{"id":"https://openalex.org/W1977061539","doi":"https://doi.org/10.1109/asicon.2011.6157397","title":"A 0.8&amp;#x2013;2.5GHz wideband SiGe BiCMOS low noise amplifier with noise fiugre of 1.98&amp;#x2013;3.3dB","display_name":"A 0.8&amp;#x2013;2.5GHz wideband SiGe BiCMOS low noise amplifier with noise fiugre of 1.98&amp;#x2013;3.3dB","publication_year":2011,"publication_date":"2011-10-01","ids":{"openalex":"https://openalex.org/W1977061539","doi":"https://doi.org/10.1109/asicon.2011.6157397","mag":"1977061539"},"language":"en","primary_location":{"id":"doi:10.1109/asicon.2011.6157397","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2011.6157397","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 9th IEEE International Conference on ASIC","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101455345","display_name":"Hua Lin","orcid":"https://orcid.org/0000-0002-6240-3097"},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Lin Hua","raw_affiliation_strings":["Institute of Microelectronics Circuit & System, East China Jiao Tong University, Shanghai, China","Institute of Microelectronics Circuit and System,East China Normal University,Shanghai 200062,China)"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics Circuit & System, East China Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I4210119392"]},{"raw_affiliation_string":"Institute of Microelectronics Circuit and System,East China Normal University,Shanghai 200062,China)","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100830969","display_name":"Qiong Yan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiong Yan","raw_affiliation_strings":["Institute of Microelectronics Circuit & System, East China Jiao Tong University, Shanghai, China","Institute of Microelectronics Circuit and System,East China Normal University,Shanghai 200062,China)"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics Circuit & System, East China Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I4210119392"]},{"raw_affiliation_string":"Institute of Microelectronics Circuit and System,East China Normal University,Shanghai 200062,China)","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042323553","display_name":"Lei Chen","orcid":"https://orcid.org/0000-0002-4778-4688"},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Chen","raw_affiliation_strings":["Institute of Microelectronics Circuit & System, East China Jiao Tong University, Shanghai, China","Institute of Microelectronics Circuit and System,East China Normal University,Shanghai 200062,China)"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics Circuit & System, East China Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I4210119392"]},{"raw_affiliation_string":"Institute of Microelectronics Circuit and System,East China Normal University,Shanghai 200062,China)","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050153851","display_name":"Runxi Zhang","orcid":"https://orcid.org/0000-0002-1459-5362"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Runxi Zhang","raw_affiliation_strings":["Institute of Microelectronics Circuit & System, East China Jiao Tong University, Shanghai, China","Institute of Microelectronics Circuit and System,East China Normal University,Shanghai 200062,China)"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics Circuit & System, East China Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I4210119392"]},{"raw_affiliation_string":"Institute of Microelectronics Circuit and System,East China Normal University,Shanghai 200062,China)","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112629360","display_name":"Chunqi Shi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunqi Shi","raw_affiliation_strings":["Institute of Microelectronics Circuit & System, East China Jiao Tong University, Shanghai, China","Institute of Microelectronics Circuit and System,East China Normal University,Shanghai 200062,China)"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics Circuit & System, East China Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I4210119392"]},{"raw_affiliation_string":"Institute of Microelectronics Circuit and System,East China Normal University,Shanghai 200062,China)","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102217378","display_name":"Zongsheng Lai","orcid":null},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zongsheng Lai","raw_affiliation_strings":["Institute of Microelectronics Circuit & System, East China Jiao Tong University, Shanghai, China","Institute of Microelectronics Circuit and System,East China Normal University,Shanghai 200062,China)"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics Circuit & System, East China Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I4210119392"]},{"raw_affiliation_string":"Institute of Microelectronics Circuit and System,East China Normal University,Shanghai 200062,China)","institution_ids":["https://openalex.org/I66867065"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5101455345"],"corresponding_institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I66867065"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.05442272,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"1","issue":null,"first_page":"1086","last_page":"1089"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bicmos","display_name":"BiCMOS","score":0.691618800163269},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.669317364692688},{"id":"https://openalex.org/keywords/wideband","display_name":"Wideband","score":0.6561945080757141},{"id":"https://openalex.org/keywords/low-noise-amplifier","display_name":"Low-noise