{"id":"https://openalex.org/W2057585480","doi":"https://doi.org/10.1109/asicon.2013.6811872","title":"A 10-bit pipelined ADC with improved S/H circuit for CMOS image sensor","display_name":"A 10-bit pipelined ADC with improved S/H circuit for CMOS image sensor","publication_year":2013,"publication_date":"2013-10-01","ids":{"openalex":"https://openalex.org/W2057585480","doi":"https://doi.org/10.1109/asicon.2013.6811872","mag":"2057585480"},"language":"en","primary_location":{"id":"doi:10.1109/asicon.2013.6811872","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2013.6811872","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 10th International Conference on ASIC","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015369523","display_name":"Yiling Ding","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210111959","display_name":"Shanghai Advanced Research Institute","ror":"https://ror.org/02br7py06","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiling Ding","raw_affiliation_strings":["Chinese Academy of Sciences, Shanghai Advanced Research Institute, Shanghai, P.R. China","Shanghai Advanced Research Institute, Chinese Academy of Sciences, 201210, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Shanghai Advanced Research Institute, Shanghai, P.R. China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]},{"raw_affiliation_string":"Shanghai Advanced Research Institute, Chinese Academy of Sciences, 201210, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100360250","display_name":"Qi Zhang","orcid":"https://orcid.org/0000-0002-0312-7045"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210111959","display_name":"Shanghai Advanced Research Institute","ror":"https://ror.org/02br7py06","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Zhang","raw_affiliation_strings":["Chinese Academy of Sciences, Shanghai Advanced Research Institute, Shanghai, P.R. China","Shanghai Advanced Research Institute, Chinese Academy of Sciences, 201210, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Shanghai Advanced Research Institute, Shanghai, P.R. China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]},{"raw_affiliation_string":"Shanghai Advanced Research Institute, Chinese Academy of Sciences, 201210, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100387148","display_name":"Ning Wang","orcid":"https://orcid.org/0000-0002-4902-5589"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210111959","display_name":"Shanghai Advanced Research Institute","ror":"https://ror.org/02br7py06","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ning Wang","raw_affiliation_strings":["Chinese Academy of Sciences, Shanghai Advanced Research Institute, Shanghai, P.R. China","Shanghai Advanced Research Institute, Chinese Academy of Sciences, 201210, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Shanghai Advanced Research Institute, Shanghai, P.R. China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]},{"raw_affiliation_string":"Shanghai Advanced Research Institute, Chinese Academy of Sciences, 201210, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108466498","display_name":"Dunshan Yuan","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210111959","display_name":"Shanghai Advanced Research Institute","ror":"https://ror.org/02br7py06","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dunshan Yuan","raw_affiliation_strings":["Chinese Academy of Sciences, Shanghai Advanced Research Institute, Shanghai, P.R. China","Shanghai Advanced Research Institute, Chinese Academy of Sciences, 201210, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Shanghai Advanced Research Institute, Shanghai, P.R. China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]},{"raw_affiliation_string":"Shanghai Advanced Research Institute, Chinese Academy of Sciences, 201210, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100770037","display_name":"Guohong Li","orcid":"https://orcid.org/0000-0002-3411-1695"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210111959","display_name":"Shanghai Advanced Research Institute","ror":"https://ror.org/02br7py06","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guohong Li","raw_affiliation_strings":["Chinese Academy of Sciences, Shanghai Advanced Research Institute, Shanghai, P.R. China","Shanghai Advanced Research Institute, Chinese Academy of Sciences, 201210, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Shanghai Advanced Research Institute, Shanghai, P.R. China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]},{"raw_affiliation_string":"Shanghai Advanced Research Institute, Chinese Academy of Sciences, 201210, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100460819","display_name":"Hui Wang","orcid":"https://orcid.org/0000-0002-6536-5188"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210111959","display_name":"Shanghai Advanced Research Institute","ror":"https://ror.org/02br7py06","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui Wang","raw_affiliation_strings":["Chinese Academy of Sciences, Shanghai Advanced Research Institute, Shanghai, P.R. China","Shanghai Advanced Research Institute, Chinese Academy of Sciences, 