{"id":"https://openalex.org/W1977063403","doi":"https://doi.org/10.1109/asicon.2011.6157309","title":"A low-voltage differential injection locked divider with forward body bias","display_name":"A low-voltage differential injection locked divider with forward body bias","publication_year":2011,"publication_date":"2011-10-01","ids":{"openalex":"https://openalex.org/W1977063403","doi":"https://doi.org/10.1109/asicon.2011.6157309","mag":"1977063403"},"language":"en","primary_location":{"id":"doi:10.1109/asicon.2011.6157309","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2011.6157309","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 9th IEEE International Conference on ASIC","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087906386","display_name":"Haipeng Fu","orcid":"https://orcid.org/0000-0002-9809-1830"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Haipeng Fu","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University, Shanghai, P.R China","State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, P.R China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073893990","display_name":"Hanchao Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hanchao Zhou","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University, Shanghai, P.R China","State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, P.R China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061238242","display_name":"Yangyang Niu","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yangyang Niu","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University, Shanghai, P.R China","State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, P.R China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073819142","display_name":"Junyan Ren","orcid":"https://orcid.org/0009-0009-1356-6314"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junyan Ren","raw_affiliation_strings":["Micro-/Nano Science and Innovation Platform, Fudan University, Shanghai, P.R China","State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China"],"affiliations":[{"raw_affiliation_string":"Micro-/Nano Science and Innovation Platform, Fudan University, Shanghai, P.R China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100318370","display_name":"Wei Li","orcid":"https://orcid.org/0000-0003-1186-8609"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Li","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University, Shanghai, P.R China","State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, P.R China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109299656","display_name":"Li Ning","orcid":"https://orcid.org/0000-0002-6772-675X"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ning Li","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University, Shanghai, P.R China","State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, P.R China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China","institution_ids":["https://openalex.org/I24943067"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5087906386"],"corresponding_institution_ids":["https://openalex.org/I24943067"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.05443302,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"54","issue":null,"first_page":"731","last_page":"734"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/frequency-divider","display_name":"Frequency divider","score":0.7755739688873291},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6402089595794678},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6233363151550293},{"id":"https://openalex.org/keywords/voltage-divider","display_name":"Voltage divider","score":0.5832598805427551},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.5694919228553772},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5034334063529968},{"id":"https://openalex.org/keywords/current-divider","display_name":"Current divider","score":0.4984900951385498},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.49624449014663696},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.454764187335968},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4289044141769409},{"id":"https://openalex.org/keywords/low-voltage","display_name":"Low voltage","score":0.4197466969490051},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.41723230481147766},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3351151645183563},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2984670102596283},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22816473245620728}],"concepts":[{"id":"https://openalex.org/C74982907","wikidata":"https://www.wikidata.org/wiki/Q1455624","display_name":"Frequency divider","level":3,"score":0.7755739688873291},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6402089595794678},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6233363151550293},{"id":"https://openalex.org/C49324399","wikidata":"https://www.wikidata.org/wiki/Q466758","display_name":"Voltage divider","level":3,"score":0.5832598805427551},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.5694919228553772},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5034334063529968},{"id":"https://openalex.org/C97264828","wikidata":"https://www.wikidata.org/wiki/Q4157078","display_name":"Current divider","level":4,"score":0.4984900951385498},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.49624449014663696},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.454764187335968},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4289044141769409},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.4197466969490051},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.41723230481147766},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3351151645183563},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2984670102596283},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22816473245620728},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon.2011.6157309","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2011.6157309","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 9th IEEE International Conference on ASIC","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8899999856948853}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1974337707","https://openalex.org/W2038874999","https://openalex.org/W2097917820","https://openalex.org/W2105317509","https://openalex.org/W2127314396","https://openalex.org/W2169092810"],"related_works":["https://openalex.org/W2786631194","https://openalex.org/W2278825048","https://openalex.org/W2613801068","https://openalex.org/W2119913708","https://openalex.org/W2125493782","https://openalex.org/W2155015791","https://openalex.org/W2602267976","https://openalex.org/W2137322437","https://openalex.org/W2115374930","https://openalex.org/W2146135557"],"abstract_inverted_index":{"An":[0],"low":[1],"voltage":[2,54],"and":[3,20,45],"wide":[4,17],"locking":[5,18,60],"range":[6,19,61],"injection-locked":[7],"frequency":[8,68,83],"divider":[9,84],"using":[10,26],"a":[11,52,58,86],"0.13-\u00b5m":[12],"CMOS":[13],"is":[14,35,73],"presented.":[15],"The":[16,82],"low-voltage":[21],"operation":[22],"are":[23],"achieved":[24,74],"by":[25],"forward":[27],"body":[28],"bias":[29],"technique.":[30],"A":[31],"differential":[32,42],"injection":[33,47],"scheme":[34],"proposed":[36],"to":[37,39,70],"fit":[38],"the":[40,66,76],"integrated":[41],"on-chip":[43],"oscillator":[44],"improve":[46],"efficiency.":[48],"When":[49],"operating":[50],"at":[51,75],"supply":[53],"of":[55,62,79,89],"0.6":[56],"V,":[57],"maximum":[59],"10.31":[63],"GHz,":[64,72],"from":[65],"incident":[67,77],"40.49":[69],"50.8":[71],"power":[78],"0":[80],"dBm.":[81],"consumes":[85],"static":[87],"current":[88],"6":[90],"mA.":[91]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}