{"id":"https://openalex.org/W2010773512","doi":"https://doi.org/10.1109/asicon.2011.6157280","title":"Low phase noise injection-locked doubler-based quadrature CMOS VCO","display_name":"Low phase noise injection-locked doubler-based quadrature CMOS VCO","publication_year":2011,"publication_date":"2011-10-01","ids":{"openalex":"https://openalex.org/W2010773512","doi":"https://doi.org/10.1109/asicon.2011.6157280","mag":"2010773512"},"language":"en","primary_location":{"id":"doi:10.1109/asicon.2011.6157280","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2011.6157280","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 9th IEEE International Conference on ASIC","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103017375","display_name":"Lian Chen","orcid":"https://orcid.org/0000-0002-2832-4141"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Chen Lian","raw_affiliation_strings":["State Key Laboratory of ASIC & System, Fudan University, Shanghai, China","State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC & System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100604280","display_name":"Wei Li","orcid":"https://orcid.org/0000-0003-4716-9850"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Li","raw_affiliation_strings":["State Key Laboratory of ASIC & System, Fudan University, Shanghai, China","State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC & System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087906386","display_name":"Haipeng Fu","orcid":"https://orcid.org/0000-0002-9809-1830"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haipeng Fu","raw_affiliation_strings":["State Key Laboratory of ASIC & System, Fudan University, Shanghai, China","State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC & System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100369076","display_name":"Ning Li","orcid":"https://orcid.org/0000-0003-1208-4638"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ning Li","raw_affiliation_strings":["State Key Laboratory of ASIC & System, Fudan University, Shanghai, China","State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC & System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073819142","display_name":"Junyan Ren","orcid":"https://orcid.org/0009-0009-1356-6314"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junyan Ren","raw_affiliation_strings":["State Key Laboratory of ASIC & System, Fudan University, Shanghai, China","State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC & System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System,Fudan University,Shanghai 201203,China","institution_ids":["https://openalex.org/I24943067"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5103017375"],"corresponding_institution_ids":["https://openalex.org/I24943067"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.07776146,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"242","issue":null,"first_page":"614","last_page":"617"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.8729573488235474},{"id":"https://openalex.org/keywords/dbc","display_name":"dBc","score":0.7090104818344116},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6851367950439453},{"id":"https://openalex.org/keywords/voltage-controlled-oscillator","display_name":"Voltage-controlled oscillator","score":0.6364217400550842},{"id":"https://openalex.org/keywords/figure-of-merit","display_name":"Figure of merit","score":0.45578354597091675},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.4124957323074341},{"id":"https://openalex.org/keywords/voltage-doubler","display_name":"Voltage doubler","score":0.412278950214386},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38978150486946106},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.37150418758392334},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.36282259225845337},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3324255347251892},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2750304639339447},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2332349717617035},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.19631487131118774},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.0836016833782196}],"concepts":[{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.8729573488235474},{"id":"https://openalex.org/C193523891","wikidata":"https://www.wikidata.org/wiki/Q1771950","display_name":"dBc","level":3,"score":0.7090104818344116},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6851367950439453},{"id":"https://openalex.org/C5291336","wikidata":"https://www.wikidata.org/wiki/Q852341","display_name":"Voltage-controlled oscillator","level":3,"score":0.6364217400550842},{"id":"https://openalex.org/C130277099","wikidata":"https://www.wikidata.org/wiki/Q3676605","display_name":"Figure of merit","level":2,"score":0.45578354597091675},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.4124957323074341},{"id":"https://openalex.org/C106224450","wikidata":"https://www.wikidata.org/wiki/Q117903","display_name":"Voltage doubler","level":5,"score":0.412278950214386},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38978150486946106},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.37150418758392334},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.36282259225845337},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3324255347251892},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2750304639339447},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2332349717617035},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.19631487131118774},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.0836016833782196},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon.2011.6157280","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2011.6157280","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 9th IEEE International Conference on ASIC","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.699999988079071}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W1873805548"],"related_works":["https://openalex.org/W2141726610","https://openalex.org/W2061664740","https://openalex.org/W1964543336","https://openalex.org/W2619153394","https://openalex.org/W2134439706","https://openalex.org/W2057338677","https://openalex.org/W2105518569","https://openalex.org/W4236967454","https://openalex.org/W4242529045","https://openalex.org/W2112742062"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,82,109,122,127,131],"low":[4],"phase":[5,36,46,84,110],"noise":[6,37,85,111],"injection-locked":[7,21],"doubler-based":[8],"quadrature":[9],"voltage":[10],"controlled":[11],"oscillator":[12],"(ILD-QVCO).":[13],"Instead":[14],"of":[15,55,112,119,138],"using":[16],"conventional":[17,87],"coupling":[18],"scheme,":[19],"an":[20,116],"doubler":[22],"is":[23,38,48,92,141],"introduced":[24],"in":[25,66,72,96],"the":[26,41,45,56,60,63,73,76,106],"proposed":[27,90],"ILD-QVCO":[28,91,107],"to":[29,80],"generate":[30],"quadarature":[31],"signals.":[32],"In":[33],"this":[34],"architecture,":[35],"determined":[39,49],"by":[40,50],"coupled":[42],"VCOs,":[43],"and":[44,94,125],"accuracy":[47],"VCO":[51],"oscillating":[52],"at":[53,115],"twice":[54],"desired":[57],"frequency.":[58],"Thus,":[59],"trade-off":[61],"between":[62],"two":[64],"parameters":[65],"traditional":[67],"QVCO":[68,78],"does":[69],"not":[70],"exist":[71],"ILD-QVCO.":[74],"Besides,":[75],"novel":[77],"proves":[79],"have":[81],"better":[83],"than":[86],"QVCO.":[88],"The":[89],"designed":[93],"simulated":[95],"TSMC":[97],"130nm":[98],"CMOS":[99],"1P8M":[100],"process.":[101],"Simulation":[102],"results":[103],"show":[104],"that":[105],"has":[108],"-120.4":[113],"dBc/Hz":[114],"offset":[117],"frequency":[118],"1MHz":[120],"from":[121,130],"6.1GHz":[123],"carrier,":[124],"draws":[126],"7.15-mA":[128],"current":[129],"1.2-V":[132],"supply":[133],"voltage.":[134],"A":[135],"186.7-dB":[136],"figure":[137],"merit":[139],"(FOM)":[140],"achieved.":[142]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}