{"id":"https://openalex.org/W1986422471","doi":"https://doi.org/10.1109/asicon.2013.6811966","title":"Calibration for split capacitor DAC in SAR ADC","display_name":"Calibration for split capacitor DAC in SAR ADC","publication_year":2013,"publication_date":"2013-10-01","ids":{"openalex":"https://openalex.org/W1986422471","doi":"https://doi.org/10.1109/asicon.2013.6811966","mag":"1986422471"},"language":"en","primary_location":{"id":"doi:10.1109/asicon.2013.6811966","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2013.6811966","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 10th International Conference on ASIC","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100356724","display_name":"Zhe Li","orcid":"https://orcid.org/0009-0009-3725-2248"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhe Li","raw_affiliation_strings":["Center for Analog/RF IC (CARFIC), Shanghai Jiaotong University, Shanghai, China","Center for Analog/RF IC (CARFIC), School of Microelectronics, Shanghai Jiaotong University, 200240, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Analog/RF IC (CARFIC), Shanghai Jiaotong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"Center for Analog/RF IC (CARFIC), School of Microelectronics, Shanghai Jiaotong University, 200240, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101185585","display_name":"Yuxiao Lu","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuxiao Lu","raw_affiliation_strings":["Center for Analog/RF IC (CARFIC), Shanghai Jiaotong University, Shanghai, China","Center for Analog/RF IC (CARFIC), School of Microelectronics, Shanghai Jiaotong University, 200240, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Analog/RF IC (CARFIC), Shanghai Jiaotong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"Center for Analog/RF IC (CARFIC), School of Microelectronics, Shanghai Jiaotong University, 200240, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064866690","display_name":"Tingting Mo","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tingting Mo","raw_affiliation_strings":["Center for Analog/RF IC (CARFIC), Shanghai Jiaotong University, Shanghai, China","Center for Analog/RF IC (CARFIC), School of Microelectronics, Shanghai Jiaotong University, 200240, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Analog/RF IC (CARFIC), Shanghai Jiaotong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"Center for Analog/RF IC (CARFIC), School of Microelectronics, Shanghai Jiaotong University, 200240, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.08522147,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.9161715507507324},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.8964406251907349},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.662861704826355},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.5938001871109009},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5705143213272095},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5592315196990967},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.5549072027206421},{"id":"https://openalex.org/keywords/decoupling-capacitor","display_name":"Decoupling capacitor","score":0.5272666215896606},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5019664764404297},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.26801279187202454},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19886046648025513},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1566566824913025},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12717688083648682},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.10884296894073486}],"concepts":[{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.9161715507507324},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.8964406251907349},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.662861704826355},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.5938001871109009},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5705143213272095},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5592315196990967},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.5549072027206421},{"id":"https://openalex.org/C35196352","wikidata":"https://www.wikidata.org/wiki/Q1532649","display_name":"Decoupling capacitor","level":4,"score":0.5272666215896606},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5019664764404297},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.26801279187202454},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19886046648025513},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1566566824913025},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12717688083648682},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.10884296894073486},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon.2013.6811966","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2013.6811966","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 10th International Conference on ASIC","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8899999856948853,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1994123466","https://openalex.org/W2038370925","https://openalex.org/W2080611808","https://openalex.org/W2153215949"],"related_works":["https://openalex.org/W2904640696","https://openalex.org/W2752640128","https://openalex.org/W2783221760","https://openalex.org/W2997894768","https://openalex.org/W2568520569","https://openalex.org/W2345299457","https://openalex.org/W2418527074","https://openalex.org/W2533361262","https://openalex.org/W4206356469","https://openalex.org/W2972236120"],"abstract_inverted_index":{"The":[0,76],"nonlinearity":[1,38],"of":[2,19,39,122],"split":[3,41,101],"capacitor":[4,25,42,124],"DAC":[5,102],"(CDAC)":[6],"in":[7,53],"SAR":[8],"ADC":[9],"is":[10,62],"mainly":[11],"caused":[12],"by":[13,64,113],"the":[14,20,37,40,48,66,71,87,91,105,120],"mismatch":[15],"and":[16,44,56,82,111,115],"parasitic":[17],"effect":[18],"bridge":[21],"capacitor.":[22],"A":[23],"tunable":[24,60],"array":[26],"for":[27],"compensation":[28,123],"can":[29],"be":[30],"a":[31,99],"solution.":[32],"This":[33],"paper":[34],"first":[35],"analyzes":[36],"structure,":[43],"then":[45],"proves":[46],"that":[47,104],"linear":[49],"tuning":[50,72],"method":[51],"results":[52],"linearity":[54],"improvements":[55],"finally,":[57],"an":[58],"improved":[59],"structure":[61],"proposed":[63,106],"calculating":[65],"minimal":[67],"step":[68],"which":[69],"keeps":[70],"error":[73],"within":[74],"0.5LSB.":[75],"new":[77],"implementation":[78],"achieves":[79],"smaller":[80],"area":[81],"less":[83],"power":[84],"consumption":[85],"during":[86],"calibration,":[88],"while":[89],"maintaining":[90],"same":[92],"circuit":[93],"complexity.":[94],"Behavioral":[95],"Simulations":[96],"based":[97],"on":[98],"5b-5b":[100],"show":[103],"calibration":[107],"further":[108],"improves":[109],"SNDR":[110],"SFDR":[112],"2.2dB":[114],"1.6dB,":[116],"respectively":[117],"compared":[118],"with":[119],"prototype":[121],"array.":[125]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}