{"id":"https://openalex.org/W2049060198","doi":"https://doi.org/10.1109/asicon.2011.6157230","title":"A new current switch driver with improved dynamic performance used for 500MS/s, 12-bit Nyquist current-steering DAC","display_name":"A new current switch driver with improved dynamic performance used for 500MS/s, 12-bit Nyquist current-steering DAC","publication_year":2011,"publication_date":"2011-10-01","ids":{"openalex":"https://openalex.org/W2049060198","doi":"https://doi.org/10.1109/asicon.2011.6157230","mag":"2049060198"},"language":"en","primary_location":{"id":"doi:10.1109/asicon.2011.6157230","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2011.6157230","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 9th IEEE International Conference on ASIC","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046719919","display_name":"Guojia Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]},{"id":"https://openalex.org/I4210092088","display_name":"Zhejiang Province Institute of Architectural Design and Research","ror":"https://ror.org/00f89ms08","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210092088"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Guojia Liu","raw_affiliation_strings":["Institute of VLSI Design, University of Zhejiang, Hangzhou, China","Institute of VLSI Design Zhejiang University,Hangzhou 310027,China)"],"affiliations":[{"raw_affiliation_string":"Institute of VLSI Design, University of Zhejiang, Hangzhou, China","institution_ids":["https://openalex.org/I4210092088"]},{"raw_affiliation_string":"Institute of VLSI Design Zhejiang University,Hangzhou 310027,China)","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100649259","display_name":"Lenian He","orcid":"https://orcid.org/0000-0002-1512-1492"},"institutions":[{"id":"https://openalex.org/I4210092088","display_name":"Zhejiang Province Institute of Architectural Design and Research","ror":"https://ror.org/00f89ms08","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210092088"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lenian He","raw_affiliation_strings":["Institute of VLSI Design, University of Zhejiang, Hangzhou, China","Institute of VLSI Design Zhejiang University,Hangzhou 310027,China)"],"affiliations":[{"raw_affiliation_string":"Institute of VLSI Design, University of Zhejiang, Hangzhou, China","institution_ids":["https://openalex.org/I4210092088"]},{"raw_affiliation_string":"Institute of VLSI Design Zhejiang University,Hangzhou 310027,China)","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113943007","display_name":"Xiaobo Xue","orcid":null},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]},{"id":"https://openalex.org/I4210092088","display_name":"Zhejiang Province Institute of Architectural Design and Research","ror":"https://ror.org/00f89ms08","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210092088"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaobo Xue","raw_affiliation_strings":["Institute of VLSI Design, University of Zhejiang, Hangzhou, China","Institute of VLSI Design Zhejiang University,Hangzhou 310027,China)"],"affiliations":[{"raw_affiliation_string":"Institute of VLSI Design, University of Zhejiang, Hangzhou, China","institution_ids":["https://openalex.org/I4210092088"]},{"raw_affiliation_string":"Institute of VLSI Design Zhejiang University,Hangzhou 310027,China)","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016580818","display_name":"Qifeng Shi","orcid":null},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]},{"id":"https://openalex.org/I4210092088","display_name":"Zhejiang Province Institute of Architectural Design and Research","ror":"https://ror.org/00f89ms08","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210092088"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qifeng Shi","raw_affiliation_strings":["Institute of VLSI Design, University of Zhejiang, Hangzhou, China","Institute of VLSI Design Zhejiang University,Hangzhou 310027,China)"],"affiliations":[{"raw_affiliation_string":"Institute of VLSI Design, University of Zhejiang, Hangzhou, China","institution_ids":["https://openalex.org/I4210092088"]},{"raw_affiliation_string":"Institute of VLSI Design Zhejiang University,Hangzhou 310027,China)","institution_ids":["https://openalex.org/I76130692"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5046719919"],"corresponding_institution_ids":["https://openalex.org/I4210092088","https://openalex.org/I76130692"],"apc_list":null,"apc_paid":null,"fwci":0.2098,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.57244127,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"496","last_page":"499"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.8239841461181641},{"id":"https://openalex.org/keywords/feedthrough","display_name":"Feedthrough","score":0.711129903793335},{"id":"https://openalex.org/keywords/nyquist\u2013shannon-sampling-theorem","display_name":"Nyquist\u2013Shannon