201210, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Shanghai Advanced Research Institute, Shanghai, P.R. China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]},{"raw_affiliation_string":"Shanghai Advanced Research Institute, Chinese Academy of Sciences, 201210, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100657377","display_name":"Songlin Feng","orcid":"https://orcid.org/0000-0001-5515-2034"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210111959","display_name":"Shanghai Advanced Research Institute","ror":"https://ror.org/02br7py06","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Songlin Feng","raw_affiliation_strings":["Chinese Academy of Sciences, Shanghai Advanced Research Institute, Shanghai, P.R. China","Shanghai Advanced Research Institute, Chinese Academy of Sciences, 201210, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Shanghai Advanced Research Institute, Shanghai, P.R. China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]},{"raw_affiliation_string":"Shanghai Advanced Research Institute, Chinese Academy of Sciences, 201210, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210111959"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17673262,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9890000224113464,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9868999719619751,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/effective-number-of-bits","display_name":"Effective number of bits","score":0.9216378927230835},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7554518580436707},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5991741418838501},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.5776379704475403},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4978463649749756},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.4415716528892517},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.41362425684928894},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3772316575050354},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3568401336669922},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.2897513210773468},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2677844166755676}],"concepts":[{"id":"https://openalex.org/C16671190","wikidata":"https://www.wikidata.org/wiki/Q505579","display_name":"Effective number of bits","level":3,"score":0.9216378927230835},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7554518580436707},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5991741418838501},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.5776379704475403},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4978463649749756},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.4415716528892517},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.41362425684928894},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3772316575050354},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3568401336669922},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.2897513210773468},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2677844166755676},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon.2013.6811872","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2013.6811872","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 10th International Conference on ASIC","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8500000238418579,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W594546823","https://openalex.org/W2108083714","https://openalex.org/W2156153161","https://openalex.org/W2744769585","https://openalex.org/W4285674669"],"related_works":["https://openalex.org/W2914701507","https://openalex.org/W2905521207","https://openalex.org/W2168717468","https://openalex.org/W2161345192","https://openalex.org/W3156142317","https://openalex.org/W4292071990","https://openalex.org/W2783221760","https://openalex.org/W169064491","https://openalex.org/W2176562119","https://openalex.org/W4224994410"],"abstract_inverted_index":{"A":[0],"10-bit":[1],"pipelined":[2],"ADC":[3,93],"with":[4,50],"an":[5],"improved":[6,19],"S/H":[7,20],"circuit":[8,21],"for":[9],"CMOS":[10],"image":[11],"sensor":[12],"is":[13,22,67,88],"presented":[14],"in":[15],"this":[16],"paper.":[17],"The":[18,40,76,92,107],"proposed":[23],"to":[24,69,85,90],"adjust":[25],"the":[26,29,60,71,81],"range":[27,72],"of":[28,73,97,101],"input":[30,74],"signal,":[31],"eliminate":[32],"dark":[33,41],"current":[34,42],"noise":[35,43],"and":[36,44,55,99,109,113],"calibrate":[37],"offset":[38,45],"voltage.":[39],"voltage":[46,66,84],"can":[47],"be":[48,86],"calibrated":[49,87],"a":[51,63,95],"DAC":[52],"feedback":[53,57],"loop":[54],"two":[56],"capacitances.":[58],"During":[59],"sample":[61,105],"phase,":[62],"special":[64],"modulation":[65],"generated":[68],"widen":[70],"signal.":[75],"simulation":[77],"results":[78],"show":[79],"that":[80],"maximum":[82],"error":[83],"up":[89],"0.5V.":[91],"achieves":[94],"SNDR":[96],"58.4dB":[98],"ENOB":[100],"9.4bits":[102],"at":[103],"30MHz":[104],"rate.":[106],"DNL":[108],"INL":[110],"are":[111],"0.27LSB":[112],"0.48LSB":[114],"respectively.":[115]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}