name":"Overshoot (microwave communication)","level":2,"score":0.6468180418014526},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5706673860549927},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5531962513923645},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.4888016879558563},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.4805920124053955},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.4523800015449524},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.451651006937027},{"id":"https://openalex.org/C35196352","wikidata":"https://www.wikidata.org/wiki/Q1532649","display_name":"Decoupling capacitor","level":4,"score":0.44933977723121643},{"id":"https://openalex.org/C140501009","wikidata":"https://www.wikidata.org/wiki/Q6692746","display_name":"Low-dropout regulator","level":5,"score":0.4488905370235443},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4298170804977417},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.4229472875595093},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.42021501064300537},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4123595952987671},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35618311166763306},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3411950469017029},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2996439039707184},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.2912038564682007},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2649972438812256},{"id":"https://openalex.org/C110706871","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Voltage regulator","level":3,"score":0.25670915842056274},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18917781114578247},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon.2015.7516898","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2015.7516898","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 11th International Conference on ASIC (ASICON)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8700000047683716}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1980640049","https://openalex.org/W2033342874","https://openalex.org/W2078318212","https://openalex.org/W2105606575","https://openalex.org/W2117615344","https://openalex.org/W2118179090","https://openalex.org/W2122790352","https://openalex.org/W2157123341"],"related_works":["https://openalex.org/W2134714860","https://openalex.org/W1670720143","https://openalex.org/W2080962076","https://openalex.org/W2165767665","https://openalex.org/W2026125489","https://openalex.org/W1998057040","https://openalex.org/W2109665701","https://openalex.org/W2097400953","https://openalex.org/W3005979866","https://openalex.org/W2300667134"],"abstract_inverted_index":{"The":[0,23,85],"paper":[1],"proposed":[2],"an":[3,17,40],"ultra":[4,18],"fast":[5,19],"response":[6],"output":[7,27,86,113],"capacitor":[8],"free":[9],"(OCF)":[10],"low":[11],"dropout":[12],"regulator":[13],"(LDR)":[14],"based":[15],"on":[16,65],"push-pull":[20],"error":[21],"amplifier.":[22],"amplifier":[24,80,102],"detects":[25],"the":[26,36,52,55,60,75,101,112,133,163,180],"voltage":[28,165],"spike":[29],"(the":[30],"overshoot":[31],"or":[32,49,122],"undershoot":[33],"voltage)":[34],"of":[35,54,69,79,106,153],"LDR":[37,82,134],"and":[38,42,72,111,143,179],"generates":[39],"ultra-fast":[41],"large":[43],"adaptive":[44,73],"current":[45,109,114,121,152],"to":[46,58,139,168,175],"push":[47],"up":[48],"pull":[50],"down":[51],"gate":[53],"power":[56],"transistor":[57],"enhance":[59],"load":[61,141,147,171],"transient":[62],"performance.":[63],"Based":[64],"quadratic":[66],"I-V":[67],"characteristics":[68,105],"MOS":[70],"transistor,":[71],"biasing,":[74],"slew":[76,93],"rate":[77,94],"(SR)":[78],"in":[81,124,128,177,186],"is":[83,89,115,135,183],"enhanced.":[84],"driving":[87],"capability":[88,110,148],"further":[90],"improved":[91],"by":[92,119],"enhanced":[95],"charging/discharging":[96],"circuit.":[97],"As":[98],"a":[99,129,150],"result,":[100],"performs":[103],"transfer":[104],"much":[107],"higher":[108],"no":[116],"longer":[117],"limited":[118],"tail":[120],"square-law":[123],"conventional":[125],"designs.":[126],"Designed":[127],"0.35\u03bcm":[130],"CMOS":[131],"process,":[132],"stable":[136],"for":[137,170],"0pF":[138],"50pF":[140],"capacitance":[142],"has":[144],"100mA":[145,176],"maximum":[146],"with":[149],"quiescent":[151],"14\u03bcA.":[154],"Simulation":[155],"results":[156],"including":[157],"all":[158],"process":[159],"corners":[160],"show":[161],"that":[162],"undershoot/overshoot":[164],"are":[166],"reduced":[167],"147mV/57mV":[169],"step":[172],"from":[173],"1mA":[174],"100ns,":[178],"recover":[181],"time":[182],"only":[184],"210ns":[185],"worse":[187],"case.":[188]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}