{"id":"https://openalex.org/W2085115640","doi":"https://doi.org/10.1109/asicon.2011.6157294","title":"Determination of the trap states distribution in Poly-Si films using the OEMS modulation","display_name":"Determination of the trap states distribution in Poly-Si films using the OEMS modulation","publication_year":2011,"publication_date":"2011-10-01","ids":{"openalex":"https://openalex.org/W2085115640","doi":"https://doi.org/10.1109/asicon.2011.6157294","mag":"2085115640"},"language":"en","primary_location":{"id":"doi:10.1109/asicon.2011.6157294","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2011.6157294","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 9th IEEE International Conference on ASIC","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102755957","display_name":"Xiyue Li","orcid":"https://orcid.org/0000-0002-7434-8865"},"institutions":[{"id":"https://openalex.org/I159948400","display_name":"Jinan University","ror":"https://ror.org/02xe5ns62","country_code":"CN","type":"education","lineage":["https://openalex.org/I159948400"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiyue Li","raw_affiliation_strings":["Department of Electro-nic Engineering, Jina University, Gaangzhou, P. R China","Department of Electronic Engineering, Jinan University, Guangzhou 510632 (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electro-nic Engineering, Jina University, Gaangzhou, P. R China","institution_ids":[]},{"raw_affiliation_string":"Department of Electronic Engineering, Jinan University, Guangzhou 510632 (China)","institution_ids":["https://openalex.org/I159948400"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039736393","display_name":"Wanling Deng","orcid":"https://orcid.org/0000-0002-4018-5578"},"institutions":[{"id":"https://openalex.org/I159948400","display_name":"Jinan University","ror":"https://ror.org/02xe5ns62","country_code":"CN","type":"education","lineage":["https://openalex.org/I159948400"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wanling Deng","raw_affiliation_strings":["Department of Electro-nic Engineering, Jina University, Gaangzhou, P. R China","Department of Electronic Engineering, Jinan University, Guangzhou 510632 (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electro-nic Engineering, Jina University, Gaangzhou, P. R China","institution_ids":[]},{"raw_affiliation_string":"Department of Electronic Engineering, Jinan University, Guangzhou 510632 (China)","institution_ids":["https://openalex.org/I159948400"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101722115","display_name":"Junkai Huang","orcid":"https://orcid.org/0000-0003-4625-7111"},"institutions":[{"id":"https://openalex.org/I159948400","display_name":"Jinan University","ror":"https://ror.org/02xe5ns62","country_code":"CN","type":"education","lineage":["https://openalex.org/I159948400"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junkai Huang","raw_affiliation_strings":["Department of Electro-nic Engineering, Jina University, Gaangzhou, P. R China","Department of Electronic Engineering, Jinan University, Guangzhou 510632 (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electro-nic Engineering, Jina University, Gaangzhou, P. R China","institution_ids":[]},{"raw_affiliation_string":"Department of Electronic Engineering, Jinan University, Guangzhou 510632 (China)","institution_ids":["https://openalex.org/I159948400"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I159948400"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"669","last_page":"672"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/trap","display_name":"Trap (plumbing)","score":0.8373414278030396},{"id":"https://openalex.org/keywords/original-equipment-manufacturer","display_name":"Original equipment manufacturer","score":0.7662007212638855},{"id":"https://openalex.org/keywords/gaussian","display_name":"Gaussian","score":0.5308680534362793},{"id":"https://openalex.org/keywords/modulation","display_name":"Modulation (music)","score":0.5216808319091797},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5158835649490356},{"id":"https://openalex.org/keywords/exponential-function","display_name":"Exponential function","score":0.42092037200927734},{"id":"https://openalex.org/keywords/distribution","display_name":"Distribution (mathematics)","score":0.42041367292404175},{"id":"https://openalex.org/keywords/valence-band","display_name":"Valence band","score":0.411872535943985},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.385456919670105},{"id":"https://openalex.org/keywords/atomic-physics","display_name":"Atomic physics","score":0.36977148056030273},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.31643593311309814},{"id":"https://openalex.org/keywords/band-gap","display_name":"Band gap","score":0.24528321623802185},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.15809181332588196},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1360762119293213},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.11328199505805969}],"concepts":[{"id":"https://openalex.org/C121099081","wikidata":"https://www.wikidata.org/wiki/Q665580","display_name":"Trap (plumbing)","level":2,"score":0.8373414278030396},{"id":"https://openalex.org/C68694590","wikidata":"https://www.wikidata.org/wiki/Q267558","display_name":"Original equipment manufacturer","level":2,"score":0.7662007212638855},{"id":"https://openalex.org/C163716315","wikidata":"https://www.wikidata.org/wiki/Q901177","display_name":"Gaussian","level":2,"score":0.5308680534362793},{"id":"https://openalex.org/C123079801","wikidata":"https://www.wikidata.org/wiki/Q750240","display_name":"Modulation (music)","level":2,"score":0.5216808319091797},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5158835649490356},{"id":"https://openalex.org/C151376022","wikidata":"https://www.wikidata.org/wiki/Q168698","display_name":"Exponential function","level":2,"score":0.42092037200927734},{"id":"https://openalex.org/C110121322","wikidata":"https://www.wikidata.org/wiki/Q865811","display_name":"Distribution (mathematics)","level":2,"score":0.42041367292404175},{"id":"https://openalex.org/C103272658","wikidata":"https://www.wikidata.org/wiki/Q528769","display_name":"Valence band","level":3,"score":0.411872535943985},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.385456919670105},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.36977148056030273},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.31643593311309814},{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.24528321623802185},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.15809181332588196},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1360762119293213},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.11328199505805969},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon.2011.6157294","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2011.6157294","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 9th IEEE International Conference on ASIC","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1972767585","https://openalex.org/W1977973861","https://openalex.org/W1995978450","https://openalex.org/W1997623841","https://openalex.org/W2005713197","https://openalex.org/W2028026862","https://openalex.org/W2044556818","https://openalex.org/W2091503263","https://openalex.org/W2123087977","https://openalex.org/W2130401492"],"related_works":["https://openalex.org/W2949536330","https://openalex.org/W2125856283","https://openalex.org/W4213224946","https://openalex.org/W2366593851","https://openalex.org/W2378471676","https://openalex.org/W2370523177","https://openalex.org/W2267813399","https://openalex.org/W2516133753","https://openalex.org/W2519519554","https://openalex.org/W2356502588"],"abstract_inverted_index":{"A":[0],"method":[1],"to":[2,53,91],"determine":[3],"the":[4,7,15,19,33,36,43,48,54,57,61,67,79,82,92],"distribution":[5,28,74],"of":[6,56],"trap":[8,45,50,69,84],"states":[9,46,70,85],"in":[10,24],"Poly-Si":[11],"films":[12],"based":[13],"on":[14],"current":[16,38,58],"response":[17,37,59],"under":[18,60],"OEMS":[20,62],"modulation":[21],"is":[22,96],"proposed":[23],"this":[25],"paper.":[26],"The":[27],"can":[29],"be":[30],"determined":[31],"by":[32,42],"comparison":[34],"between":[35],"which":[39],"caused":[40],"both":[41],"deep-level":[44,68],"and":[47,81],"band-tail":[49,83],"states.":[51],"According":[52],"spectrum":[55],"modulation,":[63],"a":[64,72,76,87],"model":[65],"that":[66],"having":[71],"Gaussian":[73],"with":[75,86],"peak":[77],"around":[78],"midgap":[80],"increasing":[88],"exponential":[89],"up":[90],"valence":[93],"band":[94],"edge":[95],"presented.":[97]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}