sampling theorem","score":0.5779462456703186},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5554444193840027},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5473936796188354},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5414076447486877},{"id":"https://openalex.org/keywords/nyquist-frequency","display_name":"Nyquist frequency","score":0.4958053529262543},{"id":"https://openalex.org/keywords/bit","display_name":"Bit (key)","score":0.46329960227012634},{"id":"https://openalex.org/keywords/nyquist-stability-criterion","display_name":"Nyquist stability criterion","score":0.4577743709087372},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29741257429122925},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2571181058883667},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.15295317769050598},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.12651637196540833},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.08286973834037781}],"concepts":[{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.8239841461181641},{"id":"https://openalex.org/C2777303812","wikidata":"https://www.wikidata.org/wiki/Q5441253","display_name":"Feedthrough","level":2,"score":0.711129903793335},{"id":"https://openalex.org/C288623","wikidata":"https://www.wikidata.org/wiki/Q679800","display_name":"Nyquist\u2013Shannon sampling theorem","level":2,"score":0.5779462456703186},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5554444193840027},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5473936796188354},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5414076447486877},{"id":"https://openalex.org/C98273374","wikidata":"https://www.wikidata.org/wiki/Q1501757","display_name":"Nyquist frequency","level":3,"score":0.4958053529262543},{"id":"https://openalex.org/C117011727","wikidata":"https://www.wikidata.org/wiki/Q1278488","display_name":"Bit (key)","level":2,"score":0.46329960227012634},{"id":"https://openalex.org/C7630364","wikidata":"https://www.wikidata.org/wiki/Q1756793","display_name":"Nyquist stability criterion","level":3,"score":0.4577743709087372},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29741257429122925},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2571181058883667},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15295317769050598},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.12651637196540833},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.08286973834037781},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asicon.2011.6157230","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asicon.2011.6157230","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 9th IEEE International Conference on ASIC","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8500000238418579}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2047844026","https://openalex.org/W2085191568","https://openalex.org/W2131805104","https://openalex.org/W2151689933","https://openalex.org/W2586464105"],"related_works":["https://openalex.org/W2100446824","https://openalex.org/W2362083308","https://openalex.org/W2364721613","https://openalex.org/W2091227400","https://openalex.org/W2034217801","https://openalex.org/W2028352647","https://openalex.org/W3126099788","https://openalex.org/W2352959011","https://openalex.org/W2107580648","https://openalex.org/W2087037435"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,8,23,78],"12-bit":[4],"500MS/s":[5,82],"DAC":[6,76],"with":[7],"novel":[9],"current":[10],"switch":[11],"driver.":[12],"Compared":[13,34],"to":[14,29,35],"traditional":[15,36],"low":[16],"cross-point":[17,25],"driver,":[18],"the":[19,41,44,48,56,70,75,84],"driver":[20,42],"can":[21],"generate":[22],"lower":[24],"that":[26,74],"is":[27],"immune":[28],"process":[30],"and":[31,83],"temperature":[32],"variation.":[33],"clock":[37,45],"feedthrough":[38,46],"compensation":[39],"scheme,":[40],"compensates":[43],"at":[47,81],"outputs":[49],"without":[50],"introducing":[51],"additional":[52],"frequency":[53],"component":[54],"across":[55],"whole":[57],"Nyquist":[58,85],"band.":[59],"Chip":[60],"was":[61],"designed":[62],"by":[63],"using":[64],"TSMC":[65],"0.18\u03bcm":[66],"CMOS":[67],"mixed":[68],"model,":[69],"post-simulation":[71],"results":[72],"show":[73],"achieves":[77],"76dB":[79],"SFDR":[80],"output":[86],"frequency.":[87]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}