amplifier","score":0.6204374432563782},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5609877109527588},{"id":"https://openalex.org/keywords/y-factor","display_name":"Y-factor","score":0.5296539664268494},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5003478527069092},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.49408939480781555},{"id":"https://openalex.org/keywords/common-emitter","display_name":"Common emitter","score":0.4478592872619629},{"id":"https://openalex.org/keywords/noise-temperature","display_name":"Noise temperature","score":0.4464786946773529},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.44286003708839417},{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.43325915932655334},{"id":"https://openalex.org/keywords/effective-input-noise-temperature","display_name":"Effective input noise temperature","score":0.42085641622543335},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4102541208267212},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3859696090221405},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.34573084115982056},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.33946722745895386},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2355659306049347},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.18886145949363708},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.17949628829956055},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.13064178824424744}],"concepts":[{"id":"https://openalex.org/C62427370","wikidata":"https://www.wikidata.org/wiki/Q173416","display_name":"BiCMOS","level":4,"score":0.691618800163269},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.669317364692688},{"id":"https://openalex.org/C2780202535","wikidata":"https://www.wikidata.org/wiki/Q4524457","display_name":"Wideband","level":2,"score":0.6561945080757141},{"id":"https://openalex.org/C155332784","wikidata":"https://www.wikidata.org/wiki/Q1151304","display_name":"Low-noise amplifier","level":4,"score":0.6204374432563782},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5609877109527588},{"id":"https://openalex.org/C166576357","wikidata":"https://www.wikidata.org/wiki/Q8045715","display_name":"Y-factor","level":5,"score":0.5296539664268494},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5003478527069092},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.49408939480781555},{"id":"https://openalex.org/C46918542","wikidata":"https://www.wikidata.org/wiki/Q1648344","display_name":"Common emitter","level":2,"score":0.4478592872619629},{"id":"https://openalex.org/C52660251","wikidata":"https://www.wikidata.org/wiki/Q17083145","display_name":"Noise temperature","level":3,"score":0.4464786946773529},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.44286003708839417},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.43325915932655334},{"id":"https://openalex.org/C12252657","wikidata":"https://www.wikidata.org/wiki/Q5347266","display_name":"Effective input noise temperature","level":5,"score":0.42085641622543335},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4102541208267212},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3859696090221405},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.34573084115982056},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.33946722745895386},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2355659306049347},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.18886145949363708},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.17949628829956055},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.13064178824424744},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon.2011.6157397","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2011.6157397","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 9th IEEE International Conference on ASIC","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8600000143051147}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2057575455"],"related_works":["https://openalex.org/W2131553985","https://openalex.org/W1993596838","https://openalex.org/W2118931924","https://openalex.org/W2071806754","https://openalex.org/W2032554183","https://openalex.org/W2024183800","https://openalex.org/W2367917021","https://openalex.org/W1974401549","https://openalex.org/W3150374606","https://openalex.org/W2349969254"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"an":[3,21],"optimized":[4],"0.8-2.5GHz":[5],"low":[6,28],"noise":[7,29,61],"amplifier":[8],"for":[9],"wideband":[10],"applications.":[11],"Based":[12],"on":[13],"cascade":[14],"structure,":[15],"a":[16,45,53],"shunt":[17],"resistive":[18],"feedback":[19],"with":[20],"emitter":[22],"degeneration":[23],"inductor":[24],"is":[25,76,86],"used.":[26],"Both":[27],"figure":[30,62],"and":[31,52,81],"high":[32],"gain":[33,47,55],"are":[34],"achieved":[35],"simultaneously.":[36],"Measured":[37],"results":[38],"show":[39],"that":[40],"the":[41,69,82],"proposed":[42],"LNA":[43],"has":[44],"maximum":[46],"of":[48,56],"19.6dB":[49],"at":[50,58,78],"0.8GHz":[51],"minimum":[54],"14.3dB":[57],"2.5GHz.":[59],"The":[60,72],"varies":[63],"from":[64],"1.98":[65],"to":[66],"3.3dB":[67],"among":[68],"whole":[70],"band.":[71],"overall":[73],"power":[74],"supply":[75,80],"24mw":[77],"3V":[79],"occupied":[83],"die":[84],"area":[85],"only":[87],"0.4mm":[88],"<sup":[89],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[90],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[91],".":[92]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}